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(4.3)
In (4.3) ( ) denotes the averaging process of the stochastic light intensity. The N-fold photoelectron counting distribution p (a1,T I ; n,, T,; . . .; a,, T,) of finding in a counter 1, n1 photoelectrons in the interval (tl, t,+T,), in counter 2, n, photoelectrons in the interval (t, , t,+ T,) and so on reads
P(%T,:
n2,
T,, . . .; a,, T , ) =
=
(P(%>
Tl, tl) P(%> T,, t z ) . . .P(%> T , , &)>> (4.4)
see BEDARD[1967b]. Generally, the calculation of the average in (4.3) and (4.4) is complicated mainly because one needs the joint distribution function for all I(t’) with Min ti 5 t’ 5 Max ti+Ti, i.e., a joint distribution of infinite order. 4.2. COUNTING DISTRIBUTION FOR SHORT INTERVALS
In this subsection we assume that the time interval T is short compared to the time in which the intensity changes its value appreciably
266
STATISTICAL PROPERTIES O F LASER LIGHT
TdPq = T
<< I/&.
[v, §
4
(4.5)
Because:the intensity does not change in the interval T one may write
r T I ( t ' )dt'
=
T I ( t ) = TdaI(t)
and average according to the one fold distribution w(1, i) which, in the stationary state, is
+
w ( I ) = z W s t ( d I )= JV exp {-$P++uI).
(4.7)
Therefore the photon counting distribution for short intervals is given by the Poisson transformation (for the inverse of this Poisson transformation see WOLFand MEHTA [1964], BBDARD[1967c])
9 (n,T ) =
lom $ (I) ecYfw
dI,
(4.8)
where v is an abbreviation for
Inserting (4.7) into (4.8) we obtain vn F,, (u -2v)
9(%T ) = -n ! Fo(u)
'
(4.10)
where the integrals F,(u) are defined in (3.5) or (3.7). The counting distribution (4.10) can be expressed in terms of parabolic cylinder functions, by (3.8) (see BBDARD[1967a]) or by the incomplete I' function (see SMITH and ARMSTRONG[1966b]). Typical counting distributions are shown in Fig. 12. For large average photon numbers (large v), the photoelectron counting distribution is nearly identical to the continuous intensity distribution
see Fig. 12c. The relations between the cumulants of the photocounting distribution (4.12)
reads in our notation (for a derivation see MANDEL [1958, 19631)
V.
I
41
267
PHOTOELECTRON COUNTING DISTRIBUTION
1
(n)= 1.12
0 1
1 0
2 1
3 1
6 1
5 2
6 1
7 3
I
1
a
-nV n
-
b n
0 1 2 3 4 5 6 7 s i 101 121 I41 161 1'81 1101 1/21 l l 4 l n
C
0
1
2
3
4
5
/d. dk' d$ db
40
6
7
'
11111111 11111111 11111111 l l l l " y ~ " l l ~ ' I I l l l l ~ ~
50
60 n
Fig. 12. The discrete photoelectron distribution (4.10) and the continuous distribution (4.11) for various v parameters (a: v = 0.5; b: v = 2; c: v = 8) but for the same pump parameter a = 2.
k,(a) =
= YK,(U)
(92)
k&) = ( ( a - ( a ) ) 2 ) = 'YK,(a)+~2K,(U) k, (a) = YK, (u) 3Y2K2(a)+Y31<, (a)
+
(4.13)
+
k , (u) = YK,(a) 7v2KZ( a )+6y3K, (a)+v4K4( a ) . The cumulants K n ( u ) of the stationary intensity distribution are plotted in Fig. 3. The k'th factorial moment of the pliotoelectron distribution (4.8) 00
(?PI)
=
2 a(%-1)
n=O
* *
. (n-k+l)p(a, T)
(4.14)
268
STATISTICAL PROPERTIES O F LASER LIGHT
[v. 3 4
is the k'th moment of the stationary distribution w(1)
(?PI)
= ((V1)k)
= vk
F,(u)/F,(u)
(4.15)
which, because of (3.8), can be expressed by the parabolic cylinder functions (ARECCHI et al. [1967c], BBDARD[1967a]). It should bc noted that the relationship between intensity cumulants viK, arid counting cumulants K,(u), i.e., the inverse of (4.13), is the same :IS that between factorial moments ( ~ [ ~ land ) moment:< (:ai)(see footnote, CHANGet al. [1967]).
' '
0.25t-
i i ........ ........ .__..
P in1
T--
"7 i
1
0.15 -
0.1
.__-
'-nonjinear oscillator
.. .....
0.05 -
0
"
0
'
1
2
4
6
8
n
Fig. 13. Counting distribution just above threshold (solid line), the Poisson distribution for the same + (dotted i lines) and the nonlinear oscillator distribution (4.10) giving the best f i t (dashed line). For n = 7, 8 and 9 the nonlinear oscillator and observed distributions are coincident. (Reproduced from SMITHand ARMSTRONG[1966b].)
The photoelectron counting distribution p (n, T ) near threshold was first measured by SMITHand ARMSTRONG[l966b]. (See also the review article of ARMSTRONG and SMITH[1967].) The excellent agreement between theory and measurements is shown in Fig. 13. One sees by inspection that the measured distribution is not a Bose-Einstein distribution (4.16) (a Bose-Einstein distribution has its largest probability always for n = 0), but that a Poisson distribution (n). exp { - ( n ) } / % !is a better approximation. The Eose-Einstein distribution (4.16) follows from (4.10) for pump parameters far below threshold (u << -1). This can be shown either by using an asymptotic expansion of the
v. § 41
P H 0 T O E L E C T R O N C 0 11N T I N G D I STRI B U T I 0 N
2ti9
0.4
I
0.2
? " ' O0-10
-8 -6
-4
I
-2
0
2
4
6
8
f0
Fig. 14. The parameter ~ ( aof) (4.18) and (4.19) (solid line), and the asymptotic expansions 7 = 1 -4/a2 for a << - 1 and 7 = 2ja2 for a >> 1 (broken linc) as a function of the pump parameter a. The experimental points are taken from ARECCHIe t al. [1967c]. (Thc abscissa K , ( a ) / K l(0) of Arecchi e t al. was rescaled and expressed as a function of a.)
integrals F,, ( a ) or hy substituting in (4.8) the intensity distribution far below threshold
~ ( 1=)+la1 exp (-+lalf>.
(4.17)
The transition from a Bose-Einstein to a Poisson distribution through the threshold region as obtained by changing the pump parameter, is best shown by looking at the variance < ( n - ( n ) ) z ) = (n)(1+?7(a)(n))J
(4.18)
where we have defined the parameter ~ ( aby )
r(a)=~ z ( a ) / W ) .
(4.19)
As seen in Fig. 14, there is a smooth transition from the variance of the Bose-Einstein distribution 17 = 1 to the variance of the Poisson distribution 7 = 0. The variance (4.18) consists of two parts; the first
part ( n ) stems from the discreteness of the photoelectrons whereas the second part ~ ( a (n>z ) stems from the fluctuation of the light beam. The last term gives rise to the BROWN-TWISS [1956, 1957a, b] effect. It should be noted that the last part ~ ( a (n)z ) remains finite as the pump parameter a goes to infinity because ( n ) increases proportional to a. However, if the light beam is attenuated in such a manner that ( 1 2 ) remains constant as the pump parameter a is increased, we finally obtain for a --t co a pure Poisson distribution with the variance ( n ) . In Fig. 14, the experimental points obtained by ARECCHIet d . [1967c] are also plotted. These authors were able to operate the laser at threshold a = 0 and measure the noise. A similar plot was also
270
STATISTICAL PROPERTIES O F LASER LIGHT
[v. § 4
obtained by DAVIDSON and MANDEL [1967]. By ~ ( u one ) can experimentally decide whether the laser is above (u > 0) or below threshold (a < 0 ) . One has only to measure the mean photon number and the variance. Above (below) threshold (4.20)
is smaller (larger) than ~ ( 0 == ) 'n-1 2
=
0.5708.
(4.21)
1
(4.22)
The first four reduced cumulants Qi
I
= Ki ( a ) [Ki ( a )
have been measured by CHANGet al. [1967] in good agreement with the values that follow from (3.10) or Fig. 3. A t the end of this section we briefly mention some further applications. I n the instationary case, the photoelectron counting distribution is given by (4.8) where now w(1) is the general instationary distribution (3.33). The two detector photoelectron counting distribution (4.4) reads in the stationary state for short intervals
where v i = a'da T iand where .T is the normalized time difference [i2-&l.Using (3.19) and (3.26) the cross correlation
c
m o o
(121122)
=
2 nln,p(.nl>% > 3
(4.24)
n,=O n,=O
now becomes (n1nz) =
= <.l>
(4.25)
Therefore the correlation function K ( u , ?) respectively Aeff can be determined by measuring (n1n2) with a two detector method.
V.
I
41
PHOTOELECTRON
271
COUNTING DISTRIBUTION
4 . 3 . EXPECTATION VALUES F O R ARBITRARY INTERVALS
In this subsection we drop the assumption (4.5) that the time interval T is short enough. In contrast to tj 4.2 we do not derive the counting distribution but merely discuss the expectation value 00
(n) =
2 .$(“it,
n=O
T )=
(I(t‘)>dt‘ = v K l ( a )
(4.26)
and the variance
(f(t’”(t’’))dt’ dt“- [/ff+T(l(l‘))dt’]
’). (4.27)
Using (3.19), (3.22) and (3.26) we obtain <(n-
= vK1(a)+v2K2(a)
(4.28)
For AeffT<< 1 we have f(T) = 1 and thus obtain the old result (4.13). For Aeffp >> 1 we have f(T) = 2/(Aeffp).The part of the variance v2K2(a)f ( T ) which stems from the fluctuation of the light beam is therefore diminished by using a long time interval T >> &&’. Because AefP has a minimum near threshold, the part of the variance v3K2(a)f(T) is most important in the threshold region. 4.4. CONDENSATION EFFECT O F THE COUNTING DISTRIBUTION
We have seen in 3 4.2 and tj 4.3 that the variance ( ( n - ( n ) ) 2 ) is usually larger than the variance (n>of a Poisson distribution. Therefore the photoelectrons appear more or less in clusters. In order to investigate this condensation effect we ask for the conditional probabilit y Pc(?)df that we find in the infinitesimal interval f+?, f+?+df a photoelectron if we have already found a photoelectron at the earlier time i. This conditional probability is (see for instance MANDEL [1963])
272
STATISTICAL PROPERTIES OF LASER LIGHT
Iv9
s
5
Fig. 15. The ratio of the conditional probability density +,(.) to the unconditional probability p as a function of the normalized time 7 = z2/(&) for various pump parameters a.
Because of (3.19), (3.22), (3.26) and (4.19) we may write
where p is the probability density of finding a photoelectron. The excess of p,(z) over p , which is a measure of the condensation process, is shown in Fig. 15 as a function of the time 5. Below threshold (a << -1) and for small times t,p , = 2$, which is well known to be valid for Gaussian light, see MANDEL [1963]. Near threshold the curves decrease very slowly in time 7, but they still have an appreciable condensation effect for t = 0. High above threshold ;leff increases again and p c ( 0 ) m p , thus showing no more condensation effect in this region. The photoelectron distribution will therefore be a Poisson distribution.
Q 5. Fully Quantum Mechanical Theory 5.1. INTRODUCTORY REMARKS
In §§ 2, 3 and 4 we have treated the optical field E classically, i.e., we have neglected the operator character of b. I n order to describe the fluctuations, we introduced fluctuating Langevin forces whose strengths were determined by the requirement that they lead to the quantummechanically determined transition rate. The resulting Fokker-Planck equation near threshold described the experimental measurements very well quantitatively as shown in 4 4.However, it is clear that by neglecting the operator character of b, one can only obtain results with an error of the order of the commutator. For instance with the method of § 3 the expectation value (b+b) (in unnornialized units) can only be
v,
9 51
FULLY QUANTUM MECHANICAL THEORY
273
determined to the order unity. In order to calculate (b+b) with an error smaller than unity, fully quantum-mechanical equations must be used. Because in a laser the number of photons at threshold is of the order 4000 (see ARECCHIet al. [1967c]), the relative error is of the order 0.1 yo and far beyond the accuracy of the measurements. Although the shortcomings of the model which was used (eg., single mode) may introduce larger errors than the ones due to neglecting the operator character of 6 , it is interesting from a theoretical point of view to derive fully quantum-mechanical results. Two main methods exist for deriving laser fluctuations fully quantum-mechanically. One method (more connected with the Heisenberg picture) consists of adding Langevin operators to the Heisenberg equation of the field operator and of the atomic operators. These Langevin operators preserve the commutation relations, which otherwise are destroyed by the damping terms. This method was used for a damped harmonic oscillator by SENITZKY [l960, 19611, and for a laser system by HAKENand WEIDLICH[1966], HAKEN [1966], SAUERMANN [1965, 19661, and LAX [1966a]. (For a review article see HAKEN[1967], RISKEN[l968].) The other method (more connected with the Schroedinger picture) consists of deriving a density operator equation (master equation). This method was developed for a laser system by WEIDLICHand HAAKE[1965a, b]. The resulting equation and similar master equations were further investigated by et al. [1967], LAX [1967a, b], LAX WEIDLICHet al. [1967a, b], HAKEN and LOUISELL [1967], GORDON [1967], SCULLY and LAMB[1967a] and WILLIS [1967]. Although the two methods are equivalent (in the same manner as the Langevin method and the Fokker-Planck method are equivalent in the theory of Markov processes) the master equation approach is more appropriate for solving the nonlinear equations. In fact we show in 3 5.4 (see HAKEN et al. [1967]) that the solution of the master equation can be reduced to a solution of an ordinary (c-number) partial differential equation and thus numerical methods can be applied directly. The Langevin method requires analytical solutions of the equations and is therefore mainly restricted to linear or linearized equations. 5.2. MODEL AND DERIVATION O F THE LASER MASTER EQUATION
In Fig. 16 the block diagram of the model for the laser system is shown. Damping effects of the light field and damping and pumping effects of the atoms are described by the coupling to reservoirs R,
214
STATISTICAL P R O P E R T I E S O F LASER LIGHT
Iv. § 5
- -- - - - - - - - -1
Fig. 16. Block diagram of the laser system. L: light field, R: light field reservoir. A ( p ) :p’th atom, R ( p ) :reservoir belonging to the p’th atom, solid lines: interactions.
which will be assumed to consist of a large number of oscillators with different frequencies. Hence the total Hamilton operator H consists of the following parts:
H
= HL+HRSHL,
+CHL*
( p )*
P
(Because in a one mode traveling wave laser model the space dependence drops out (see 9 2), we have neglected space dependence in (5.1).) In (5.1) the Hamilton operator of the light field, the operator of the reservoir belonging t o the light field, and the operator of the interaction between light field and reservoir read
The Hamilton operator of the p’th atom, of the reservoir belonging to the p’th atom and the operator of the interaction between the p’th atom and the reservoir is given by
HA(p)= z f i ~ ~ A L ! f A!$ i
= LZ$(,U)a j ( p )
V,
I 51
FULLY QUANTUM
MECHANICAL THEORY
275
Finally, the operator of the interaction between field and atoms reads
Tn (5.2)-(5.4), b+ is the creation operator of the light field, a t ( p ) the creation operator of the i’th energy level of the p’th atom, cf is the creation operator of the p’th level of the light reservoir, cz(,) is the creation operator of the p (p)’th level of the reservoir belonging to the p’th atom; g&, g ~ ( p ) , p tand ( p ) g, are the (real) coupling constants between the ,u’’thatoms or light field and the corresponding reservoirs; g i j is the (real) coupling constant between atomic systems and the light field. As we will see later on, the first term in HA(P)R(,) describes real transitions whereas the second term describes virtual phase destroying transitions. In the interaction picture the creation and annihilation operators oscillate according to the free field frequencies
where the operators without time argument are the operators at t = 0. The information of the complete system (light and atoms and reservoirs) is given by the total density operator ptot, whose equation of motion reads in the interaction picture
with
276
STATISTICAL PROPERTIES O F LASER LIGHT
[v, 9 5
figD(c; exp {iS,t}+c, exp {-iSDt}) (b+eiwot+be-iwot) (5.9)
H i R ( t )= ?)
HL-\(pj (t) = zfigigzj (b+e'"ot+be-'"ot ) exp (i(cz-c3)t}AIy).
(6.10)
L, 3
The total density matrix ptot contains too much information and has too many variables (all the reservoir variables). Instead of using ptot one wants to describe the process by a reduced density operator P = TrR{Ptot}>
(5.11)
where all the reservoir variables are averaged over. The equation for p is the master equation and is derived by the following steps. First one assumes that the total density matrix factorizes at a certain time to in a density operator of the atoms and of the light field times a density operator containing the reservoir variables only ptot(tO)
= P(tO)pR(tO).
(5.12)
An iteration procedure for ptot(t) leads after two iteration steps t o
Pm)
-i
=
-i 2 t [HIP),Pto&)l+(X)
~ ~ l ~ ~ ~ ~ [ ~ l ( ' ~ ~ P (5.13) t O t ( ~ O ) l l ~
to
The master equation for p is obtained by taking the trace of (5.13) with respect to the reservoir system, then setting it equal to the time derivative of p and letting t go to t o , p(to) = lim Tr,{ p!:!(t)} t +to
(5.14)
The term containing the simple commutator in (5.14) vanishes for interaction operators containing reservoir variables and the double commutator vanishes for all terms except for those where both interaction operators contain variables of the same reservoir. This follows immediately from relations of the form Tr,(cip,) = TrR(cicp,pR) = 0 ($ f $'). Therefore the master equation (5.14) can be reduced to
v, g 51
FU LLY
277
Q U A N TU M M E CII A N I C A L T H E 0 K Y
Inserting (5.9) into (5.16) and neglecting antiresonant terms (i.e., terms with a time dependence of the form exp {i(wo+L?,)t}) and using
2 g:
exp{i(Q,-w,) ( t - z ) }
=
2~B(t--t)
(5.18)
9
TrR(C:C~PR(tO)}= % t h ; we finally end up with )L (;
=
K(%h+l){[b>
=
K{[bp,
Pb+l+LbP>
b+l$- Ib,
TrR{c~c:pR(tO)} =
b+I)+K%h{[b+,
p b + ] } f 2 K n t h L [ b ,P I ,
PbI+[b+P> bl}
bfl.
(5.19)
=
(5.20)
The &function in (5.18) appears because the frequencies 0, are assumed to be continuously distributed in the reservoir and therefore the summation over p can be replaced by an integration. The constant K is the damping constant of the resonator, nth = [exp (fiwo/KT) - 11-l is the occupation probability of photons with frequency L?, = coo of the reservoir of temperature T . Because the reservoirs are assumed to be infinitely large, nth does not change with time. The evaluation of (5.17) is made in a similar manner. Neglecting antiresonant terms, the equations corresponding to (5.18) and (5.19) read in this case TrR{Wi$’) ( t ) Wig)
(Z)
pR(tO)}= yij6ikdj,d(t-Z)*
(5.21)
In deriving (5.21), we have assumed that the energy levels are distributed irregularly in such a manner that the equation E , - - E ~ = E k - 8 1 is only solvable for i = k , j = L. The y j i are reservoir constants and they describe real transitions from level j + i for j # i and virtual, phase destroying transitions for j = i. After considering (5.21) and the corresponding expressions in which the factors in the trace are changed cyclically, we finally end up with
278
STATISTICAL PROPERTIES O F LASER LIGHT
[v. § 5
For a three-level system eq. (5.22) was derived by WEIDLICHand HAAKE[1965b]. The time change of the expectation value ( A i j ) = Tr{Aij p} due to the terms (5.22) is
= ~y7j(An.)Bij-+Z:(yi,+yjr)(Aij). r
(5.23)
r
Thus the y i j describe transitions from the level i to the level j . For i = j , (5.23) are the rate equations for the occupation numbers. Terms of the form yii only enter in the nondiagonal terms ( A i j ) ( j f i), where they describe damping by virtual processes additional to the real transitions. For the real transitions only outgoing processes are responsible for damping, as shown in Fig. 17. (See also SCHMID and RISKEN[1966].) For a two-level system (5.22) reads explicitly
Fig. 17. Transitions leading to a damping of the off-diagonal element A,, (solid lines) and transitions leading to no damping of the off-diagonal element A t , (broken lines).
++Y21{[4$)
P, Ai;’I+[A:$>
++yl,{[Ag’ p, Ag’I+[A:;’, ++y2,{[.1L$)
PAi;’l)
(5.24)
PAg’l}
p, AL$)I+[Ai& PAi$’l}.
For a two-level system it is convenient to introduce spin operators = sf;
Ag’+A;?’
A!$’ = sp; =
1,
+(A&A(r”’) 11
A&$’= ++szp,
= szp
A;?) = +-szp.
(5.25)
The product of two operators can be reduced to one operator according to (see also LAX [1963])
ApA g
z
A Lf) Sj,.
(5.26)
V,
s
51
FULLY QUANTUM MECHANICAL THEORY
279
I n a two-level system the reduction relations of the spin operators s-s+ = 1- s,;
s+s- = '2+ s
2
(5.27)
correspond to (5.26). Thus the total master equation for a two-level, resonant system ( e 2 - cl = mug)where anti-resonant terms are neglected, finally reads (5.28)
5.3. LASER MASTER EQUATION NEAR THRESHOLD
The purpose of this section is to derive a master equation containing only the light field. For this end we introduce the following expressions, which depend only on the light operators b, b+, (the index A indicates averaging over the atoms) : N
1 p = TrA{p},
p*
TrA
{ p=1 2
N
1
J
pz
=N
TrA{
2 2szpP)*
p=1
(5'32)
In (5.32) p is the density operator of the light field alone, p* and pz are the expectation values of the positive and negative frequency parts of the polarization and of the inversion. Using the master equation (5.28) for a two-level system, the following equations for p, pf, p, can be derived:
2 80
STATISTICAL PROPERTIES O F LASER LIGHT
[v, § 5
(5.37)
(b+Tr,(sLs; p}-TrA{sLs; p)b++ b Tr,(s;s;
p) -Tr,{sis;
p}b) (5.38)
PlfV
in (5.34) and similar terms in (5.35) and (5.36). This neglection is similar t o the procedure of WEIDLICHet al. [1967a], where the corresponding expansions of the density operator were neglected. However, the difference is that p, p*, pz are still operators in the light field domain and thus lead to results being equivalent for normal and antinormal distribution functions. A next step of the present method would be to include terms of the form (5.38) but neglect expectation values of the atomic system of spin operators belonging to three different atoms. For further considerations we restrict ourselves to the case of small K ( K << y z ) . Under this condition the terms containing K in (5.34)-(5.36) may be omitted and, near threshold, the time derivatives in q1 and gz may be neglected (adiabatic approximation). Eliminating p+ and p- in (5.33) and (5.36) by the eqs. (5.34) and (5.35) yields, after some calculations, the following master equation:
281
(5.40)
(5.41)
(5.42)
With the distribution functions Wn(u, u*)and W,(u, a*) every normally and antinormally ordered product of b+ and b can be calculated simply by using c-number integration over the distribution function Wn or W,: Tr{(b+)' bj p ( t ) }
=
I
( U * ) ~ UWn(u, ~ u*,t ) d 2 a
(5.43)
Tr{b'(b+)3 p ( t ) ) = j a ' ( u * ) j Wa(a,u*,t)d2a. The proof follows from the fact that the integration of (5.43) in u space corresponds to a differentiation in a space
The distribution function Wn(u,u*)is GLAUBERS[1963a, b] P-representation of the density operator p =
where) . 1
.r
l ~ J+'n(u, >
.*)
(GI d2u>
(5.45)
are the eigenstates of the annihilation operator b l u ) = ulu).
(5.46)
Note that W, is not necessarily positive. It therefore does not have the usual meaning of a probability distribution, but serves merely as a
282
STATISTICAL PROPERTIES O F LASER LIGHT
[v.
s
5
tool to calculate all quantum mechanical expectation values in the c-number domain. Continuous functions similar to (5.42) were first introduced by WIGNER[1932] and further investigated by MOYAL [1949]. The continuous functions used here were introduced and studied in detail by KLAUDER[1960], GLAUBER[1963a, b] and SUDARSHAN [1963]. (For a review article see the book of KLAUDER and SUDARSHAN [1968]; for recent investigations see the paper of AGARWALand WOLF [ 19681.) The next task is to find an equation of motion for the distribution functions W na from the master eq. (5.39) and (5.40). For this purpose we multiply (5.39) and (5.40) with 0 na and take the trace. By a proper cyclical permutation of the factors under the trace and by using [b, 0
= ia*O na;
[0na, b+] = ia 0 na
a2
a2
Tr{b+O,bp}
=
~
1,; Tr{bO,b+p} = aia a h * f a aia aiu* ~
we finally end up with the following equation
,g,
a
[. LU+iu* aiu* f i a ia*+2 1f,, (5.49) a a g2 ia-+iu*) +ia ia*]gna. [4 ‘2j aia aia* g2
= oAfna- __
iu-
__
YlYZ
a2
+l
__ Y1Y2
The equation for the distribution function W na follows from (5.48) and (5.49) by the replacement iu
--f
-a/&;
ict* -f
-a/a~*;
a/aia --f
Using real variables in vector notation
U;
a/aia* --f u*. (5.50)
v,
P
51
283
FULLY QUANTUM MECHANICAL THEORY
a1 = *(a+.*),
a2 = $(u-a*),
u = {a1,U z }
(5.51) the master equation for the distribution function has the form
+ V (urx2N G ,,-KW~,])
=
at
(5.53) The upper (lower) signs are valid for the normal (antinormal) distribution function W . Because of the denominator in ( 5 . 5 3 ) , the master equation contains derivatives up to infinite order. In the next step, we evaluate the denominator in (5.53). In order to see the magnitudes of the different terms, it is convenient to introduce the normalized coordinates (2.35), where ,I?, q and d are now defined by (u0 = uAN = (Ni-NY) is the total inversion)
B = 4 g 2 ~ / ( ~ 1 y 2 ) ;= g2N/(4y2), g2(Ni-NY)/y2 = 4q0, = K+,I?d,
-
u =dp/qd.
(5.54)
For the sake of simplicity we further put nth = 0. In the normalized equation, terms of the form U, Vii, d,JU/2 are all of the same ordernear threshold. Retaining only terms up to the order d ( p / q ) , we obtain
(a/ai)wna + ~ { u [ a - - l u l 2 ] ~ ~ , } - = d~~~ dPx{ { lu 1 '/ (4c+4)f ( -vu)/ (40,) Q ( f u [ (a I U I WnaI 1. - I U 1 */ (4uA) IWna}
-
-
)
(5.55)
d(q/P) is approximately the number of photons at threshold and is for a typical laser (ARECCHIet al. [1967c]), of the order 4000. Therefore the Fokker-Planck equation (2.36) is a very good approximation. The right-hand side of (5.55) are the first order quantum mechanical corrections of this Fokker-Planck equation. (By evaluating the denominator in (5.53) further, higher order quantum corrections can be found.) Some of these corrections have different signs for W , and W ,
284
STATISTICAL P R O P E R T I E S O F L A S E R L I G H T
iv, I 5
and thus lead to slightly different solutions for W , and W,, which the classical Fokker-Planck eq. ( 2 . 3 6 ) cannot describe. In the FokkerPlanck eq. ( 2 . 3 6 ) ,the q value was defined (nth= 0) by q = g2N2/( 2 y , ) . The differences between this definition and (5.54) lead to terms of the order 2 / ( p / q ) and thus are irrelevant in the classical Fokker-Planck eq. ( 2 . 3 6 ) .It is worthwhile to mention that in the quantum corrections a term of the form v{iilU14W} appears. This stems from the second expansion term of the denominator in (5.53). In unnormalized coordinates the distribution functions W , and W , are connected by (see GLAUBER[1963ab]; W,(u) = (ulpIu)/n) e-l01*W,(u+v)d2v,
(5.56)
which reduces, in first order quantum corrections and in normalized coordinates, to
W,(U)
=
Wn(U)++2/B/g2W,(U).
(5.57)
Because the difference between W , and W , is of the same order as the right-hand side of eq. (5.55), there is no need for distinguishing between W , and W , in the semiclassical limit, i.e., in the case where the right-hand side of eq. (5.55) is neglected. By a somewhat lengthy calculation it can be shown that the solution W, and W , of (5.55)obeys the relation (5.57) to first order corrections for all times. Eq. (5.55) can be solved by a similar manner as the Fokker-Planck eq. ( 2 . 3 6 ) . Perturbation procedure seems to be particularly appropriate for expressing the new eigenfunction and eigenvalues in terms of the old ones. In this work we want t o solve the more general eq. (5.55) only in the stationary state. The stationary distribution function depends only on the field amplitude f . As in 9 3 we can introduce a probability current S. The relation S = 0 reads now
(a-P )f -W’,,/ Wna-fd/rB/4{f
+ ($-$a)
W’/,, W },,
+fl9/(4c~~){-aT~+P~+PW’~,/W =, ,0. }
(5.58)
Because we want to calculate only first order quantum corrections, we may insert the classical result W’/W in the curly parenthesis. The coefficient of the term . \ / c / o A then disappears and we obtain
w ,,= ( 2 n ) - 1 , ~,{1h$v‘a P[~-+(P-U)~I)
exp ( - ~ P + + u P } . (5.59)
v, S 51
285
FULLY QUANTUM MECHANICAL THEORY
3
4
2
6
r.72
8
Fig. 18. Thc normal (W,) and antinormal (W,) ordered stationary distribution functions (5.59) of the laser master equation near threshold ( 5 . 3 9 ) , (5.40), for a pump parameter a = 3 and a threshold photon numbcr .\/(q/p) = 20. The solution WSt which follows from the semiclassical calculations is also shown. For a threshold photon e l al. [1967c], thc differences between numbcr 2/(q/b)= 4000 as measured by ARECCHI the three distribution functions are down by a factor of 200 and lie, in the drawing, completely inside the line thickness of Wst.
The normalization constant JV normalization constant of $ 3 Jlr a,
nL
can be expressed by the uncorrected
=N ( l . f i a d 6 ) .
(5.60)
In Fig. 18 the distribution functions W,,areplotted. Using the inlegral (3.5) and the recursion relation (3.7), we obtain 2n
s
f2W, ,fdf
=
(I)r$dfi
(5.61)
or in unnormalized coordinates (bfb)
=
d a ( I ) -4,
(bbf)
=
d4/p (I)++
(5.62)
where ( I ) is the uncorrected moment of $ 3. It should be recalled that only quantum corrections up to first order can be calculated with (5.59). For instance we obtain (b+b+bb) = (q/p) ( f 2 ) - 2 d q l B ( I ) ,
( b b b f b f ) = (q/P) (12)++dq//i(I) (5.63)
which are correct to first order but not to second order. Accidentally the commutation relation (bbbfb+-bfbfbb)
= 4(b+b)+2
is even fulfilled for the second order term 2.
(5.64)
288
STATISTICAL PROPERTIES O F LASER LIGHT
LV,
9 5
Because d(P/q) is of the order 1/4000, the difference between W , and W , is very small near threshold, i.e., where ( P ) is of the order one. For much larger pumping parameters, where for instance ( f z ) z / ( p / q ) is of the order one (the photon number is then the square of the photon number at threshold), quantum corrections may play an important role. For this case more expansion terms of the denominator in eq. ( 5 . 5 3 ) must be used.
Photon counting distribution Using the Glauber P-representation (5.45) of the density operator we obtain p(n)
==
(nldn)
==
s
~ e - 1 ~ ~- ~ 12, Wn(u)d2u. (5.65) I < ~ l ~ > I 2 W n (= ~)d2~
Since usually only a small fraction of the intensity inside the laser falls on the photon detector during a time interval T , the intensity is attenuated by a factor u‘T.Thus instead of W n ( u )Wn(u/y”(u’T)) , must be inserted (see also GLAUBER [1966], ARECCHI and DEGIORGIO [1968]). Then (5.65) is exactly the Mandel’s equation for the photoelectron counting distribution for short intervals (4.8). For normalized coordinates, we thus obtain by using (5.59), (5.65), (4.9) and (3.5) Vn
P (n) = n!F,o{ (1-%ad%)F , (a -2Y) +dfi [*-+a21 F,+l +%a4%iFn+z(a-W
-
&dB/qFv+,(a-2v)),
(a-2v) (5.66)
which differs from (4.10) by the small correction terms of the order d(P/q). SCULLY and LAMB[1967a] have derived a master equation in the occupation number representation for the light field alone. Writing their equation in operator form and applying the same technique, we find that without quantum corrections their equation agrees exactly with our Fokker-Planck eq. (2.36). The first order quantum corrections disagree with the ones derived here. This may be attributed to the fact that these authors use a slightly different pumping model (not an ideal two level system with a constant number of atoms as used here). 5.4. c-NUMBER EQUATION O F THE LASER MASTER EQUATION
In § 5.3 we have seen that the solution of the operator eqs. (5.39), (5.40), can be reduced to the solution of the c-number equation (5.52),
v,
I
51
FULLY QUANTUM MECHANICAL THEORY
287
(5.53). The operator p is then given by (5.45). Following a method of HAKENet al. [1967] (see also GORDON[1967], LAX(1967b], and LAX and LOUISELL [1967]), we derive in this section a c-number equation of the master eq. (5.28), which now contains all the atomic variables too. However, as we will see below, we do not need all N atomic variables, but only the ones which refer to macroscopic quantities, namely the total atomic dipole moment and the total inversion
Sf
=
Is;,
s- = 2s-,fi s, = ZS,.
P
P
(5.67)
P
We define the distribution function f by
f (u, u*,v, 7J*, I ; t)
= M'
J . . .J exp{-ivt-iv*t*-i~I-iua-iu*a*) x F(5, [*,
5,a, a*, t)d2Ed2a d t
(5.68)
where
F
= Tr{eiSS-efSszefS*S'eia'
e
b+ l a b
P(t)l = TWPl.
(5.69)
(For the sake of simplicity we only treat the normally ordered distribution function.) For the following analysis, it is convenient to use a decomposition of the operator 0 in the form
0
=
o,o,;
N
(5.70)
eiSs;eiSs.,eiS*s:. , 0L -- eia'b+eiab OA(fi)-
M' is a normalization constant, so that
S f d2ud2vd I = 1. u,u* are
the macroscopic variables associated with the lightfield operators b, b+, v, v* and I are quantities corresponding to the total complex dipole moments S - or Sf and the inversion S,, respectively. The definition (5.68) ensures that f is real provided p is a hermitian operator. Expectation values of the light operator can be obtained as in 5 5.3 by the first part of eq. (5.43). The same procedure may be applied to expectation values which are functions of the macroscopic variables Sf, S-, S,. If the resulting order of the operators does not agree with the order wanted, the usual commutation relations must be applied. Multiplying (5.28) with the operator 0 and taking the trace we have (5.71)
288
STATISTICAL PROPERTIES O F LASER LIGHT
[t-,
s
5
with (5.7%)
(5.73)
(5.74)
Using (5.30) we find
N
fYl2
[ 2 Tr~s,O*,spa,P) -Tr{s,sp*,oa,d
TrP*,s,spa,
-
+
(711+Y22)
['
PI1
Tr{s,,oA~cs~/~o~,p)~Tr{s~~UA~o'*~p>
-Tr{o.4pS~po'App)l
with 0
(5.75)
OA,O'*,;
oa,
=
JJ O,,O,.
1 (5.76)
v#a
Using the property of the trace that an operator product under it may be rearranged in a cyclic manner, we have brought the p in every term to the right-hand side. Because s-, s+ and s, obey eq. (5.27), we may express terms of the form s i s ; , s t s i , ,;s by the single operators. For our further analysis it is most important that the operators which occur in front of the density matrix under the trace can be expressed as linear combinations of derivatives of the operator O,, with respect to the variables 5, 5*, [ and of the operator OA,L;
o,,
=
eits;eicsz,eit*s;
(5.77)
v, 9 51
FULLY QUANTUM MECHANICAL THEORY
289
We exhibit these linear combinations explicitly by the following formulas:
s+O P .4P s-P
=
[+e-'c++eic(it)2(iE*)2-t
(it)(it*)]O,,
(5.78)
+ [2 ( e d -
(5.79)
We now calculate the term of eq. (5.73) which stems from the interac-
290
[v, § 5
STATISTICAL PROPERTIES O F LASER LIGHT
tion between the field and the atoms. Note that in this interaction only the operators S+, S- of the total atomic dipole moment occur so that we may immediately write =
+
+
-ig{Tr{ [OS+b OS-b+]p}--Tr{ [S+bO S-b+O]p}}.
(5.80)
Using the operator relations
(5.81)
we find
aF
(z)AL,
=
-ig
a a (-a(il*) a(itc) ~
-
~
a a($)
a ~
a(itc*)
(5.82)
The field term was already calculated in 9 5.3 (put g
=,);(
-“““;d-1 a
=
0 in (5.48))
F + ~ K ~ z ~ ~ (ia) ( ~ cFc. * (5.83) ) ) According to the definition of f this distribution function is a Fourier transform of F . Thus the expressions (5.79), (5.82) and (5.83) may be expressed by f and its derivatives. We write this resulting equation for f in the form +iu*
a(lR
vl
291
REFERENCES
af
-=
at
Lf
(5.84)
where the Liouville operator L consists of the atomic part, the atomfield interaction and the field part
L = LA+L,,+L,.
(5.85)
The different contributions are defined as follows:
(5.86) +fryl2
[ N(e-a/aI-
+ ava v+ av*a v*
1)
-
~
-
I
2 (e-a/aI- 1)I
(5.87)
(5.88)
Taking into account only first and second derivatives the leading terms of this equation agree with the Fokker-Planck equation derived and solved below and above threshold by RISKENet al. [1966a, b, c]. For a complete solution of the two-level laser problem (without linearization of the coefficients, adiabatic approximation), however, the full eq. (5.84) must be investigated.
References AGARWAL, G. S . and E. WOLF,1968, Phys. Rev. Letters 21, 180. ARECCHI,F. T., A. BERNEand P. BURLMACCHI, 1966, Phys. Rev. Letters 16, 32. ARECCHI,F. T. and V. DEGIORGIO, 1968, Phys. Letters 27A,429.
292
STATISTICAL PROPERTIES O F LASER LIGHT
[v
ARECCHI, I;.T., V. DEGIORGIO and B. QUERZOLA, 1967a, Phys. Rev. Letters 1 9 , 1168. ARECCHI, F. T., M. GIGLIOand A. SONA,1967b, Phys. Letters 2.54, 341. ARECCHI,F. T., G. S . RODARI and A. SONA,1967c, Phys. Letters 2 5 A , 59. AKMSTRONG, J . A. and A. W. SMITH,1967, in: Progress in Optics, Vol. 6, ed. E. Wolf (North-Holland Publishing Co., Amsterdam; John Wiley and Sons, New York) p. 211. ARZT,V., H. HAKEN, H. RISKEN, H. SAUERMANN, C. SCHMID and W. WEIDLICH, 1966, Z. Physik 1 9 7 , 207. B~DARD G.,, 1967a, Phys. Letters 2 4 A , 613. BEDARD,G., 1967b, Phys. Rev. 1 6 1 , 1304. B~DARD G.,, 1967c, J . Opt. Soc. Am. 5 7 , 120. BHAKUCHA-REID, A. T., 1960, Elements of the Theory of Markov Processes and Their Applications (New York-Toronto-London, McGraw-Hill Book Company, Inc.). B L A Q U I ~ RA,, E , 1953, Ann. Radio Elect. 8 , 36. BORN, M. and E . WOLF, 1964, Principles of Optics (Pergamon Press, London). BROWN, 13. Hanbury and R . Q. TWISS,1956, Nature 1 7 7 , 27. BROWN,13. Hanbury and R . Q. TWISS,1957a, Proc. Roy. Soc. London A 2 4 2 , 300. BROWN, R . Hanbury and K. Q. T w ~ s s ,3957b, Proc. Roy. Soc. London A 2 4 3 , 291. BRUNNER, W., 1967, Ann. Physik 2 0 , 53. CHANDRASEKHAR, S., 1943, Rev. Mod. Phys. 15, 1; this article is contained in: Selected Papers on Noise and Stochastic Processes, ed. Nelson Wax (Dover Publication, Inc., New York, 1954). V. KORENMANN, C. 0. ALLEYand U. HOCHULI, CHANG, R . F., R. W. DETENBECK, 1967, Phys. Letters 2 5 A , 272. COLLINS,R. J.. D. F . NELSON,A. D. SCHAWLOW, W. BOND,C. G. B. GARRET und Ti'. KAISER,1960, Phys. Rev. Letters 5, 303. UAVIUSON, F . and L. MANDEL,1967, Phys. Letters 2 5 A , 700. FLECK, J . A,, 1966a, Phys. Rev. 1 4 9 , 309. FLECK, J. A,, 1966b, Phys. Rev. 1 4 9 , 322. FREED, C. and H. A. HAUS,1965, Appl. Phys. Letters 6 , 85. FREED, C. and H. A. HAUS,1966, Phys. Rev. 1 4 1 , 287. GLAUBER, R. J., 1963a, Phys. Rev. 1 3 0 , 2529. I<.J.. 1963b, Phys. Iicv. 1 3 1 , 2766. GLAUBER, GLAUBER, R. J., 1966, Proc. Puerto Rico Conf. on Physics of Quantum Electronics, eds. P . Kelley et al. (McGraw Hill Book Co., Inc., New York). GORDON, J . P., 1967, Phys. Rev. 1 6 1 , 367. GRADSHTEYN, I. S. and I. M. RYZHIK,1965, Table of Integral, Series and Products (Academic Press, New York). GRAHAM,R., 1968, Z. Physik 2 1 1 , 469. GRAHAM,K. and H. HAKEN, 1968, 2. Physik 2 1 3 , 420. GRIVET,P. and A. B L A Q U I ~ R1963, E , Proc. Symp. on Optical Masers, ed. Jerome Fox (Polytechnic Press, New York) p. 69. HAKEN, H., 1964a, Z. Physik 1 8 1 , 96. HAICEN, H., 1964b, Phys. Rev. Letters 1 3 , 329.
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HAKEN,H . , 1965, Z. Physik 182, 346.
HAKEN, H., 1966, 2 . Physik 190, 327. HAKEN,H., 1967, Dynamical Processes in Solid State Optics, in: 1966 Tokyo Summer Lectures in Theoretical Physics, eds. R. Kubo and H. Kamimura (Tokyo). HAKEN, H., H. RISKENand W. WEIDLICH, 1967, Z. Physik 2 0 6 , 355. HAKEN, H . and H. SAUERMANN, 1963a, 2 . Physik 173, 261. HAKEN, H. and H. SAUERMANN, 1963b, Z. Physik 176, 47. HAKEN, H. and W. WEIDLICH, 1966, 2. Physik 189, 1 . HAUG,H. and H. HAKEN,1967, 2. Physik 2 0 4 , 262. HEMPSTEAD, R. D. andM. LAX,1967, Phys. Rev. 161, 350. KELLEY,P. L. and W. H. KLEINER, 1964, Phys. Rev. 136, A316. KLAUDEK, J . R., 1960, Ann. Phys. 11, 123. KLAUDER, J. K. and E. C. G. SUDARSHAN, 1968, Fundamentals of Quantum Optics (W. A. Benjamin, Inc., New York, Amsterdam). V., 1965, Phys. Rev. Letters 14, 293. KOKENMAN, ,_ LACHS, G., 1965, Phys. Rev. 138, B1012. LAMB, W. E., 1964, Phys. Rev. 134, 1429. LAX,M., 1963, (Q 11) Phys. Rev. 129, 2342. LAX,M., 1966a, (Q IV) Phys. Rev. 145, 110. LAX.M., 1966b, (Q V) in: Physics of Quantum Electronics, eds. P. L. Kelley, B. Lax and P. E. Tannenwald (McGraw-Hill Book Co., Inc., NewYork) p. 735. LAX,M., 1967a, (Q VII) I E E E J . Quantum Electron. QE-3, 37. LAX,M., 1967b, (Q X ) Phys. Rev. 157, 213. LAX,M., 1967c, Phys. Rev. 160, 290. LAX,M. and R. D. HEMPSTEAD, 1966, Bull. Am. Phys. Soc. 1 1 , 111. LAX,M. and W. H. LOUISELL, 1967, (Q I X ) IEEE J . Quantum Electron. QE-3, 47. MAIMAN,T. H., 1960, Nature 187, 493. MANDEL,L.,1958, Proc. Phys. Soc. 7 2 , 1037. MANDEL,L., 1963, Fluctuations of Light Beams, in: Progress in Optics, Vol. lT, ed. E. Wolf (North-Holland Publishing Co., Amsterdam) p. 181 MANDEL,L. and E. WOLF,1961, Phys. Rev. 124, 1696. MANDEL,L. and E. WOLF,1965, Rev. Mod. Phys. 37, 231. MCCUMBEK,D. E., 1966, I’hys. Rev. 141, 306, MOYAL, J . E., 1949, Proc. Cambridge Phil. Soc. 45, 99. PAUWELS, H . J., 1966, I E E E J . Quantum Electron. Q E - 2 , 54. RAYLEIGH, 1894, Theory of Sound, Vol. 1 (London; Dover Publications, Inc., New Y-ork, 1945) p. 81. RISKEN,H., 1965, Z. Physik 186, 85. RISKEN,II., 1966, Z. Physik 191, 302. RISKEN,H., 1968, Fortschr. Physik 16, 261. KISKEN,H. and K. NUMMBDAL, 1968a, Phys. Letters 2 6 A , 275. RISKEN,H. and K. NUMMEDAL, 196813, Phys. Letters 2 7 A , 445. RISKEN,H. and K. NUMMEDAL, 1968c, J . Appl. Phys. 39, 4662. RISKEN, H., C. SCHMID and W. WEIDLICH, 1966a, Phys. Letters 2 0 , 489. KISKEN,H., C. SCHMID and W. WEIDLICH, 196613, 2. Physik 193, 37.
294
STATISTICAL PROPERTIES OF LASER LIGHT
rv
KISKEN,H., C. SCHMID and W. WEIDLICH, 1966c, 2. Physik 1 9 4 , 337. RISKEN,H . and H. D. VOLLMER, 1967a, 2. Physik 2 0 1 , 323. RISKEN,H . and H. D. VOLLMER, 1967b, 2 . Physik 2 0 4 , 240. SAUERMANN, H., 1965, Z.Physik 1 8 8 , 480. SAUERMANN, H., 1966, 2 . Physik 1 8 9 , 312. SCHAWLOW, A. L. and C. H . TOWNES,1958, Phys. Rev. 1 1 2 , 1940. SCHMID, C. and H. RISKEN,1966, 2. Physik 1 8 9 , 365. SCULLY, M. and W. E. LAMB, 1966, Phys. Rev. Letters 1 6 , 853. SCULLY, M. and W. E. LAMB,1967a, Phys. Rev. 1 5 9 , 208. SCULLY, M. and W. E. LAMB,1967b, in: Proc. Intern. School on Quantum Optics, “Enrico Fermi”, Varenna, Italy, to be published. SENITZKY, J . R., 1960, Phys. Rev. 1 1 9 , 670. SENITZKY, J . R., 1961, Phys. Rev. 1 2 4 , 642. SMITH,A. W. and J . A. ARMSTRONG, 1966a, Phys. Letters 1 9 , 650. SMITH,A. W. and J . A. ARMSTRONG, 1966b, Phys. Rev. Letters 1 6 , 1169. STRATONOVICH, K. L., 1963, Topics in the Theory of Random Noise, Vol. 1 (Gordon and Breach, New York). S U D A R S H A N , E. C . G., 1963, Phys. Rev. Letters 1 0 , 277. VAN DEK POL,B., 1927, Phil. Mag. 3 , 65. WAGNER, W. G. and G. RIRNBAUM, 1961, J . Appl. Phys. 3 2 , 1185. WANG,M. C. and G. E. UHLENBECK, 1945, Rev. Mod. Phys. 1 7 , 323; this article is contained in: Selected Papers on Noise and Stochastic Processes, ed. Nelson Wax (Dover Publications, Inc., New York, 1954). WANGSNESS, R. I<. and F. Bloch, 1953, Phys. Rev. 8 9 , 728. WEIDLICH, M’.and F. HAAKE,1965a, 2 . Physik 1 8 5 , 30. WEIDLICH, W. and F. HAAKE,1965b, Z. Physik 186, 203. WEIDLICH, W., H . RISKENand H. HAKEN,1967a, 2 . Physik 2 0 1 , 396. WEIDLICH, W., H. RISKENand H. HAKEN, 1967b, 2. Physik 2 0 4 , 2 2 3 . WIGNEII,E., 1932, Phys. Rev. 4 0 , 749. WILLIS,C . R., 1967, Phys. Rev. 1 5 6 , 320. WOLF,E . and C. L. METHA, 1964, Phys. Rev. Letters 1 3 , 705.
hTote added i n proof Some important references, wich have appeared after the completion of this manuscript: H. HAKEN,1970, Laser Theory, in: Encyclopedia of Physics, Vol. XXV/2c, ed. S. Fliigge (Springer Verlag, Berlin-Heidelberg-Pew York). Here a complete and extended laser theory is presented. This work also contains a review of more recent investigations The Lecture notes of the 1967 Quantum Optics Course in Varenna, Italy, are now available: Proc. Intern, School of Physics ”Enrico Fermi”, Course XLIl ”Quantum Optics”, ed. R . J . Glauber (Academic Press, New York and London, 1969). R . L . STRATONOVICH, 1967, Topics in the theory of Random Noise, Vol. 11 (Gordon and Breach, New York). I n part 2 of this book ”Nonlinear Self-Excited Oscillations in the Presence of (Classical) Noise” some results of 9 3 are also derived.
VI
COHERENCETHEORY OF SOURCE-SIZE COMPENSATION I N INTERFERENCE MICROSCOPY BY
T. YAMAMOTO Research Laboratory, Nipporn K o g a k u K . K . , Japavz
CONTENTS INTRODUCTION.
. . . . . . . . . . . . . . . .
.297
GENERAL THEORY O F TWO-BEAM INTERFERENCE MICROSCOPES . . . . . . . . . . . . . . . . 300 COHERENCE DIFFRACTION THEORY O F IMAGE FORMATION AND TWO-BEAM INTERFERENCE
306
LOCALIZATION O F FRINGES W I T H PARTIALLY COHERENT LIGHT. . . . . . . . . . . . . . . .
315
. . . . . . . . .
317
SOURCE-SIZE COMPENSATION
PRACTICAL METHODS O F SOURCE-SIZE COMPENSATION I N SHEARING INTERFERENCE MICROSCOPE W I T H POLARIZED LIGHT . . . . . 321 IMAGES O F SOURCE-SIZE COMPENSATED INTERF E R E N C E MICROSCOPES . . . . . . . . . . . .
331
.
338
REFERENCES . . . . . . . . . . . . . . . . . . . . .
338
CONCLUSION . . . . . . . . . . . . . . . . .
Q 1. Introduction An interference microscope combines the two functions of interferometer and microscope into a single instrument. In the early stages of the development of the interference microscope, the interferometer and the microscope were integrated by placing in front of the microscope objective a miniature interferometer called a micro-interferometer. The micro-Jamin due to SIRKS (1893), the micro-MachZehnder due to PRINGSHEIM (1899), the micro-Michelson and -cyclic form due to SAGNAC (1911) and the polarization version of a microJamin due to LEBEDEFF[1930] are described by KRUG,RIENITZand SCHULZ[1964]. Since it is not easy to include these micro-interferometers in the working distance of the objective and since they introduce considerable aberrations, the numerical aperture obtainable and hence the useful magnification were severely reduced. As a matter of course, it is desirable that the optical path difference produced by the microscopic object can be measured through objectives of high numerical aperture with unrestricted illumination aperture. LINNIK [1934] was the first to bring the microscope objectives into each arm of the Michelson interferometer. Because of its symmetrical form, there was, in principle, no limitation t o aperture. In contrast t o it, in a two-beam interferometer with dissimilar paths, the light source should normally be a small point of monochromatic light, to obtain interference fringes of high contrast. Recently, many efforts have been made to find systems for a microscope which enable an extended light source to be used *. These are called “source-size compensated” by STEEL[1962], or simply “compensated” by FRANCON [1956]. The importance of source-size compensation in interference microscopy should also be stressed for other * I t IS to be noted that the use of an extended source IS possible in a two beam Interferometer but not In a multiple-beam interferometer. So only two-beam systems will be considered here The discussion concerning the so called tilt compensation (STEEL [I9673 p 90) IS also exclnded In this work 297
298
SOURCE-SIZE
COMPENSATION
[VI,
ci 1
reasons than the highest resolution and image quality, that is, -
-
a luminous image (high irradiance of the image) can be obtained, the fringes are localized, i.e. superposed in the image plane so that any other interference fringes, for example those arising from reflections within the interferometer, are out of focus, optical sectioning is possible because of the very short depth of field, as ALLEN and BRAULT[1966] indicated.
The principles of source-size compensation may be classified by forms of interferometer into three groups: -
When the Michelson, Mach-Zehnder interferometer, or cyclic interferometer is to be utilized, it suffices to arrange identical optics in each path with perfect symmetry *, as is the case of the forementioned Linnik system.
-
In common-path interferometers such as shearing or double-focusing interferometers, one may give the two beams just the same shearing or defocusing distances as that t o be given when observation is made, before they illuminate the object. This case will be fully discussed below.
-
In the Michelson interferometer with dissimilar arms such as the Twyman-Green interferometer, both the optical paths and the apparent distances of the image of the end mirror in the two arms of the interferometer must be equal, as HANSEN[1942, 1954, 19551 showed. This is true in the case of a lens-testing interferometer or a Michelson interferometer used for interference spectroscopy (MERTZ [1959], CONNES [1956], STEEL [1962]), but is rare in an interference microscope (HANSEN[1942, 1954, 19551, GERHARDT and LENK[1960, 19621 and GERHARDT [1967]). (In this case, the term “field-widening” is sometimes used instead of source-size compensation. )
A variety of methods of source-size compensation were reported by many authors. Each contains some of following features: 1. The interferometer can adapt itself t o the ordinary (conventionally
designed) microscope without introducing appreciable aberrations or a change of illumination conditions;
* The condition can always be satisfied when the interferometer is used in double passage by an auto-stigmatizing element placed a t one end.
VI,
s
11
INTRODUCTION
299
2. It imposes no additional limitation on the use of the microscope,
e.g. the working distance of objective or condenser; 3. The second-order effects of the aberrations of the optical components
in the interferometer which limit the usable source-size will be kept sufficiently small; 4. The compensation system can be adjustable for the condition of the various objects, such as a large range of curvatures of the reflecting object to be observed; 5 . The interferometer may be simple to manipulate as well as to con-
struct. The theory of compensation is closely related to that oi localization of fringes (BORNand WOLF [1959]) and very recently has been based on the theory of coherence by DYSON1119501, HANSEN[1955], HANSEN and KINDER[1958], HOPKINS [1957b, 19671, STEEL [1959, 1965, 19671, FRANCON and SLANSKY[1965], FRANCON [1966] and YAMAMOTO [ 1965, 19681. Aberrations in the interference microscope were studied only by a few authors (SLEVOGT [1954] and KINDand SCHULZ [1959]) from the geometrical-optical point of view. Although the effects of diffraction caused by finite apertures within the interferometer are traditionally ignored in interference theory, the coherence theory may provide a unified treatment applicable to interference phenomena entailing diffraction and aberrations (STEEL [1959]). As STEEL [1959] and YAMAMOTO [1965] showed, the image forming properties of a microscope incorporated with the compensated interferometer under illumination with any degree of coherence can be treated as a linear system by multidimensional Fourier analysis techniques. The coherence theory of compensation by Fourier analysis will be useful because the compensation can be described more analytically than otherwise and because incomplete compensation due to diffraction, aberrations of optical components or other reasons can be analyzed. It is the outline of this theory that the author intends to give. This review article first gives the general theory of two-beam interferometer in § 2 and next the unified theory of image-formation and interference in terms of coherence in S 3. Then, its applications to the theory of localized fringes and to the theory of source-size compensation are described in 3 4 and 5 . In 6 we present the classification of practical methods of source-size compensation which have been recently achieved. In 7, a description of the images produced by a compensated interference microscope is given.
300
SOURCE-SIZE COMPENSATION
[VI,
§ 2
Q 2. General Theory of Two-Beam Interference Microscopes * 2.1, GENERAL THEORY O F TWO-BEAM INTERFEROMETERS
A general treatment of the influence of source-size on the visibility of the fringes in two-beam interferometers is described by BORNand WOLF [1959], HOPKINS[1967], SCHULZ1719641 and STEEL [1965, 19671.
Suppose that the source is a quasi-monochromatic incoherent source extelzded about C (Fig. 1 ) . Let 3 denote a two-beam interferometer,
U
I
Fig. 1. General description of the two-beam interferometer.
0 the image plane, passing the axial point 0, common t o both paths. If a typical point P in the plane O is viewed from the source side, two images are seen at P, and P, from each beam in two planes passing the image points 0, and 0, of 0, 9, and O,,inclined t o each other a t an angle (angle of shear) and separated by the distance h along the axis. Similarly, a typical point S of the source, viewed from the plane of observation 0, appears at S, and S, in two planes passing the image points C, and C, of C, ul and u,, inclined to each other at an angle (angle of tilt) and separated by the distance h along the axis. When the source u is considered as the entrance pupil, its images u1 and u, are taken as the exit pupils for each beam. The difference p in optical path along the two rays reaching P from S by two different paths may be expressed as
P *
=
[sp,s,pl-"sp,s,pl
= P,+P,+P,,
(2.1)
Thc considerations of this section are based in part on the work of STEEL[1967].
30 1
TWO-BEAM I N T E R F E R E N C E M I C R O S C O P E S
When the distances ?%=u and @ = x are small compared with and K1respectively, we may have approximately (see BORNand WOLF [I9591 p. 293, STEEL[1967]) two symmetrical relations,
sp,
P, p,
= -S =
*
U/R-$hiU12/R2,
(2.5)
-2 . x/R-@jxl”R2,
(2.6)
__
where s is the projection normal to CO, of the vector separation between P, and P,, h the scalar separation parallel t o C 0 , between P, and P, , and R the distance from C to 0, in the source space. s”, h and R are corresponding quantities in the image space. s, 3, h and h are called the shear, tilt, shift and lead respectively by STEEL[1967]. It is to be noted that, by the Malus-Dupin theorem of geometrical optics (BORNand WOLF [1959], p. 130), [$,+$,) is independent of the position of S, and [$,+Po) is independent of that of P. Suppose that the normalized radiance of the source is E ( U , v) at the frequency v, and that 4. is uniform for all points in the source. Then, since 9, and Po are also independent of the position S or u, the intensity distribution at P in the plane of observation is represented ~
bY I ( p ) = 11+I2+21/[1112)
X 2[y(pl,
p,, -P,/c) exp{i(Snv/c)$,)
(2.7)
where I,, I , are the intensities at P through the system due to each beam alone, and
y ( P , , P,, - P o / c )
=
exp{i (~ZV/C)P~}J E ( U , v)R-, exp{i(2nvlc)Pu}du. U (2.8)
y is called the degree of coherence between two points P, and P, at two instants t and t-(p,/c), and -(Po/c) is called the delay by STEEL [1967]. Thus, the fringe position in the plane of observation varies as the sum pa+$, varies as a function of x, while the fringe visibility as defined by Michelson is given by IyI x 21,12[1,+12). If a circular source (angular radius m) of uniform radiance is assumed, the degree of coherence y can be expressed in terms of Lommel functions of the
304
SOURCE-SIZE
COMPENSATION
[VI,
s
d
first kind, as in STEEL[1965], SCHULZ and MINKWITZ[1961], SCHULZ [1964], MINKWITZand SCHULZ [1964]: y (PI, P, ,
-p,/c)
exp{ - i d } / d x x [ U I ( 2 d , 2nll)+iU,(27d, 2nrl)l
= exp{i (2nv/c)po}
(2.9)
where
5
= UZh/A,
(2.10)
17
=Xl4/4
(2.11)
a = Clv. These results show that high-contrast fringes are obtained only near the point whose two images are situated a t 5 = q = 0. 2.2. LOCALIZED FRINGES
From equations (2.8) and (2.5), the maximum visibility is obtained in two ways: one is reducing the source to a point, the other reducing p , to zero, and in the latter there are three cases. That is, (a) cr
--f
(b) s
=
0; 0 and
h
=
0;
(c) Is1 # co, K = co and h = 0; (d) h # co,R = co and s = 0. Otherwise the visibility falls off. Condition (a) means that the source approximates a point so that the fringes are non-localized as the radiation field is coherent everywhere. Condition (b) shows that the two images PI and P, of the observed point P must be exactly coincided three-dimensionally. * Sometimes, s is called shearing distance, and h defocusing distance. Only over a region of small s and h, the fringes will have good visibility as the degree of coherence attains to unity; the fringes are localized. When s = 0 and h w 0 (not vanishing except on a line, but sufficiently small) are satisfied, the fringes are called Fizeau fringes or fringes of equal thickness. Either condition (c) or (d) indicates that the fringes are localized in the focal plane of the whole optical system, which always exists; they are called fringes (localized) at infinity or fringes of equal inclination. Then, if s" = 0 and b # 0, the fringes are circular and * This conclusion is valid even when the shear is not uniform but arbitrarily takes place. See, for example, the rotatory shearing by ARMITAGEand LOHMANN [1964].
VI,
s
21
T W O - B E AM 1 N T E R F E R E N C E M 1 C R 0 S C 0 PE S
303
termed Haidinger rings; while if s" # 0 but h = 0, they are straight and equidistant and they are termed Brewster's fringes (BORNand WOLF[1959], p. 308). In general, these conditions are satisfied imperfectly in the image plane and it is necessary to reduce the source size for sufficient visibility. This would severely limit the resolution and the luminosity of the interferometer. 2.3. I N T E R F E R E N C E MICROSCOPE AND SOURCE-SIZE COMPENSA-
TION
An interference microscope is the integration of an interferometer and a microscope, one being incorporated with the other. A microscopic object to be observed is introduced in either one of the two intermediate planes (say conjugate with the plane of observation 0,as shown in Fig. 2. The interferometer is generally represented as divided into two parts, that is, one before the object as 4 and the other after it as 4'. The rest is the same as in Fig. 1.
&)
Fig. 2. General description of the two-beam interference microscope.
F,
E,
Let S be the vector separation between and normal to the optical axis, where F, and F2are conjugate with P in the plane of observation. P, and P, are similarly defined as conjugate with P in the source space. Suppose that w , ( E ) and w , ( c ) denote the variations of optical path due to the object in either beam, at F, and p2respectively. The difference of these two variations, denoted by w,will be added to the optical path-difference in place of 9, in eq. (2.1). Then we have
I(P) = I , + I 2 + 2 2 / ( ~ 1 ~ 2 X ) ~ " Y ( P 1p,, , -P,/c) exp{iyx}l, where
(2.12)
304
SOURCE-SIZE
COMPENSATION
[VI
5 2
and y(P,, P,, - p , / c ) should be found for the two images P, and P, to be located by retracing the system which includes the object. Hence, the difference between changes of optical path due to the object in either beam w can be rendered visible in its magnified image by the interference between the two beams. When the symmetric interferometer with separate arms such as a Michelson or a Mach-Zehnder is used, w, is normally taken as zero: zw, 3 0. I n the case of the shearing interferometer where the axial separation & between the two planes 8,and 8,is zero, but the same variation (say wl)at points separated by the distance s in the object plane is used instead of w,:
w
= w,(X+S)-w,(x),
(2.15)
a,.
where X is the position vector of P, in the object plane I n the double-focus interferometer applied to interference microscopy, the axial separation is usually taken so large that the disturbance due to the object placed in the plane 8,for the path 2 may be lumped in the (aperture) plane G , or its conjugate (source) plane u and represented by &,(u).* This affects the visibility of the fringes but not their position. Hence, in this case, we can put
w
= -w,(Z).
(2.16)
I n these common-path interferometers, it is generally desirable that the shear S or the shift k in the intermediate space (object space) be as large as possible. Therefore, to have a good visibility with a large source, another interferometer Y must be placed between the source and the object so as to compensate B or h, that is, to reduce s or h to zero in the source space. Such a special pair of interferometers Y and 9'are called source-size compensated. Source-size compensation being carried out, two kinds of sharp fringes can appear in the field of view: straight-line fringes when h = 0 and circular fringes when s" = 0. Here the field is called fringed field. The phase difference w due to the object may be measured by reading a local displacement of the fringes with respect to those which are to be formed in the absence of the object. So these fringes are called reference fringes in this work. If both h = 0 and 4. = 0 are assumed, the fringes expand out indefinitely and the intensity becomes uniform across the field. This is often called u n i f o r m field. The phase-difference appears as a
*
Practically, it can be considered independent of the position of
Pz.
VI,
9 21
TWO-BEAM INTERFERENCE MICROSCOPES
305
change of the interference color in white light, or as the intensity change in monochromatic light. For a sensitive observation, the background for zero phase difference of the object should be made as black as possible. The degree of blackness, or extinction factor as it is termed by INOUE and HYDE [1957], is limited by the fall of degree of coherence due to aberration, unequal division of amplitude, depolarization, scattered light and so on. 2.4. D E L A Y COMPENSATION
If a light source is not quasi-monochromatic, the intensity I ( P ) in eq. (2.12) should be integrated with respect to Y over the spectral bandwidth. Because exp{i(Znv/c)$,} is a rapidly changing function with respect to Po, the larger the bandwidth of the light, the more rapidly the visibiIity drops with increasing 9,. Thus, all the interference microscopes using thermal light are designed to compensate the delay - (2nv/c)$, by three methods: 1. optical-path compensators, 2. symmetric or cyclic construction, 3. self-compensating elements such as a Savart plate, a Wollaston prism, etc, which are composed of two identical crystal elements having an opposite birefringence. The delay introduced by the microscopic object and its dispersion varying with Y is usually so small that the visibility will not be affected practically. But, the difference in dispersion between the two separate microscopes for two beams presents a serious problem because of their complicated optical construction (HANSEN[ 19301, RANTSCH [1949]). This is one of the reasons why the common-path interference microscope may be adopted advantageously. In the discussion below, we will assume the interferometer to be delay-compensated. 2.5. USE O F L A S E R AS A S OUR C E FOR I N T E R F E R E N C E MICROSCOPES
If a single-mode gas laser is used as the source, neither the source size-compensation nor the delay compensation is necessary because of its extremely high spatial and temporal coherence. Moreover, holographic interference microscopes have been described very recently (GABOR and Goss [1966], VAN LIGTENand OSTERBERG[1966], ELLIS[1966], SNOW and VANDEWARDER [1968], MAGILL and WILSON [1968]). But, the conventional light source of an interferometer cannot be replaced totally by a laser, and the compensation techniques have
306
SOURCE-SIZE COMPENSATION
[VI.
9 3
still a constant importance in interference microscopy. The reason is as follows. As several authors indicated (MURTY [1964], MURTYand MALACARAHERNANDEZ [1965], STEEL [1965], POLZE[1965]), a lot of beams reflected from numerous surfaces of a microscope objective interfere near the image plane with the main beams to produce unwanted fringes with a very good visibility. It is impossible t o distinguish the true variation in intensity due to the two main beams from the spurious ones, for a microscopic object is usually intricate in structure. The unwanted fringes can be eliminated only by diffusing the laser light to give an enlarged extent and by establishing a source-size compensation t o get localized fringes. In addition to that, even the delay compensation is needed unless one has a priori knowledge of the approximate path-difference due to the object measured in the wave-length unit, whereas the white fringe can provide a fiduciary mark for measurement (FRANCON [196l], p. 177).
Q 3. Coherence Diffraction Theory of Image Formation and Two-beam Interference So far we have neglected the effects of diffraction and aberrations attendant upon the optics. There are two defects in the ray optical theory which was given in 9 2 . Firstly, in the presence of these effects, it is impossible to exactly retrace the system in order to find the conjugate points of the point of observation, especially for a large source. Secondly, when the incoherent source plane CT as shown in Fig. 1 is imaged onto the plane of observation, there would be zero visibility of fringes, unless the two points PI and P, coincide perfectly. This is not the case in practice, as HOPKINS [ 1957bl indicated. * 3.1. STEEL’S UNIFIED THEORY
STEEL[1959] developed a new formulation of the diffraction theory of image formation and two-beam interference, which is linear for sources of any degree of coherence. Consider the analytical signal V(P, t ) at a point of the image plane of a two-beam interference microscope, which is expressed as the sum of the two analytic signals reaching the point by each path:
* We can only apply the treatment given in § 2 by replacing approximately with an incoherent source the partially coherently illuminated aperture plane which lies a t a sufficiently great distance from the source (HOPKINS [1967]).
VI,
g 31
C O H E R E N C E D I F F R A C T I O N T H E 0 RY
V(P, t ) = Vl(P, t)+V,(P, t ) .
307
(3.1)
The mutual coherence function T(P, Q, t) of WOLF [1954, 19551 between the radiation at two points P and Q in the image plane for a time difference t is represented by the sum of the mutual coherence functions Tij(P,Q, t) between the radiation from the beam i at the point P and that from the beam j at the point Q for the time difference t:
W', Q, t) = W(P, t ) . V*(Q,t+.)> =
2 Tij(P,Q, t);
i, j
= 1,2,
ij
where
rij(P>Q, t) = (v,(P,t ) *
vT(Q,t+t)>,
(3.2) (3.3)
and the angular bracket denotes a time average and the asterisk the complex conjugate. If the Fourier inverse transform with respect to z is taken, we have a fundamental expression of two-beam interference in terms of mutual spectral density (BORNand WOLF[1959], p. 501),
where
I-, 03
fij(P, Q, v)
=
Tij(P,Q,
t)exp(i2nvt)dt
(3.5)
and the circumflex denotes the time Fourier transform. On the other hand, as ZERNIKE[1938] has shown, each mutual spectral density is propagated according to the generalized HuygensFresnel principle (BORNand WOLF [1959], pp. 514, 531). With the approximation that reduces the Huygens principle for amplitudes to a two-dimensional transform, the mutual spectral density on one of the reference surfaces is reIated to that on the subsequent reference surface by a four-dimensional Fourier transform, since it is a function of the four spatial coordinates that denote the position in a plane of the two points (BLANC-LAPIERRE and DUMONTET [1955]). In Fig. 3, a general system of microscope with Kohler illumination system is considered. In most two-beam interference microscopes, two microscopes are assumed to be so arranged in parallel for two paths that they possess the same optical axis coincided virtually. Consider now, for each path, the field stop plane, the reference sphere touching the entrance pupil plane at its center, the object plane, the referencesphere touching the exit pupil plane at its center, and the image plane
308
SOURCE-SIZE COMPENSATION
[VI,
§ 3
as shown in Fig. 3. We take these surfaces as the reference surfaces. We have assumed here that the separate optical system is aligned with the same optical axis * and has the same number of stops. Each optical system need not be identical but may possess partly or totally a different magnification. So the double-focusing interferometer can be included in the theory.
*’
_ - T,----+
I I
I
I
-
--t--T2---i
I
I I I
I
I
Lc I
- _ _ T2’
---
I I
I
To condense the notation, points are specified by a position vector normal to the optic axis and we use the following reduced coordinates (see Fig. 3) for the path i (i = 1, 2) , instead of geometrical coordinates (in capitals) :
* A slight misalignment can be interpreted as a difference in aberration between the two systems.
“1,
§ 31
u.= a
309
COHERENCE DIFFRACTION THEORY
1 1 1 ui, iii = ui, u: = Ti sin ui T i sin Gi Tl sin ui I
u;,
(3.7)
where the subscript i denotes a quantity relating to the path i, a i , Fii, Fii, ni are the refractive indices of the spaces as shown in Fig. 3, u i , G i ,Gi,a; the angular radii of the circular pupils * in conformity with the usual sign convention, Ti, p i , T: the distances measured from left to right, from the centre of the field stop, of the object and of the image to their corresponding reference spheres respectively. For systems obeying the isoplanatic condition or corrected for the transversal aberrations on the reference sphere (HOPKINS [1951, 1965, 1966]), the Gaussian image of a point at xi in the object plane is at xi = xi in the image plane and similarly ui = ui.If there is no difference in magnification between the systems for the two paths, nor in the angle the pupil subtends at the object (image) plane, x = x1 = x2,u = u1 = u2 etc. hold. Thus, the scheme of the unified theory may be expressed as follows: For the illumination system: 00
f i j ( i i i ,Ti,v) =
, v) exp{i2n(iiixi-Vjyj)}dxidyj, (3.8) [[ f i j ( x i yj, JJ-m
f i j ( i i i 3,, , v) = f i ( Z i , v ) f ; ( T j , v ) * f i j ( B i ,T,, v),
(3.9)
For the observation system:
T i j ( U i ,v;, v) = //-:Pij A
,
(Fi, yj,v) exp(i2n ( u ; X i - v~yj)}dxidyj, (3.12) A
P;j(u;,v;, v) = fi(UL,v)f;*(v;, v) * r i j ( u :v;, , v),
(3.13)
where mutual spectral density through one of the reference surfaces is denoted by a plain symbol before the plane and by the same symbol with a prime after the plane. L i ( X i ,v) denotes the spectral amplitude transmission of the object * The aperture stops are assumed to coincide with the pupils in position, but not always in size. They may be sometimes larger than the pupils.
31 0
[VI,
SOURCE-SIZE COMPENSATION
s
3
placed in the path i . fi(ui, v) or fi(ui, v) is the spectral amplitude transmission or pupil function of the condenser or objective for the path i. For example, if the condenser has no absorption and a wave aberration W i ( u i )for a circular pupil, it is f i ( U i , ).
5 pi; 1 4>Pi-
= “xP{i(24c)Wi(ui)}, =
luil
0,
(3.15)
We assume again that the image planes for both paths are so closely situated that the one (say x;) may be taken as the image plane common to both beams by considering the focal shift of the other as a defocusing aberration. Hence, we have the reduced co-ordinates for the point X’ in the image plane
, n’ * sin & x1 = x; x ,2 = n‘ - sin a;
ii
1
x.
(3.16)
Putting p’ = sin dJsin a;,
(3.17)
x; = p’xi.
(3.18)
we get By using eqs. (3.8)-(3.14), we can calculate all of P,,(x:, y i , v) = 1, 2) in the image plane, from the knowledge of P,,(x,, y,,v) on the source. Then, by summing them up to get P(P, Q, v ) given in (3.4), and taking its Fourier transform, r ( P , Q, z) is obtained:
(i,j
r ( P , Q, r ) = r11(4, Y ;, r)+rZz(p’xl, P’Y;, z) +rl2(4> P’Yl, ~)+rzl(p.’x;, Y L .I. When the two points P and Q coincide for z the point P will be obtained as
I ( P ) = T ( P >p, 0) = f&;,
= 0,
(3.19)
the intensity at
x;,0 ) + ~ 2 2 ( p ’ x ; ,E L K ; , 0)
+2%{G&;,
p’&
0)).
(3.20)
It is worthwhile to note that for quasi-monochromatic light of frequency Y&Av, mutual coherence function or mutual spectral density can be approximately expressed by the mutual intensity function: T(P, Q, 0 ) ~exp{-i2z+r} or f’(P, Q, O)d(v-$), providing 1x1 << l / A v (BERAN and PARRENT [1964]). This is Steel’s unified theory of image formation and interference (STEEL[1959]) with slight modifications; the object or the imaging
VI,
s
31
COHERENCE DIFFRACTION THEORY
311
system plays the role of linear filter for mutual spectral density. Since the interference effect in the image plane is expressed by T,z(xi, p'xi, v), the function T,,propagating through the system plays the basic role in two-beam interference theory. We will call this simply the cross-coherenee. The mismatched aberrations of the two systems can be taken into account by the transmissions for the cross-coherence, which are given by
The scalar theory for large aperture seems to be valid for a semiaperture up to about 30" (HOPKINS [1943]). The validity with respect to image extent was fully discussed by DUMONTET [1955]. 3.2. EXTENSION TO THE POLARIZATION INTERFEROMETER
In the polarization interference microscope, the two beams traverse the same optical system. Two paths are distinguished by the direction of vibration perpendicular to each other, which is to be designated with subscript 1 and 2 . The directions of (1) and (2) are so chosen that they are parallel with the principal plane of crystal elements. In order to make radiation of different direction of vibration interfere, an analyzer is needed. If we assume that the direction of the analyzer makes an angle 8 with the axis (l),we obtain the mutual coherence function at two points and at two instants in the image plane:
T(P, Q, t) = ((cos 8 - Vl(P, t)+sin 8 . Vz(P, t ) ) . (COS 8 - V,(Q, t+t)+sin 8 V,(Q, t + t ) ) * ) .
-
(3.21)
Defining T i j ( P ,Q, t)as the mutual function between two components i and j as WOLF [1954, 19561 introduced, we have a fundamental expression of polarization interference, which corresponds to eq. (3.4):
T ( P , P, 0) = cos2 8 - T,,(P, P, 0) +sin2 6 - T,,(P, P, 0) + 2 sin 8 - cos 8 . 9{T12(P,P, 0)).
(3.22)
I t is evident that the same propagation law will still hold for Tij(P, Q, t) as before only if the direction of vibration never changes (nointermingling of two components occurs). If T12(P,P, 0) is normalized with d(Tll(P,P, 0) . TZ2(P,P, 0)), it equals the degree of polarization, provided that T,,= I',, (BORNand WOLF [1959], p. 547). For maximum visibility, it is necessary that a polarizer be introduced, and that the analyzer be set at 8 = &in. Under the under-lined
312
SOURCE-SIZE
COMPENSATION
[VI,
§ 3
condition, depolarization due to the rotation of the plane of polarization cannot be contained in the system. 3.3. SHEARING ELEMENTS AND TILTING ELEMENTS
Consider a shearing element and a tilting element which are introduced in each path to give rise to a lateral displacement to the image of the field stop (“window”) and to that of the aperture stop (“pupil”), as shown in Fig. 4. They may be beam-splitters, mirrors, plane parallel plates, prisms, Savart plates, or Wollaston prisms in polarization interferometers. Taking the example in the image space, the integrand in eq. (3.14) can be replaced, if the quadratic and higher order terms in the variables may be neglected, by & ( u ; , vj, v) exp{-~2n((u~+s^~)(x~-s~)-(v~+s”~)(y~-s~))}, (3.23)
where 3; is the displacement of the beam i at the pupil surface, normal to the axis, s: that at the image plane, S ; , si.similarly defined, and they are measured in reduced coordinates. That is, generally, fij(ui, vj, v) Qij(ui,v;; xi,y;) e x p { ~ i 2 n ( u ~ x l - v ; y : ) ~ , (3.24) with
Q 23.. = exp{--i2n(3;xl--s;u;)+i2n(d~y;-d~ v;)} x x exp{*i2z (Si si-di s ; ) } ,
(3.25)
where the positive sign indicates that the direct Fourier transform should be taken in the space where the element is placed, and the negative sign indicates that the inverse transform should be taken. In other respects, the expression of Qij’s never change, irrespective of the space where the element is placed. Hence, these elements can be interpreted as a pupillary filter * and an objective filter for coherence (mutual spectral density), the transmission of which is Qij for the beam i and j . YAMAMOTO [1965, 19681 showed that the coherence transmission of both a Savart plate and a Wollaston prism is in the form of eq. (3.25). In such a commonpath interferometer, the distinction between i and j as subscript of coordinates disappears.
* If the shear is kept very small, the pupillary phase filter equivalent to the shearing element has the transmission such as l-i2nsiui for the beam i. Apart from the constant 1, this filter produces an image amplitude proportional t o the modulus of the gradient (in the direction s i ) of the phase due to the object (IWATA [1949], BREMMER [1951]).
VI, §
31
COHERENCE DIFFRACTION THEORY
---_-_-_-
T‘- -
-_
313
1
----
(b) Fig. 4. Illustrating the shearing and the tilting element; (a) a Wollaston prism (for simplicity, the plane of localization of fringes L is taken t o be normal t o the optical system axis), (b) a Savart plate.
For a Savart plate which is so placed that its principal plane is parallel to the x1axis or the x2 axis and displaces each component beam by the distances S in the direction parallel to the axis, the transmission is given by (3.26) i, j = 1, 2 , Q 23. . = q,(x,u ) q:(y, v); with (3.27) q,(x,u ) = exp{i2ns”xi}.exp{-i27ts.u,},
-
314
[VI, §
SOURCE-SIZE COMPENSATION
s=-
n sin M
a s,
$=-
1
T sin GI
s,
3
(3.28)
where1/2S denotes the shearing distance * and T the distance between the aperture and the field (objective or image). For a Wollaston prism which deviates each component beam by the angle of a in the positive or negative direction of the x1 axis, the coherence transmission is given by Q11= Q21=
q(x>u) q * ( ~ v)> , q*(x>u) 4 * ( ~ v), ,
Q12 Q22
= q(x, u)q
( ~v), , = 4 * b 3 U ) q(yJv),
(3.29)
with
q(x, u) = exp{i2nlxl} * exp{-i2nsul},
(3.20) (3.31)
where 20. denotes the splitting angle t and 5 the distance from the object plane t o the Wollaston prism. So far we have neglected the following causes which affect the coherence of polarized light: variation of path-difference denoted by Q::), depending on the second power of the incidence angle: the curved fringes at infinity by a Savart plate and the hyperbolic fringes at infinity by a Wollaston prism when it is illuminated just behind by a slit [1952]; FRANCON and parallel to its localized fringes (FRANGON SERGENT [1955]); depolarization due to the rotation of the plane of vibration inside the crystal element cut at a large angle such as 45' with the optic axis. Both restrict the usable source size and should be examined to the second approximation, after some practical method of source-size compensation is devised. It is shown that the influence on the coherence is approximately given by the integral of QI",' (u',v', x',y ' ) , taken over the pupil, and it is equivalent to the one due to the astigmatic aberration of the optical system (YAMAMOTO [1968]).
*
-
.
S = d2 e(nz-n$)/(nj++zg)where 2e is the thickness of the Savart plate, no and 12, the ordinary and extraordinary indices of the crystal and n the index of refraction of the surrounding medium. t d = { ( n e - n o ) / n }. tg E , where E is the wedge angle.
VI. § 41
316
LOCALIZATION O F FRINGES
§ 4. Localization of Fringes with Partially Coherent Light In a general arrangement which is illustrated in Fig. 5 in the case of a Savart plate, the object plane X is supposed to be an extended source M of arbitrary coherence Fij(xi, yi,0) between the two beams i and i. The optical system 0 forms of the image of M at M'. S is generally considered as a shearing element, whose coherence transmission is given by eq. (3.25). By using the method given in the preceding section, the mutual intensity in the plane X is represented by *
r(x',Y',0) = c ij
ss
FZi(Xi, yi,0) * @&;.-si-xi, y ; - s i - y i ) x
x exp(-i2n (dixi-diyj) where
'f9'(xiJ
Yj)
- exp{-i2n = gi(xi)
(disi-dj sj))dxi dyi (4.1)
gi*(Yj)'
(4.2)
Here, Qii is the coherence spread function for the beams i and j , gi(xi) being the amplitude spread function of the system for the beam i. M'
M
I
X,
(b) Fig. 5. Calculation of the coherence of a radiation field passing through (a) a shearing element and an image-forming system, or (b) an image-forming system and a shearing element, in the order named.
*
Hereafter, the integral sign without limit will stand for
s-",
.
316
SOURCE-SIZE COMPENSATION
[VI,
§ 4
The intensity at the point X’ becomes, if the system is assumed stigmatic, i.e. g i ( x i )= 6(xi),
I ( X ’ ) = ql(x;-s1, x;-sl, o)+T;z(p’x;-s2, p k - s 2 , 0) + 2 9 [q2(x;-Sl, p ’ x i - s z , 0) x x exp{-i2n ((Sl-p’ B,)x;-Sl sl+ S , s,)}], where p = sin =,/sin ul, p’ = sin uk/sin u;,
(4.3)
and FFj(P, Q, 0) denotes the value of rij(xi, yj, 0) in the plane X when x iis replaced by P, yj by Q. The visibility is determined by the modulus of cross-coherence between such two points in the source as
x1 = x;-sl,
yz = p ’ x ; - s z .
(4.4)
Incoherent source being assumed, it follows that the unit visibility is obtained only if the (overall) magnification of the system is equal for the two paths: p = p‘ and psl-sz
if p
=
= 0,
1, sl-sz
=
0.
Eq. (4.6) is equivalent to the classical rule of Raveau (COTTON [1934]) which states that the plane of localization lies at the intersection of two rays derived from a single incident ray. In the case of a Savart plate, eq. (4.6) means that u1 = up = 0; for each shear is perpendicular with each other: s1* s2 = 0. The fringes are localized in the focal plane. When we place a Savart plate in front of an aberrant system with a finite aperture, it is shown that the visibility of the fringes in the focal plane is equal to the modulus of the optical transfer function of the system at the normalized spatial frequency (Sl-Sz) with respect to infinity, while the variation in fringe position indicates its phase variation. Similarly, in the analogous arrangement as shown in Fig. 5(b), we find the mutual intensity across the image plane as
r ( X ’ , Y ’ , 0) = 2 e x p ( - i 2 n ( 8 ~ ~ ~ - 8 ~ y* ~exp(i2n(Sisi-Sisi)} )} x ij
VI, §
51
SOURCE-SIZE
COMPENSATION
317
Although the form is quite similar with eq. (4.1), the essential difference is the definition of shears. In eq. (4.11, si and g i are a reduced shear and a reduced tilt in the object space, whereas in eq. (4.7) s: and Si are the ones in the image space. It is impossible for si of a Savart plate to tend to null, unless the image plane goes to an infinite distance. The fringes are localized at infinity.
Fig. 6. Localized fringes by a Wollaston prism.
For a Wollaston prism as shown in Fig. 6, the condition for localization eq. (4.6) is expressed as sin u * 5 = 0, where 5 is the distance from the source (object) to the Wollaston; it is impossible to make u equal to zero while keeping 5 definite. Consequently, the localization is obtained in the image plane only when 5 = 0. Q 5. Source-Size Compensation The combination of the two arrangements as shown in Figs. 5(a) and (b) enables us to constitute a source-size compensated interference microscope. There are four possible modes according to which one is placed before the other, the image plane and the exit pupil of the precedent system being coincided with the object plane and the entrance pupil of the subsequent system respectively. We call the coincided planes the intermediate planes, denoted by XI o r x 2 for the beam 1 or 2, and place the object to be observed in either plane.
318
SOURCE-SIZE COMPENSATION
[VI,
s
5
Fig. 7. Source-size compensation in the field plane: illustration of the case when two shearing elements are placed outside a microscope (condenser-objective system).
It is to be noted that the source plane X and the (final) image plane X are common t o both beams in the sense explained before (9 3). If we take as an example the case shown in Fig. 7, the one (Fig. 5(a)) is placed before the other (Fig. 5(b)) with each pupil superposed, similar operations as before lead to the mutual intensity in the image plane being represented by
qx',Y',0) =
ss
z: ij
Tij(Xi,
Y j , 0)
x & & - (si+s'i)-xi,y : - ( s j + s ; ) - y j ) x exp{-i2n( (d,x,+sixi) - (djyj+d;yj))}dx,dyj xe~p{-i2n(8~s~-~,s,-d~s~+d~s~)),
(5.1)
Y j ) = &(Xi) . g"?(Yj),
(5.2)
where &(Xi,
and gi(xi)denotes the overall spread function of the composite system (condenser-objective system), with &,j the overall transmission of coherence. When the approximation that the whole system is stigmatic is made, one finds easily
r(x',Y', 0) = 2 lyj(x;-(s,+s;),y ; -
(Sj+Si),
0)
ij
x exp{-i2n((di+d;) xi- (Sj+Si) yj)} x exp(i2n (si(di+di)
s; (dj+ S i ) ) } .
-
(5.3)
Thus it is concluded that the one system can compensate the loss of cross-coherence due to the other, if the following two conditions are both fulfilled:
(I) the overall magnification between the planes X and X' must be equal for the two paths:
VI,
5 51
319
SOURCE-SIZE COMPENSATION
m, = m2 = m
where
p = sin a,/sin u,,
or
p =p’,
p’ = sin ailsin
(5.4) M;;
(5.5)
(11) the ratio of the sum of the reduced shears for each path must be equal to the ratio of the apertures subtended a t the source plane : P(Sl+S&
=
( s 2 + 4
0.
(5.6)
“ I f p u l , (sz--s,)+
or
(.;-s;) = 0,
(5.7) (5.8)
(Sl+s;) = ( s 2 + 4 ) .
Using condition (I), this is also expressed in terms of the relative shear with respect to one path which is measured in geometrical coordinates, (S,-S,)+m(S;-s;)
=
0.
(5.9)
(111) In addition to these conditions, the condition for the zero phase of cross coherence:
* If
(8,fs”;) -p’(8,+8k)
=
0.
(5.10)
p’ = 1,
(s^,-SA1)+
(S‘;-s”;)
=
0,
(5.11)
or ($1+$;)
=
(8,tQ
(5.12)
is satisfied, the fringes disappear. Using the condition (I),this is also represented as (5.13) where T,, T ; , T,, Tb are the aperture distances for each path, as defined in 0 3. STEEL[I9591 derived these conditions in a slightly different way. I t is shown that they never change even when the finite aperture and aberrations of the system are taken into consideration or when any other mode of combination of the two is adopted. From only the two conditions (I) and (II), source-size compensated interference microscopes presenting a frilzged field can be derived. All the conditions
* In a common-path interferometer, p = p’ = 1. The same condition must be valid for maximum contrast in interferometers of a different type.
320
SOURCE-SIZE COMPENSATION
[VI,
s5
(I), (11) and (111) being satisfied, the ones showing a uniform field will result. In order to find polarization interferometers belonging to the latter, F R A N ~ [1956, O N 19661 showed the following compensation principle equivalent to eqs. (5.7) and (5.11). We may call this the principle of localized fringe transfer: (a) the two fringe systems of the birefringent elements, which may be either fringes at infinity or localized fringes, must be exactly superposed in one plane (we will call it the plane of superposition); (b) the two birefringent systems must be so oriented that the splitting produced by one is exactly cancelled by the other. When eqs. (5.7) and (5.11) are perfectly established as well as the condition p = p’ = 1, the two exit pupils and the two exit windows are exactly coincided. Each of the rays emitting from the source proceeds as if the shears and tilts never occurred. Therefore, the validity of the conditions (5.7) and (5.11) is not confined to the planes of the source and the image. They are virtually valid for any other pairs of conjugate planes; that is, the interference phenomena are “non-localized”. It is this fact that justifies the equivalence of FranCon’s conditions to ours. U’
!
I c
I
I
Fig. 8. Source-size compensation on the pupil surface.
To complete the study of the compensation, suppose that another objective is placed in the image plane and assume that it forms the image of the exit pupil plane U‘ at U“, and that p = p’ equals to unity. In Fig. 8, the complex system is represented by a simple objective 0. By taking the Fourier transform of the mutual intensity r ( X ’ , Y , 0 ) , we get eq. (5.11) as the condition for recovering the modulus of cross-coherence and eq. (5.7) as the condition for zero phase,
VI,
§ 61
PRACTICAL METHODS
32 1
so that the two conditions are interchanged. The fringes to appear in the pupil are just what is called “source fringes”, while the fringes to appear in the image plane are called “test fringes” by STEEL[1965, 19671. These are specified as complementary. These considerations not only give general grounds for reasoning the principle of the practical methods of source-size compensation in any type of two-beam interferometer, some of which will be given in the next section, but they provide a useful tool for approaches to new designs of interference microscopes. It is last but not least that the analysis based on eqs. (5.1) and (5.2) will be used to study the influence of imperfect compensation upon image-formation by an interference microscope (§ 7 ) .
8 6. Practical Methods of Source-Size Compensation in Shearing Interference Microscope with Polarized Light In this section, we will confine ourselves to presenting all the practical methods of source-size compensation in a shearing interference microscope. Most of them were described by KRUG,RIENITZ and SCHULZ[1964], FRANCON [1961, 1966, 19671, BRYNGDAHL [1965], but the purpose of our study is somewhat different from theirs. We will consider them as theoretical consequences of the discussion made in the previous section, and will classify them systematically into several modes of construction, add some which have been derived analytically, and finally make a simple comparison from a theoretical point of view. As stated earlier (9 2.4), in interference microscopes the interferometer with dissimilar arms is rare, because matching of the dispersion in the two arms is difficult. In interferometers of symmetrical form, there is no particular problem about source-size compensation except matching aberrations and adjustment of the optics which was discussed partly by HOPKINS[1957b, 19671. Interference microscopes in common-path form can be well realized with polarization interferometers. The double refracting systems such as Savart plates or Wollaston prisms can divide the light beam into two beams polarized at right angles with exactly equal amplitude, independent of the wave-length and nearly of incidence-angle. At the same time, they produce shearing (lateral displacement) or double focusing (longitudinal displacement) * between the two polarized beams.
*
The best known form is described by SMITH[ 19551.
322
SOURCE-SIZE
COMPENSATION
[VI,
5
6
Ordinarily, the double refracting system is self-compensated satisfactorily. The delay is not worth due consideration. In the present status of technique, the double-focus method is not so suitable for interference microscopy as the shearing one, because the possible defocusing cannot be so large as to give an undisturbed reference wave-front (KRUG,RIENITZand SCHULZ [1964], p. 136); moreover, as STEEL[1967] pointed out, it is also difficult to form reference fringes without affecting the visibility. This is why it is excluded in this section.
Fig. 9. Practical methods for obtaining the fringed field: (a) NOMARSKI and WEIL [1955], (b) NOMARSKI and WEIL [1955], (c) GONTIER[1957], GUILD[1957],
(d) GONTIER[1957], GUILD[1957], (e) UHLIG [1965];
VI,
s
PRACTICAL METHODS
61
323
6. 1, METHODS F O R ORTATNING FRINGED F I E L D O F VIEW
6.1.1. I n the object plane
When only eq. (5.7) is valid, the fringes of spacing inversely proportional to I (d,--$,)+ (&--$;)I appear across the field. The optical-path difference due to the object can be measured by reading the deformation of the fringes which play the role of reference fringes. When each of the two Savart plates or the two Wollaston prisms is placed outside
(b')
(d')
2
, , (e')
I I
, , I
(a') YAMAMOTO [1968], (b') YAMAMOTO [1968], (c') FRANFON and PRAT [1964],
(d') YAMAMOTO [1968], (e') YAMAMOTO [1968].
324
S O U R C E - S I Z E C 0 M P E N S A T 10 N
[VI, §
6
of a microscope (condenser-objective system), one before and the other after, eq. (5.7) is rewritten as s+s‘
=
0
(6.1)
in terms of scalar reduced shears defined by eq. (3.28) or (3.31). From the relation (6.1), we get S .m
=
-S’,
(6.2)
for Wollaston prisms 05 . m
=
-a‘(’,
(6.3)
for Savart plates
where m is the magnification of the condenser-objective system between the planes x and x‘. A most simple solution is that m is unity. Then, the illuminating system and the image-forming system must be identical and arranged symmetrically with respect to the intermediate (object) plane, and the two birefringent systems have to be also identical and placed in an appropriate orientation. The system with transmitted light can immediately be converted to a reflection system. All the methods as shown in Figs. 8 and 9 follow this principle and can use a large light source. NOMARSKI and WEIL [1955] is the first to have described this kind of system with his modified Wollaston (NOMARSKI [1955]), as shown in Figs. 9 [a), (b). The fringe spacing i is given by
i
=
@/a)* T / ( T - ( ) ,
where 20 is the splitting angle of the Wollaston. The equivalent Savart systems are shown in Figs. 9 [a’), (b’). 6.1.2. In the pupil surface
As illustrated earlier, the complementary fringes of spacing inversely proportional to 1 [sz-sI)+ (d-s;)] appear across the pupil when eq. (5.11) is established. The fringes represent also the wave-front aberration, with respect to a chosen position of the object plane, which will affect the visibility of the fringes that must appear in the image plane when the same optical system is used as a part of an interference microscope. The corresponding equation to eq. (6.1) is given by 3+gr = 0
(6.5)
in terms of scaler reduced tilts defined by eq. (3.28) or (3.31). From this, we find the relations quite similar to eqs. (6.2) and (6.3):
VI.
§ 61
PRACTICAL METHODS
for Savart plates
s
4L = s’,
325
(6.6)
-o’(T’-t’), (6.7) where 4L is the magnification for the entrance and pupil planes of the whole system. If 4L is assumed to be unity, the pupils lie in the principal planes of [1957] and GUILD[1957] described independently the system. GONTIER the system shown in Figs. 9 (c), (d) for the study of the irregularity on the pupil surface. FRANCON and PRAT[1964] described its equivalent shown in Fig. 9 (c’), where two modified Savart plates by Franqon are used. It may be converted to the reflection system as shown in Fig. 9 (d’). In these cases, ordinary Savarts are used with the light source of more limited extent because of the curvature of fringes. For the same reason, Franqon’s modified Savart may be used in Figs. 9 (a’), @’). FranCon and Prat applied the system to an interferential focometer for the lens L, because the fringe spacing i is proportional to the focal length f of L: for Wollaston prisms o(T--5) A
=
i = (A/ZS)f.
(6.8)
For optical testing of the microscope objective, the systems as shown in Fig. 9 (e) and Fig. 9 (e’) can be used. UHLIG[1965] tested the mechanical tube length by the former system, because the fringe spacing varies proportionally with 5-l. YAMAMOTO [ 19681 utilized the latter to test the aberration of an objective with respect to the image plane conjugate to the reflecting object plane. This is no more than a polarization version of the classical Waetzman’s interferometer (WAETZMAN [ 19 121 ) . 6.1.3. Comparison between the uses of Savart plates and Wollaston prisms
The position of a Savart plate along the optical axis is completely free, but the fringe spacing is constant, unless it is split into two wedged ones which slide with respect to each other (TSURUTA [1963]) or it is replaced with two counter rotating Savart plates (STEEL[1964]). On the contrary, the spacing of the fringes by the Wollaston varies as we move it along the axis. 6.2. METHODS FOR OBTAINING UNIFORM FIELD O F VIEW
When both the conditions indicated by eqs. (5.7) and (5.11) are satisfied, the two beams become coherent and the intensity distribution turns uniform everywhere, with a large light source. Since, both
326
SOURCE-SIZE COMPENSATION
[VI,
a
6
eqs. (6.1) and (6.5) are satisfied, eqs. (6.2) and (6.6) or eqs. (6.3) and (6.7) hold. In order that eqs. (6.2) and (6.6) are satisfied for two Savarts, the optical system placed between them should be afocal, namely, telescopic, and the ratio of the shearing distances S , S’ of the Savart plates should be equal to the constant magnification of the afocal system,
yjs
1
-m
=
-&,
(6.9)
For two Wollastons to be used, they should be placed in the conjugate planes of the optical system which are placed between the Wollastons, and the ratio of the splitting angles 0, 0‘ of the Wollastons should be connected with the magnification rji for the two planes where each Wollaston is placed, O’/O =
-1jrji.
(6.10)
In Fig. 10, the methods for obtaining a uniform field can be classified in four modes of combination of the two fundamental forms as shown in Figs. 5 (a) and (b), where the exit pupil of the first system and the entrance pupil of the second are usually taken a t infinity: mode (1): two birefringent systems are both outside the condenserobjective system (Figs. 10 (a)-(e)); - mode (2): two birefringent systems are both between the condenser and the objective (Figs. 10 (f), (g)); - modes (3) and (4):one birefringent system is outside the system and the other inside it (Figs. 10 (h), (i)). -
The uniform field can be converted into the fringed one without spoiling compensation, when we place some additional interferometer which forms its localized fringes, real or virtual, in the image plane. 6.2.1. Mode (1) The most simple method which is shown in Fig. 10 (a) was described by FRANCON and YAMAMOTO [1962]. (a) and @) which FRANCON and CATALAN[1960] described follow the principle given by eq. (6.9). The adjustment for obtaining afocality was made by the movement of the condenser. (c) is the well-known Smith’s method (SMITH[1947]), where the two Wollastons are placed in the focal planes of the condenser and objective (T = 5‘ and T‘ = Since the focus of high aperture objective or condenser is not accessible, Nomarski realized this principle with his modified Wollaston prism. FRANCON and YAMAMOTO [1962]
c’).
VI,
S 61
PRACTICAL METHODS
(i)
7/-!
327
m t
uJ+
Fig. 10. Practical methods for obtaining the uniform field (transmission system) : (a) FRANFON and YAMAMOTO [1962], (f) LEBEDEFF [1930], (b) FRANFON and CATALAN [1960], (9) LEBEDEFF [1930], (h) FRANFON [1957], (c) SMITH[1947], (a) FRANFON and YAMAMOTO [1962], (i) LINDBERG [1952]. [1957], (e) FRANFON
328
SOURCE-SIZE COMPENSATION
[VL
I
6
extended Smith's method t o the case where T--5 # 0 and T'-(' = 0 are valid, which is shown in (d). (c) and (d) follow eq. (6.10). A mixed system consisting of a Savart plate and Wollaston prism was described by FRANCON [1957], which is shown as (e). In this case, a modified Wollaston prism should be used so that both the direction of vibration and the direction of shear may be parallel to those of the Savart plate. 6.2.2. M o d e (2) LEBEDEFF[1930] used the well-known interferometer by JAMIN [1868]. This is the first system which was source-size compensated
for a uniform field. It consists of two identical crystal plates cut at 45" to the optical axis, with a half-wave plate between them. The object is also introduced between them. We can suppress the halfwave plate by replacing the two identical plates with two identical Savart plates, but the non-straightness of their fringes reduces the usable aperture (LEBEDEFF [1930]), see Figs. 10 (f), (g). 6.2.3. M o d e s (3) and (4)
FRANCON [1957] used two Savart plates, one under the object and the other behind the afocal system consisting of the objective and an auxiliary lens (Fig. 10 01)).This system enables one to convert the well-known Franqon's interferential ocular ( FRANCON [ 1952,19541) into the source-size compensated one, just as the system shown in Fig. 10 (e). LINDBERG[1952] described a mixed form as shown in Fig. 10 (i). 6.2.4. Reflection system
Since some of the above mentioned systems are symmetrical with respect to the object plane, they can be adapted immediately to a reflection system as shown in Figs. 11 (a) and (c) (SMITH[1947], NOMARSKI and WEIL [1955], FRANCON [1953]). Later, DYSON[1963] made the beam reflect back and traverse the optical system twice so that the interferometer became an extremely stable one (Fig. 11 (b)). More recently, FRANFON and YAMAMOTO [1962] proposed the system shown in Fig. 11 (d), where an auxiliary lens L, is added to make the whole catadioptric system (L,+L,+L,) afocal. So far, reflection systems have been described which are to observe the p2ane reflecting object. To observe the curved object, YAMAMOTO [I9681 described the system which is shown in Figs. 11 (e) and (f). A varifocal system is introduced, which consists of two lenses L, and
VI,
5
329
PRACTICAL METHODS
61
M'
M
M
M'
t M'
5'
(e1
Fig. 11. Practical methods for obtaining the uniform field (reflection system): (a) SMITH[1947],
(b) DYSON[1963], (c) FRANFON [1953],
(d) FRANFON and YAMAMOTO [1962], (e) YAMAMOTO [1968], (f) YAMAMOTO [1968].
330
SOURCE-SIZE COMPENSATION
[VI,
J
6
L, both of which have the power, equal but contrary in sign. As the distance between them varies, the focal length of the composite system varies inversely proportionally to it. Its principal planes H and H’, however, stay always at the focal plane of L, and L, respectively. I n the system shown in Fig. 11 (e), if the principal plane H lies in the plane M, conjugate with the image plane M’ of the microscope, the ensemble system including the reflecting surface can be made afocal with unit magnification * by coinciding the focus of the varifocal system (L,+L,) with that of the catadioptric system. In order to do it, one may move the diverging lens relative to the converging one while keeping the latter immobile. Consequently, by placing two identical Savart plates, one before the varifocal system, the other after the objective, source-size compensation will be established, irrespective of the magnification of the objective and nearly of the curvature of the object. I n the system shown in Fig. 11 (f), by placing the first Wollaston a t an appropriate distance from the diverging lens and moving them as a body, the first Wollaston W may be imaged on the second W‘ with a constant magnification independent of the magnification of the objective for a large extent of range of curvature of the object. 6.3. OR J E C T I V E COMPENSATION AND P U P I L L A R Y COMPENSATION
I n the source-size compensation for obtaining a uniform field of view, two different types of compensation may be distinguished by the place where two rays derived from a single ray intersect with an angle, i.e. the position of the plane of superposition (9 5 ) . The case when the position is in the exit pupil of the objective may be called the pupillary compensation, while the case when it is close to the object plane, the objective compensation (FRANCON and YAMAMOTO [1962]) t. The important thing is that the aberrations of the objective affect the interference in quite different manners in these two cases. Consider the two methods which were shown in Figs. 10 (a) and (c). We illustrate them again in Fig. 12, the objective compensation by solid lines and the pupillary compensation by dotted lines. To obtain the same shear PIP, in the object plane, the two rays are separated in the pupil plane by the distance m i n the former, but *
Because M and M’ are the principal plane pair of the catadioptric system.
t The first objective compensation was described for double focusing interference [1951]. niicroscopes by PHILPOT
VI,
§ 71
331
IMAGES OF INTERFERENCE MICROSCOPES
M
M'
Fig. 12. Comparison between the objective compensation and the pupillary compensation.
null in the latter. In other words, the two images of the exit pupil are sheared by to the pupil in the former. Since the fraction of diameter corresponds to a normalized spatial frequency s",--s^, , it is shown that the visibility reduces to the value of the optical transfer function at the frequency &,-& with respect to the object P, or P, (YAMAMOTO[1965, 19681). Even when the condenser-objective system is corrected perfectly, the visibility never attains to unity in the case of objective compensation. The more the shear amounts, the more serious loss will be involved. Aberrations accelerate the deterioration. On the other hand, in the pupillary compensation, the surface of the exit pupil is really curved and astigmatic; moreover, large amounts of distortion are present in the pupil plane. Consequently, the superposition of the localized fringes becomes imperfect. And SO the pupillary compensation will be difficult with a high aperture.
5 7.
Images of Source-Size Compensated Interference Microscopes
If the source-size compensation is attained, the object can be observed through a microscope with a large light source which is usually imaged in the entrance pupil of the condenser. For simplicity, we assume that the optical system satisfies p = p' (eq. (5.5)) and p equals unity. Then, it is not necessary to distinguish the variables for beam 1 from those for beam 2. As stated earlier, if an object is introduced which is characterized by amplitude transmission Li(B)for the path i, the coherence transmission is given by eq. (3.11),
Then the mutual intensity in the image plane is represented by the
332
SOURCE-SIZE
COMPENSATION
[VI.
§ 7
following double convolution integral, using eqs. (4.1) and (4.7):
r&d,y‘, 0) =
/!
ri.(x, y, o)@zj(B-si-x, y-sj-y) I
X A i j ( X , p)@ i j ( X ’ - s ; - X ,
-
y’-sj-y) x exp{-i2z((dix-diy) (Bix’-$y’))} x exp{-i2n ( (siBi-sjdj)- (s:B ~ - . s ~ i ~ ) ) } d x d y d ~ d ~ .
+
T,,, Tlz, After calculating this integral for all pairs of i, j , i.e. T,,,
rZ1, putting x’= y‘, we obtain the intensity distribution in the image
plane, I ( x ’ ) = T ( x ’ ,x’,O), following the scheme of the unified theory. Since the object is partially coherently illuminated by each beam alone, rii’s (i = 1, 2) agree with the intensities which were given with the transfer factors or transmission cross-coefficients (HOPKINS [1953], BORNandWoLF [1959] p. 523) by HOPKINS[1953,1957b], with the exception of a bodily displacement due to si . But, the cross-coherence such as T,,slightly differs from them, as we will discuss below. If the object is sufficiently low contrast in the sense that
Li@)= \Li(X)l exp{iyi(n)}
(7.3) (7.4)
llLi(%)l-ll << 1, Pi(%) << 1, as MENZEL [1958, 19601 and SLANSKY [1959, 1960, 19621 described, all Tij’s can be so simplified that their Fourier transforms can be separated into two parts, the one related to the spatial Fourier transform of yi(X)and the other to the spatial Fourier transform of lLi(X)l-l, i = 1 or 2. 7 . 1 . IMAGE INTENSITY
If the assumption is made that the mutual intensity in the entrance pupil of the condenser is approximated by Dirac’s delta function* rij(u, v) = G(u-v--d), (7.5) where B is the sheared distance produced by the first shearing element, we find the intensity in monochromatic light at the point x’ in the image plane: Fij(x’, x’,0) = C . exp{-i2n(d+$’) x’}
x / / A i j ( r n + n , n)tij(&, 0; m + n + d , n ; s+s’) x exp{-i2nrn(x’-s;)
*
+i2zns‘}dmdn,
(7.6)
This assumption means that a perfect collector lens images a light source onto the entrance pupil of the condenser through the first shearing element.
VI, §
71
333
IMAGES O F INTERFERENCE MICROSCOPES
where s
C
= s.-s. 2
=
3’
g
= d a. - - $ .3 7
s’ = s a. - s . 3 ’ 8’ = s,.-s.9 ) ’
I
n‘
”I
exp{i2n [( s i + s ; 8) - (sig i-sj Sj-si $ +sj .() ) >.
(7‘7) (7.8)
Here, 3iij(u,v) denotes the Fourier transform of &(R, p) in eq. (7.l ) , the product of the two-dimensional inverse Fourier transforms
of Li[%)and L,[y): 3iii(U,
v)
= &(u)*
Zj*(v),
L
(7.9)
m
Zi(u)=
L t ( X ) exp(i2nu2)d%,
(7.10)
and t i j is defined as follows:
tij[a, b ; a‘,6‘;c ) =/fdv+a)fXv+b)
fi(v+a)fi*[v+b’) . exp{i2ncv}dv,
(7.11)
where f i , fi are the pupil functions of condenser, objective for the beam i. The tij’s may be called the transfer coefficients of the two-beam interference microscope. The region of integration is shown in Fig. 13. For tii [i = 1, 2), the two circles of the condenser apertures denoted by f i and f: coincide with each other, for 8 = di-di = 0. Then tii’s become equal t o the transfer factors. In the absence of the object or in the presence of the object uniform in transmission (L,[X) = L,(%) = l ) , &(m+n, n) = d(m+n) * d(n).
(7.12)
Then, one finds
rij(x’, x’, 0)
x
J
=
exp{-i2n[8+d’)x’} x
fi(v+s^)fj(v+s^) fj*(v)fj*(v)* exp{i2n(s+s’)v}dv.
(7.13)
On the one hand, the influence of the imperfect compensation s+s’ # 0 can be analyzed by evaluating the integral given by eq. (7.13). This leads to a tolerable deviation from the compensation conditions. On the other hand, if the compensation conditions are satisfied, the integral is no more than the optical transfer functions of the whole system at the normalized spatial frequency d . This is the expected intensity in the absence of objects. When ap-
334
SOURCE-SIZE COMPENSATION
Fig. 13. Integration domain for the transfer coefficients of the two-beam interfercnce microscope when fi, f j denote t h e pupil of the condenser for the beams i and j respectively, similarly f ; , /; t h a t of t h e objective, measured in reduced co-ordinates. The area enclosed by a thick line is the integration domain.
plying the HOPKINS’Sformulae which yield aberration tolerances (HOPKINS[1957a]), we can determine the tolerable aberrations for an interference microscope, so as to give no appreciable amount of intensity in the black background. YAMAMOTO [1965, 19681 discussed these problems in the case of his interference microscope with very small shear, which is called differential interference in the German [1967]). literature (eg. FRANGON 7.2. HARMONIC ANALYSIS O F IMAGE INTENSITY
When we take the two-dimensional Fourier transform of eq. (7.6) for each pair (i, j ) , the compensation conditions being satisfied, we find
bij(m)= C exp(i2nms~)
x j t i j ( S , 0; m + n + $ , n ; 0) A,,(m+n, n ) exp(i2nns’}dn,
(7.14)
VI,
s
71
IMAGES O F INTERFERENCE
MICROSCOPES
335
where C is given by eq. (7.8). Summing up all bii’s, we obtain b(m),the two-dimensional spatial frequency component of the image intensity. bii (i = 1, 2) represents the image formed by each beam alone, and the image contrast depends mainly on the bij’s (i # j ) . STEEL [1959] described the b ( m ) in the interference microscope with separate arms, where an object is placed in one path and a clear object in the other path and no shear is present. Then, it is by the following expression that the aberration balancing between the two optical systems for the beam i and j can be analyzed: t i j ( O , 0; m ,0, 0) =
s
f i ( v ) f j * ( v ) f ~ ( m + ~ ) f ~ * ( v )(7.15) dv.
For the low-contrast object, which is called the Zernike-Gabor object ~ ~ L O H M A N N from eqs. (7.3), (7.4) and (7.10),theFourier [1956], transform of the object is expressed as the following sum:
Z(m) = d(m)+Z’(m).
(7.16)
If we designate the Fourier component of the amplitude and the phase of the object by a ( m ) a n d p ( m ) , * i.e.
s-,
W
a(m)=
{ I L ( i ? - l } exp{i2nm2j&,
(7.17)
W
p(m)= S _ q ( . i ) exp{i2zmdjd.i,
(7.18)
the interference microscope using a large source, that is, with partially coherent illumination, plays the role of a linear filter for a ( m ) and p (m). The transmissions for these are called “amplitude contrast function” and “phase contrast function” by MENZEL [1958, 19601 and denoted by d ( m )and S ( m ) (MAR~CHAL and FRANGON [1960]).+ Menzel also showed the d ( m ) and 9 ( m ) for the interference microscope with separate arms, where an object is placed in one path only. YAMAMOTO [1965, 19681 described these functions for the interference microscope of differential shearing when a circular aperture is assumed. These results are roughly illustrated in Fig. 14, where y is the phase angle introduced by the compensator. The dotted line *
We have the following relations: Z’(m)+l’*(-m)= 2 a ( m ) , Z’(m)-Z’*(-m) = i2p(m). t d( m ) and Q(m ) are defined as the coefficients of a(m ) and p ( m ) in the expression of b ( m ) ,i.e. ( m# 0 ) . b ( m )= C b i i ( m )= d ( m ) . a , m ) $- 9 ( m ). p ( m ) $9
336
SOURCE-SIZE COMPENSATION
ivI, § 7
Fig. 14. Representation of the amplitude contrast function d ( m ) and the phase contrast function 9 ( m ) in the case of (a) interference microscope of Michelson type, (b) interference microscope of very small shear (the case when the shear in the object plane is given by @/(N.A.), where (N.A.) is the numerical aperture of the objective). Both the objective and the condenser are assumed to be free of aberrations and have thc same numerical aperture.
indicates the optical transfer function of the microscope objective which is defined with incoherent illumination. 7 . 3 . E F F E C T S O F THICKNESS O F THE OBJECT U N D E R OBSERVATION
It was stressed earlier that. interference is non-localized, if the sourcesize compensation has been achieved for a uniform field and an object is assumed to be infinitesimal in thickness. The actual object, however, may have locally varying, appreciable thickness and hence varying inclination.
---I?--Fig. 15. Illustrating the localization of interference by a wedge-shaped object.
If a wedge-shaped object is placed in one path as shown in Fig. 15, a shear s due to the inclination of the upper surface takes place, and the virtual image of the intermediate plane 2 conjugate with the image is shifted toward the object by the distance h:
VI,
§ 71
IMAGES OF INTERFERENCE MICROSCOPES
s = -Z(l-(no/n))
h
=
-
8 n sin u/A,
337
(7.19) (7.20)
{ ( ~ o - n ) / f i o }=e p/no,
where I is as indicated in Fig. 15, h the shift at the center as defined in 3, 8 the wedge-angle, no and n refractive indices of the object and the surrounding medium, e the mechanical thickness, cp the optical thickness of the object, i.e. p = (no-n)e.
(7.21)
For maximum contrast, s should evidently be null. If the inclination 8 is not zero, the interference becomes localized a t I = 0. One must focus to the upper surface of the object within the depth of focus range of the objective. When the reference fringes are to be introduced, it is on this surface that they should be also localized. The shift h (defocusing) by eq. (7.20), however, still remains. * For actual objects, e, p, s, h and 8 are all considered as functions of location; 8 may be replaced with (grade ( X ) ( . The defocusing can be included in the amplitude transmission defined as (l-@iP)} for ii2 _I p2 L (2,23) = exp(-i(2zv/c)q(~)
for d 2 > p2
(7.22)
where /?= - (nsin u)2/n,,and p is the reduced radius of the condenser aperture. Consider the image produced by a shearing interference microscope. Substituting eq. (7.22) for L i ( X ) in eq. (7.1) and calculating with appropriate approximation, the image intensity is obtained as follows:
I&’)
= T(x’,x’,0)
=
2 exp(i(2nvlc)(1-iflp2)
(p(x’-s~)-p(x’-ss;))}. (7.23)
ij
The factor (1-@p2) is the “obliquity effect” of illumination aperture size, for which INGELSTAM [1960], INGE LsTAMand JOHANSSON [1958], TOLMAN and WOOD[1956], GATES[1956], BRUCE[1955, 19571 and THORNTON [1957] have derived the correction formulae. With reflected light microscopy, we may put no = -n in eq. (7.20).
* The tilt will also take place in the exit pupiI. This effect was described recently by GUILLARD[1963-19641, and was ignored here.
338
SOURCE-SIZE COMPENSATION
[VI
Q 8. Conclusion An outline of a general theory of source-size compensation in twobeam interference microscopy has been presented. It is formulated in terms of four coherence functions rijbetween the radiation from the beams i and j at two points. The representation of these functions was investigated on any one of the reference surfaces (pupil planes or window planes) in the image-forming system including several shearing and/or tilting elements. This representation applies to both the localization of fringes and the source-size compensation in any plane of interest, whereas the latter was described formerly as the superposition of two systems of localized fringes. These studies have yielded simple formulae which serve as an analytic tool for devising new designs, some of which were described above. It was also deduced that the transfer properties of source-size compensated interference microscopes can be expressed by the newly defined transfer coefficients of the interference microscope, characteristics somewhat different from those of ordinary microscopes. They can be utilized for examining the influence of imperfect compensation and fixing permissible aberrations for high visibility. This is indispensable information for an attempt to produce any kind of interf erence microscope. The explained theory which we owe principally to Steel unifies the theory of interferometer and that of image-formation by a microscope. It has been proven that the theory throws a new light on the difficult theoretical and practical problems encountered in interference microscopy.
References ALLEN, R. a n d J . W. BRAULT, 1966, I m a g e Contrast a n d Phase-Modulated Light Methods i n Polarization a n d Interference Microscopy, in: Advances i n Optical and Electron Microscopy, eds. R. E. Barer and V. E. Cosslet (Academic Press, New York) p . 77. J . D. a n d A. LOHMANN, 1964, Optica Acta 12, 185. ARMITAGE, BEKAN, M. and G. B. P A R R E N T , 1964, Theory of Partial Coherence (PrenticeHall, Englewood Cliffs, New Jersey) p. 111. BLANC-LAPIEKKE, A. a n d P. DUMONTET, 1955, Rev. O p t . 3 4 , 1 . BORN, M. a n d E. WOLF,1959, Principles of Optics (Pergamon, London). B R E M M E R , H., 1951, Physica 17, 63. BRUCE, C. F., 1955, Aust. J. Phys. 8, 224. BRUCE, C. F., 1957, Optica Acta 4 , 127.
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REFERENCES
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BRYNGDAHL, O., 1965, Applications of Shearing Interferometry, in: Progress in Optics, Vol. 4, ed. E. WOLF(North-Holland Publishing Co., Amsterdam) p. 37. CONNES,P., 1956, Rev. Opt. 35, 37. COTTON,A., 1934, Rev. Opt. 13, 153. DUMONTET, P., 1955, Optica Acta 2, 53. DYSON,J., 1950, Proc. Roy. SOC.204, 170. DYSON,J., 1963, J. Opt. SOC.Am. 53, 690. ELLIS,G. W., 1966, Science 154, 119s. FRANGON, M., 1952, Rev. Opt. 31, 65. F R A N ~ M., O N1953, , Rev. Opt. 32, 349. FRANFON, M., 1954, Optica Acta 1, 53. FRANFON, M., 1956, Interferences, diffraction et polarisation, in: Handbuch der Physik, Vol 24, ed. S. Flugge (Springer, Berlin) p. 171. FRANFON, M., 1957, J. Opt. SOC.Am. 47, 528. FRANFON, M., 1961, Progress in Microscopy (Pergamon, Oxford). M., 1966, Optical Interferometry (Academic Press, London). FRANFON, M., 1967, Einfuhrung in die neueren Methoden der Lichtmikroskopie FRANFON, (Verlag G. Braun, Karlsruhe) p. 102. F R A N ~ M. ON and , L. CATALAN,1960, Rev. Opt. 39, 1 . FRANFON, M. and R. PRAT, 1964, Optica Acta 11, 252. FRANFON, M. and B. SERGENT, 1955, Compt. Rend. Acad. Sci. 241, 27. FRAN~O M.Nand , S. SLANSKY, 1965, Coherence en Optique (C.N.R.S., Paris). FRANFON, M. and T. YAMAMOTO, 1962, Optica Acta 9, 395. GABOR, D. and W. P. Goss, 1966, J. Opt. SOC.Am. 66, 849. GATES,J . W., 1956, J. Sci. Instr. 33, 507. GERHARDT, U. and H. LENK,1960, Feingeratetechnik 9, 529. GERHARDT, U. and H. LENK,1962, Feingeratetechnik 11,208. GERHARDT, U., 1967, Feingeratetechnik 16, 505. GONTIER, M. G., 1957, Compt. Rend. Acad. Sci. Paris 244, 1019. GUILD,F., 1957, Phys. SOC.Year Book, p. 30. GUILLARD, M., 1963-1964, Rev. Opt. 42, 463; 43, 27, 64, 349. HANSEN, G., 1930, 2. Instrumentenk. 5 0 , 460. HANSEN, G., 1942, Zeiss Nachr. 4, 109. HANSEN, G.,1954, 2. Angew. Phys. 6,203. HANSEN, G.,1955, Optik 12, 5. HANSEN, G.and W. KINDER,1958, Optik 15, 560. HOPKINS, H. H., 1943, Proc. Phys. SOC.55, 116. HOPKINS,H. H., 1951, Proc. Roy. SOC.A208, 263. HOPKINS, H. H., 1953, Proc. Roy. SOC.A217, 408. HOPKINS,H.H., 1957a, Proc. Phys. SOC.B70, 449, 1162. HOPKINS, H. H., 1957b, J. Opt. SOC.Am. 47, 508. HOPKINS, H.H., 1965, Japan J. Appl. Phys. 4, suppl. 1, 31. HOPKINS, H. H., 1966, Optica Acta 13, 343. HOPKINS,H. H., 1967, The Theory of Coherence and Its Applications, in: Advanced Techniques of Optics (Van Nostrand, London) p. 189. INGELSTAM, E. a n d L . P. JOHANSSON, 1958, J. Sci. Instr. 35, 15. INGELSTAM, E., 1960, Problems Related to the Accurate Interpretation of Microinterferograms, in: Interferometry (H.M.S.O.,London) P. 137.
340
SOURCE-SIZE COMPENSATION
INOUE, S. and W. L. HYDE,1957, J . Biophys. Biochem. Cytol. 3, 831. IWATA, G., 1949, Proc. Phys. SOC.Japan 4 , 195 (in Japanese). J , , 1868, Comp. Rend. Acad. Sci. Paris 6 7 , 814. KIND,E. G. and G. SCHUIZ, 1959, Optik 1 6 , 2. KRUG,W., J . RIENITZand G. SCHULZ,1964, Contributions to Interference Microscopy (Hilger and Watts, London). LEBEDEFF,A,, 1930, Rev. Opt. 9, 385. LINDRERG, O . , 1952, 2 . Physik 1 3 1 , 231. LINNIK, W., 1934, 2 . Instrumentenk. 5 4 , 462. LOHMANN, A., 1956, Optica Acta 3, 97. MAGILL, P. J . and A. D. WILSON,1968, J. Appl. Phys. 3 9 , 4717. M A K ~ C H AA.L ,and M. FRANCON, 1960, Diffraction (Rev. Opt., Paris) p. 97, MENZEL,E., 1958, Optik 1 5 , 460. MENZEL,E., 1960, Die Abbildung von Phasenobjekten in der optischen Ubertragungs-theorie, in: Optics in Metrology, ed. P. Mollet, p. 283. MERTZ,L., 1959, J . Opt. SOC.Am. 4 9 , No. 12, p. iv. G. and G. SCHULZ, 1964, Optica Acta 1 1 , 89. MINKWITZ, MURTY,M. V. R. K., 1964, J. Opt. SOC.Am. 5 4 , 1187. MUKTY, M. V. R. K. and D. MALACARA-HERNANDEZ, 1965, Japan J . Appl. Phys. 4 , suppl. 1, 106. G., 1955, J . Phys. Radium 1 6 , 9 (S). NOMARSKI, NOMARSKI, G. and A. R. WEIL, 1955, Rev. Metallurgie 5 2 , 121. PHILPOT, J. St., 1951, Some New Form of Interference Microscope, in: Le Contraste de Phase et le Contraste par Interfkrences, ed. M. FranCon (Rev. Opt., Paris) p. 45. POLZE, S., 1965, Monatsberichte der Deutschen Akademie der Wissenschaften zu Berlin 7 , 631. RANTSCH,K., 1949, Die Optik in der Feinmesstechnik (Carl Hanser, Munchen). G. and G. MINKWITZ, 1961, Ann. Physik (7) 7 , 371. SCHULZ, SCHULZ, G., 1964, Optica Acta, 1 1 , 43, 131. SLANSKY, S., 1959, J . Phys. Radium 2 0 , 13 (S). SLANSKY, S., 1960, Rev. Opt. 3 9 , 555. SLANSKY, S., 1962, Optica Acta 9 , 277. SLEVOGT, H., 1954, Optik 8, 366. SMITH,F. H., 1947, Brit. Pat. 639014, U.S.P. 2, 601, 175. SMITH,F. H., 1955, Microscopic Interferometry, in: Modern Methods of Microscopy, ed. A. E. J . Vickers (Butterworth Scientific Publications, London) p. 76. SNOW, I<. and R.VANDEWARDEK, 1968, Appl. Opt. 7 , 549. STEEL,W. H., 1959, Proc. Roy. SOC.2 4 9 , 574. STEEL,W. H., 1962, Optica Acta 9, 111. STEEL,W. H., 1964, Optica Acta 1 1 , 9. STEEL,W . H., 1965, Two-Beam Interferometry, in: Progress in Optics, Vol. 5, ed. E. Wolf (North-Holland Publishing Co., Amsterdam) p. 145. STEEL,W. H., 1967, Interferometry (Cambridge University Press). THOKNTON, B. S., 1957, Optica Acta 4 , 147. TOLMAN, F. R. and J. G. WOOD,1956, J. Sci. Instr. 3 3 , 236. TSURUTA, T., 1963, Appl. Opt. 2 , 371. UHLIG,M., 1965, Mikroskopie 2 0 , 247. JAMIN,
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VANLIGTEN,R . F. and H. OSTERBERG, 1966, Nature 2 1 1 , 282. WAETZMAN, E., 1912, Ann. Physik (4) 39, 1042. WOLF,E., 1954, Nuovo Cimento 12, 884. WOLF,E., 1955, Proc. Roy. SOC.A 2 3 0 , 246. WOLF,E., 1956, The Coherence Properties of Optical Fields, in: Astronomical Optics and Related Subjects, ed. Z. Kopal (North-Holland Publishing Co., Amsterdam) p. 177. YAMAMOTO, T., 1965, Optica Acta 12, 229. YAMAMOTO, T., 1968, Thbse d’Etat (Paris). ZERNIKE, F., 1938, Physica 5 , 785.
This Page Intentionally Left Blank
VII VISION I N COMMUNICATION BY
L. LEV1 Deflt. of Physics, T h e City College, City UniversitJJof New Y o r k , New Y o r k , N . Y . , U S A
CONTENTS
9
1.
9 3 9 9
2 . BRIGHTNESS FUNCTION
BASIC CONCEPTS . . . . . . . . . . . . . . . .
345
. . . . . . . . . . . .
347
3 . SPATIAL FREQUENCY RESPONSE .
. . . . . . .
351
4.
NOISE I N T H E VISUAL SYSTEM . . . . . . . . .
359
5.
SHAPE O F MTF, LINEARITY AND STATIONARITY
365
ACKNOWLEDGMENTS . . . . . . . . . . . . . . . . .
368
APPENDIX: METHODS O F MEASURING THE MTF O F THE TOTAL VISUAL SYSTEM ABOVE THRESHOLD
368
REFERENCES . . . . . . . . . . . . . . . . . . . . .
370
Q 1. Basic Concepts A communication system” mediates between an input and an output signal, both of which are usually measurable quantities. They may be voltages in an electrical system or luminances in an optical system. In many systems, however, this output is supplied to a human observer making him, strictly speaking, the final stage of the system. It is then impossible to predict over-all performance without consideration of the characteristics of the last stage in the system, the human sensory detection system. This fact often tends to be camouflaged by the intuitive knowledge we have of the human sensory performance; but this is no more than a camouflage, and detailed knowledge of sensory functioning is prerequisite to an optimum design of such a system. It is the purpose of this article to discuss the relevant characteristics of human vision in terms which permit their consideration in communication system analysis. 1 . 1 . PROBLEMS OF PSYCHOPHYSICAL INVESTIGATIONS
The main obstacle to such a discussion is the difficulty of measuring the output, which is the purely subjective sensation of the observer - or his formulation of this sensation. Such measurements, attempting to relate psychological output to physical input, are termed “psychophysical” and techniques developed for them are often severely limited in the absolute accuracy attainable. A number of useful techniques have been developed permitting comparison of sensations and, with due care, meaningful results can often be obtained. We take here as the output the observer’s sensation. In a “detection” situation, this will be his feeling of whether a certain stimulus was present or absent in his field of view. In an “estimation” situation it will be the value of luminance, shape, etc. that the observer ascribes to the stimulus.
* By communication system we refer t o any arrangement which 1s to convey information. When applied t o optics, this excludes, for Instance, images formed for their esthetic values. 345
346
VISION I N COMMUNICATION
[VII.
§ 1
1.2. THE FUNDAMENTAL CHARACTERISTICS
Three major factors determine the performance of any communication system. 1. Relationship of output to input level. This is generally characterized by the transfer characteristic; in the visual system it is called brightness function, because the sensation caused by luminance is called brightness. 2. Frequency dependence. This is called spectral response; in the visual system it will be the modulation transfer function (mtf), defined below. 3. Random effects. Unpredictable effects entering system performance are called noise. In optics spatial noise is frequently called granularity. 1. The transfer characteristic controls primarily the range of input levels over which the system will respond usefully. 2 . The spectral response limits the rate at which information can be transmitted or the rate of signal variation to which the system will respond effectively. I n the usual sequential communication channel, the rate referred to is temporal (bits per unit time). When dealing with spatial images, however, the rate may also be spatial (bits per unit distance, area, or volume). 3. Noise is the factor which controls the ability of the above characteristics to limit system performance. The concept “noise” covers indeterminate additions to the signal, limiting the accuracy and reliability with which the input can be determined from the output or vice versa. In an electrical communication channel, this may be random voltage fluctuations generated thermally in a resistor; in a photograph, it may be the granularity of the emulsion. Always, the presence of noise changes the output in a way which is not predictable. The significance of the unpredictability lies in that, while the degradations due to transfer characteristic and spectral response limitations can usually be fully accounted and compensated for - at least in principle,* this is not true for noise, so that it is ultimately the presence of noise which limits system performance on both counts of input range and frequency. Thus our task is to find these three psychophysical characteristics for the visual system, and in this review one paragraph is devoted to
* Exceptions occur when the slope of the brightness function or the spectral response vanish absolutely. Then limitations exist independent of noise.
VII, §
21
BRIGHTNESS FUNCTION
347
each of them: 5 2 to the brightness function; 9 3 to the modulation transfer function; and 5 4 to the noise characteristics of the visual system; 3 5 is devoted to a discussion of linearity and stationarity considerations. Both temporal and spatial frequency responses are relevant, but only spatial frequencies are treated here. The spatial spectral response may be measured as the ratio of output to input modulation when a sinusoidal luminance pattern is imaged. In this form the spectral response is called modulation transfer function (mtf)*. In this connection, the object modulation is defined in terms of maximum and minimum luminances, LmaXand Lmin,respectively:
M , = Lmax -Lmin Lmax+Lmin
and the image modulation in terms of the corresponding illumination values (Emax and Emin):
The mtf value is, then
T
= MJMo.
In our psychophysical situation, the sensed brightness values, and Bmin,may be substituted for the illumination values. I t is occasionally easier to measure the spatial distribution of the output resulting from a point input. This is called point spread function and, if symmetrical, is related to the mtf by the mathematical process known as the (Fourier-) Bessei transform (WATSON [1962] pp. 453-454, O’NEILL [1963]). When a line source is used, the line spread function is obtained in the image plane. When symmetrical, this is the ordinary Fourier transform of the mtf.
B,,
Q 2. Brightness Function 2.1. PSYCHOPHYSICAL MEASUREMENT TECHNIQUE (GREEN AND SWETS [1966])
Methods for measuring the sensed brightness can be divided into threshold and supra-threshold. In the threshold techniques, the
* The concept of mtf is sometimes restricted t o stationary systems with a linear transfer characteristic, but it may also be defined in the more general terms used here, though its usefulness is somewhat restricted in nonlinear systems.
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stimulus is decreased until it is no longer sensed (or increased until it becomes just noticeable). The stimulus is then said to have its threshold value. We may use this method to find the threshold luminance change (AL) at any luminance level. If we then assume that the sensed brightness difference at the threshold is some fixed value AB, this permits us to build up a brightness curve, a small step at a time, and to investigate such matters as the effect of adaptation and stimulus area on the brightness function (GROSSKOPF [1963]). However, to overcome the highly questionable assumption of a constant AB, suprathreshold methods must be used. The most obvious of these is magnitude estimation (STEVENS [1956]). Here the observer is shown a reference stimulus to which an arbitrary value, say 10, is assigned. He is then shown test stimuli and asked to assign to them values relative to that. Surprisingly, this method yields some useful and relatively consistent results, despite its apparent crudeness. Closely related to it is the method of ratio scaling (EKMAN [1958]), where the observer must bisect the gap between two reference stimuli, or divide it in some other ratio. Interocular comparison is another supra-threshold measuring technique important in studying adaptation and other field effects. This method is based on the observation that the two eyes operate fairly independently, so that adaptation and other field effects in one eye, which may have an important effect on its brightness function, have relatively little effect on the other eye. Some interaction has, however, been noted (see e.g. SAUNDERS [1968]). In summary, the major weakness of the threshold method lies in the assumed constancy of the just noticeable brightness difference, independent of luminance level. This is overcome by the direct estimation methods, but these suffer from large inherent inaccuracies. Another problem common t o all methods is due to the strong dependence of the brightness function on the adaptation level. But, when the spot luminance differs significantly from the background luminance, it must affect the adaptation level, so that it becomes very difficult to obtain a brightness function independent of adaptation level (GROSSKOPF [1963]). Small test spots and short exposures can minimize, but not eliminate, these effects. 2.2. INSTANTANEOUS B R I GHT NES S FUNCTION
Due to the important effects of adaptation, the change in perceived
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brightness with a change in the luminance of the field of view can be measured under two basically different conditions, yielding greatly different results. The instantaneous brightness function is obtained when we measure the perceived brightness change corresponding to a luminance change when the stimulus is presented very briefly, in a manner such that adaptation is not affected. The steady-state brightness function is obtained when the brightness of a uniformly luminous field is measured for various luminances, but always after full adaptation has taken place. The steady-state brightness function thus includes adaptation effects and differs significantly from the instantaneous brightness function. * Classically, the brightness function has been taken to be logarithmic. This “Fechner’s law” was based on Weber’s law - the observation that, in certains regions, the just noticeable difference (jnd) was a fixed fraction of the stimulus luminance. Assuming that the jnd corresponds to a fixed brightness difference, this implies a logarithmic response. This assumption of a logarithmic response seems to be rather arbitrary and has, recently come under severe attacks (STEVENS [ 19611). Magnitude estimation measurements indicate that the instantaneous brightness function has the form (STEVENS and STEVENS[1963]):
B
=
k(L-Lo)B,
(3)
where L is the stimulus luminance and k , Lo and j3 are constants; k is the gain factor of the visual system, Lo may be considered a luminance threshold, and p is a measure of the response non-linearity. For a dark-adapted eye, p = 0.333, Lo = 0. If k is set equal to ten, B is obtained in brils, which are units proposed for brightness (STEVENS and STEVENS [1963]). Plots of j3,Lo and k as functions of adaptation level are shown in Fig. 1. These values were obtained with test targets of 0.1 radians diameter, exhibited for 2 seconds but the results are quite insensitive to changes in target size. A reduction in flash duration to bring it into the region of Bloch’s law (less than about 0.1 seconds), however, does increase the exponent (STEVENS [1966b]). * By dealing only with uniform fields we avoid discussion of the closely related phenomenon of induction which describes the effect of the luminance of one area element on the perceived brightness of another area element, when both are presented simultaneously (STEVENS [1966a]).
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I
0
2
3
Log Adoptotion Level
4
§ f
5
(Log Td)
Fig. 1. “Constants” in the expression for the instantaneous brightness function: and STEVENS[1963].) variation with adaptation. (After STEVENS
2.3. STEADY-STATE BRIGHTNESS FUNCTION
The steady-state brightness function follows an entirely different course - a course which can be approximated by an “automatic gain control” type equation (LEVI[1969]), the gain factor being
B,/(K+Et)
(4a)
kEt = B,Et/(K+E!).
(4b1
=
and the adaptation brightness
B,
=
Equations (4a) and (4b) imply that at very low levels of adaptation illumination, E,, the gain factor is constant (at B,/K) and that at very high levels the sensed adaptation brightness, B,, is constant at B,. The fact that, in the adapted eye, the perceived brightness approaches a fixed value asymptotically, helps explain the phenomenon of “brightness constancy” - objects retaining their apparent brightness, even though the illumination level changes. It also explains Weber’s law very simply: at high luminance levels the gain factor is inversely proportional to Et, and therefore a fixed fractional change in luminance will result in a fixed difference in perceived brightness. If the just noticeable illumination fraction is 6 = AEIE,,
(5)
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then the threshold brightness difference is
which is independent of the actual adaptation luminance level E, .
Q 3. Spatial Frequency Response 3.1. SUBSYSTEMS OF THE VISUAL SYSTEM
The formation of the final perceived image can be analyzed into a number of distinct stages, each of which modifies the image; thus each of these stages could have an mtf associated with it. These stages are 1. The optical media (cornea, lens, etc.), which form an optical image of the viewed object on the retina. 2. The retina, which diffuses the light passing through it on its way to the photoreceptors - the rods and cones. 3. The pattern of photoreceptors, which spatially quantize the image illumination by summing the sensed illumination over small regions. 4. The neural interconnections in the two plexiform layers in the retina, which combine the outputs of the various photoreceptors in various ways before these combinations are fedinto the optic nerve. 5. The optic nerve fibers in the lateral geniculate body in the thalamus portion of the brain, which connect to new fibers leading to the cortex, the outer layer of the brain. 6. The cortex, where the signals arriving via the afferent nerves are translated into a conscious image. Although the point spread function is probably different at each of these stages, it cannot presently be measured except at the output stages (1) and (6). The first stage is usually called the optical subsystem and stages 2-6 the “retina-brain” subsystem of the total visual system. The characteristics of these subsystems have been measured individually and in combination. 3.2. OPTICAL SUBSYSTEM
The mtf of the optical subsystem has been measured extensively by observing the image of a slit as formed on the retina (FLAMANT [1955], WESTHEIMER and CAMPBELL [1962], KRAUSKOPF[1962], ROHLER[1962], CAMPBELLand GUBISCH[1966]). Acting on the light reflected from the retina, the eye media reimage the retinal image
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in the neighborhood of the original slit, and this secondary image can be analyzed photometrically to yield the line spread function corresponding to a double passage through the ocular media. By Fourier transform, this yields the mtf corresponding to a double passage. This, in turn, is the square of the single-passage mtf of the ocular media - assuming perfectly diffuse reflection at the retina. This assumption has been confirmed by careful measurements (CAMPBELL and GUBISCH [1966]) and contradicted by others (ROHLERet al. [1969]). The mtf has also been measured by this method, using a sinusoidal object luminance (WESTHEIMER [1963]). The mtf of the optical subsystem can be considered as consisting of two factors - diffraction effects and aberrations. Diffraction effects of a circular aperture produce an mtf of the form:
where
y
= Afv/D
A is the wavelength of the light used, f is the effective focal length of the eye, Y is the spatial frequency, and D is the pupil diameter. It implies that there can be no image modulation for v > vo where * vo = D/Af m 1130, cycles/mm
(9)
and D, is the apparent pupil diameter in mm. Aberrations in the eye's optical system lower the mtf below the value given by eq. (7) (WESTHEIMER 1119831). This effect is quite small when the pupil diameter is below 2 mm and increases in significance as the pupil diameter increases. Thus, instead of increasing continually with pupil diameter, as implied by eq. ( 7 ) , the mtf begins to decrease beyond a pupil diameter of about 2.4 mm (CAMPBELLand GUBISCH [1966]). * This estimate is based on Gullstrands schematic eye (SOUTHALL [1937] pp. 56-59), which places the iris about 21 mm from the fundus. Data given there for the lens imply that this enlarges the pupil about 5%. On the other hand, the corneal curvature enlarges the pupil diameter by about 6.5%. The value of v,, in the text is based on 0 . 5 5 5 ~ light and a refractive index of 1.336 for the image space.
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A representative set of curves, obtained with white light from a high-pressure mercury lamp is shown in Fig. 2.
Pupil Diameters
+ 2mm A
3mm 3.8mm 4.9mm 5.8mm 6.6mm
LL
IE
0
50 Ret.
Spatial
100 150 Freq. (cycles/mm)
200
Fig. 2. Mtf of eye optics for various pupil diameters. (From CAMPBELL and GUBISCH[1966].)
In addition to the techniques just described, more direct measurements have been made using excised steers’ and pigs’ eyes (ROHLER [1962], DE MOTT [1959]). These showed poorer results, but would not seem to be immediately applicable to a live, human eye. Another method (ARNULF and DUPUY[1960]) used to measure the mtf of the optical portion employs an ingenious technique to form on the retina a sinusoidal pattern of known modulation. Using a splitfield technique, the observer views a sinusoidal target of unity modulation, restricted to one half of his field of view. The other half is covered by a sinusoidal pattern formed directly on his retina. This latter pattern is adjustable to match the modulation of the former. When a match is established, the known modulation of the pattern will give directly the mtf of the optical portion. This adjustable pattern may be formed as follows (ARNULFand DUPUY[ 19601, BERGER-L’HEUREUX-ROBARDEY [ 19651, WESTHEIMER [ 19601, CAMPBELL[ 19681). A pair of narrow, parallel strips of coherent, monochromatic light is imaged in the pupil. This results in the appearance of regularlyspaced (Young’s) interference fringes on the retina of the observer.
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The fringe spacing is controlled by the spacing of the strips and, at any one spacing, the contrast is adjusted until a match is obtained. The contrast may be varied by changing the amount of flux entering through one strip relative to that through the other (e.g. by shortening one slit) or by adding a controlled amount of incoherent light to the incident radiation. Extensive results obtained with this method have been published (BERGER-L’HEUREUX-ROBARDEY [19651). 3.3. RETINA-BRAIN PORTION
The method just described has also been used to find, indirectly, the mtf (TRB) of the retina-brain portion. On the assumption that, at threshold, the sensed modulation has some fixed value ( K ) ,independent of spatial frequency, we need measure only the values of the modulation on the retina (M,(v)) at threshold at various spatial frequencies. Clearly K = M,(v)T,,(v), and hence, M,(v) = K/ T RB ( v ) T&. This technique has indeed been used (WESTHEIMER [1960], CAMPBELLand GREEN [1965], CAMPBELL[1968]). Representative results for the retina-brain portion are shown in Fig. N
100
-
L
.s c
-a 0
-0
0
5
210
-
r 0
e t, r
I
3.4. TOTAL VISUAL SYSTEM
The mtf of the total visual system may be obtained as the product: of the mtf’s of the subsystems just discussed. On the other hand, a
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variety of methods have been used to measure the mtf of the total visual system directly. Here again the most popular method seems to be threshold measurements. A sinusoidal luminance variation at some fixed spatial frequency is presented to the observer and the modulation is reduced until it is no longer detectable. The required luminance patterns have been obtained by modulating a crt raster (CAMPBELL[1968], SCHADE [1956], PATEL[1966]), by generating an interference pattern (ARNULF and DUPUY[1960], BERGER-L'HEUREUX-ROBARDEY [1965]), by means and of photographic transparencies (ROSENBRUCH [1959], DE PALMA LOWRY[1962], VAN NES and BOUMAN [1967], FRY[1969]), and by using the moir6 effect (MENZEL [1959]). Three supra-threshold methods have been used to obtain the visual mtf. Two of these use split-field photometry; that is, the region whose luminance is to be measured (the test pattern) is placed adjacent to a region of controllable and known luminance, and the luminance of the latter is adjusted until it appears to match the test pattern luminance. This technique has been used to measure the mft of the visual system directly (BRYNGDAHL [1964, 19661) and also to measure its step-function response (LOWRYand DE PALMA [1961]), which, upon differentiation and subsequent Fourier transform, yields the line spread function and the mtf, respectively. (Cf. also MENZEL [1959].)
1.0 -
0.5 -
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The third method (DAVIDSON [1968], WATANABE et al. [1968]) is more direct and similar to the magnitude estimation method. It is based on an observer rating the relative contrast of two sinusoidal patterns of different spatial frequencies. Results for the split-field method a t high luminance (BRYNGDAHL [1966]) are shown in Fig. 4. These methods are described in more detail in Appendix 1; some of their shortcomings, too, are described there. 3.5. COMPARISON O F RESULTS
The mtf’s for the two fractions of the visual system can be combined and compared with those found for the total visual system. Such a comparison does not seem to have been made. * It is not attempted here in view of the large discrepancies between the data obtained by the various workers for the total visual system. These discrepancies make such a comparison too uncertain to be of much value. I n attempting to compare the results published by the numerous investigators, it must be noted that many factors affect the performance of the visual system in general (in addition to the special factors associated with threshold measurements). Among these are pupil diameter, the state of accommodation, and retinal illumination and adaptation level. The effect of pupil diameter must, a t least in part, be due to the changed optical mtf - a reduction in the amount of longitudinal spherical aberration, and in the effect of both this and chromatic aberration, with reduction in pupil diameter. The effect of accommodation, too, has been investigated (SCHOBERand HILZ [1965]): a significant deterioration of the performance has been noted as the eye accommodates to shorter viewing distances. This may be due to increased aberrations contributed by the eye’s lens, whose anterior curvature increases significantly with such accommodation. The effect of the retinal illumination level on the mtf is less obvious. We would, of course, expect this level to affect the mtf via the noise level for those data which were obtained by the threshold method. On the other hand, if this noise has a generally uniform spectrum, the * One author evaluated the optical portion directly (CAMPBELL and GUBISCH [1966]) and also as the ratio between the mtf’s obtained for the total system and for the retina-brain portion (CAMPBELL[1968]). However, a comparison of these was not included and, indeed, the discrepancies seem quite large, especially a t the higher spatial frequencies.
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detected noise should have a spectrum matching the visual mtf - at all levels. The change in noise level should, therefore, affect the level of the threshold but not its relative spectral pattern. The effect of the illumination level on the mtf shape as measured by supra-threshold methods is even more difficult to explain. These variations imply that the visual spread function changes, perhaps in a manner analogous to changes in the spectral sensitivity curve, in the Purkinje effect (SOUTHALL [1937] pp. 274-275), which is explained in terms of a gradual transfer from rod t o cone vision with increasing illumination. In 9 5 it is shown that a major part of these changes may be due to the non-linearity in effects responsible for the shape of the mtf. On the whole, data of visual system mtf published agree qualitatively: at low spatial frequencies the mtf rises with increasing frequency until a maximum is attained; as the spatial frequency increases further, the mtf levels off and begins to drop. * (Some workers report a secondary maximum beyond the primary peak (PATEL[1966], LOWRYand DE PALMA [1961].) At still higher frequencies, the mtf drops at an approximately exponential rate. Quantitatively, however, agreement between the various measurements is extremely poor, even though these can be compared only on a relative scale; each is known only within a proportionality factor which can be chosen independently for each set of data. Even the choice of a reference point, where all the curves could be made to agree, is not obvious. The techniques of two authors (MENZEL [1959], BRYNGDAHL [1964, 19661) ensure that the mtf at zero spatial frequency is unity. The data of other workers cannot, however, be extrapolated reliably to zero frequency, and this can therefore not be used as a reference point. Another reasonable choice of reference point would seem to be the mtf peak. But even the location of the peak varies widely among the reports. Indeed, rather than treating it as a reference point, the location of the peak may be used as an index for illustrating the extent of the discrepancies. Figure 5 shows the spatial frequency at the mtf peak, as a function of the mean retinal illurnination, as reported by nine different workers. Only those who reported results with sinusoidal, rather than “square* I t has been stated (LOWRY and DE PALMA [196l], RONCHIand VAN NES [1966]) that some observers (WESTNEIMER [1960], ROSENBRUCH [1959]) have failed t o confirm the existence of a peak away from the origin. These statements are irrelevant, however, since the observers cited did not investigate the low spatial frequencies a t which the low-frequency depression occurs.
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wave” test patterns, are included. Dependence on retinal illumination was used as the independent variable, because this dependence seems t o have been investigated more fully than dependence on pupil diameter and accommodation. The values of these latter parameters, for each plot, are listed in the box insert in the figure. To note the magnitude of the inconsistencies, compare, for instance, the results of PATEL [1966] with those of VANNES and BOUMAN [1967] obtained under almost identical conditions and yet differing by a factor of almost two over most of the range. An extreme discrepancy appears when the results of SCHADE [1956] are compared with those of BRYNGDAHL [1964]; they differ by a factor of four throughout and at low light levels by a factor of eight. c
pupil Ref. diam
E E
a
view dist
-a
0 0 a
-01 0.2
0.5
I
2
5 10 20 50 100 200 05k Ik Retinal Illumination (Td)
2k
5k IOk
Fig. 5. Location of the peak of the visual mtf as a function of mean retinal illumination, as reported by a number of workers. Pupil diameters and viewing distances used are listed in the insert. 1. SCHADE[1956], 2. PATEL [1966], 3. VAN NES and BOUMAN [1967], 4. BRYNGDAHL [1964, 19661, 5. DE PALMA and LOWRY[1962], 6. LOWRY and DE PALMA [1961], 7. CAMPBELL[1968], 8. DAVIDSON[1968], 9. FRY[1969].
Such discrepancies are unusual even for psychophysical measurements, especially in view of the obviously great care taken in obtaining the data. Undoubtedly, part of the explanation lies in the great variations between individuals - but the available data do not indicate that such variations can account completely for the discrepancies. Perhaps there are other variables, not yet considered, which influence
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the results so drastically, and a search for such variables would seem to be in order. One factor, the orientation of the test pattern, has already been shown to affect the threshold. Visual sensitivity is highest for vertical and horizontal lines and significantly lower for lines at 45” to these (WATANABE et al. [1968]).
5 4.
Noise in the Visual System
The third fundamental characteristic of the visual system is its noise. We recall that this includes any factor which causes an unpredictable deviation of the detected value from the actual one. This includes not only measurable physiological quantities, such as spurious neural pulses, but also random factors occurring at the higher, cortical level. Thus we might say that noise varies inversely with attention and that the experience of an observer in an experiment reduces the noise level in his visual system, for the particular task involved in that experiment. 4.1. T H R E S H O L D MEASUREMENTS
Since the observer does not sense this noise directly, we must use indirect methods for evaluating it. Although estimation experiments could be used to determine noise levels, detection experiments, determining the threshold signal levels, are easier to apply. In its simplest form, this approach equates the just noticeable difference (jnd) with the noise level as mapped into the stimulus domain. Much work has been done to establish the luminance jnd. The results of one major investigation (BLACKWELL [1946]) covering the threshold contrast, C, for circular discs over a large range of illumination levels is shown in Fig. 6. Contrast is defined as C = AE/E (10) where E is the retinal illumination due to the background and A E is an illumination increment. For threshold contrast, A E is the just noticeable increase in illumination. The retinal illumination is given in troland. * These data correspond to a 50 yo detection probability.
* The illumination in troland is the object luminance (in cd/m2)multiplied by the pupil area (in mmz). The original report presented the data in terms of luminance. Published data (DE GROOTand GEBHARD[1952]) concerning pupil diameter were used t o convert to retinal “illumination”. The troland is popularly referred to as a unit of illumination, though, dimensionally, it is a unit of intensity and represents the intensity at the observer’s pupil.
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-4
-3
-I 0 I Log Retinal Illumination
-2
2
3
4
4
( Log Td)
Fig. 6. Threshold contrast for uniformly luminous circular discs of various diameters, as a function of retinal illumination. (From BLACKWELL [1964].)
The absolute thresholds, i.e. the illumination required for detection against an absolutely dark background, are listed in Table 1. TABLE1 Retinal illumination at absolute threshold Target diameter (minutes of arc)
3.6 9.68 18.2 55.2 121
Illumination
77.6 9.42 3.66 0.518 0.210
The fact that the threshold contrast varies significantly with luminance level and target size demonstrates that no single number can describe the noise characteristics in any useful way. If the target had not been circular, or not been uniform, what would the threshold contrast have been? What is the threshold contrast for 99% detection probability? To answer such questions, the spatial spectrum of the noise and its dependence on the luminance level must be investigated,
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and it is not enough to obtain an “effective” noise level - the distribution of noise levels must be determined. Once all this is known, we can calculate the detection probability for any target assuming an optimum detection strategy - or any other specific detection strategy. But, what strategy does the visual system use? Clearly, much more must be known about the higher-level functioning of vision before detailed noise characteristics can be extracted from threshold data. It is therefore with a severely limited amount of experimental data that we approach the investigation of noise characteristics. 4.2. N O I S E SOURCES A N D LUMINANCE D E P E N D E N C E
On the basis of physical theory, we must ascribe to the visual system at least three noise sources. 1. Detector noise
By whatever mechanism the eye converts radiation into a neural impulse, we must expect this mechanism to operate occasionally even in the absence of incident radiation, and, the more sensitive the detector, the more likely it is to be triggered spontaneously. This prediction has been confirmed experimentally and the effect has been called “dark light” (RUSHTON [1963]), l z o . 2 . Sensation and neural noise
At the other end of the neural pathway, we must expect spontaneous stimulation of sensation, even in the absence of neural activity in the optic nerve - the process which translates neural impulses into sensation must be expected to take place occasionally even in the absence of neural impulses (LEVI [1969]), resulting in sensation noise, n s . In addition to this “sensation noise” spurious pulses must be expected to occur at all neural terminals, such as in the plexiform layers in the retina and in the lateral geniculate body. We shall not discuss these further, however, because at the present state of knowledge they may be treated together with either of the preceding two noise sources. 3. Radiation noise In addition to the noise sources internal to the visual system, there is noise superimposed on the entering radiation at the time it enters the eye. This noise is due to the quantum nature of light the fact that light arrives in individual quanta. This noise has
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been analyzed most extensively and is often referred to as “quantum noise” (SCHADE[1956], ROSE[1957], BOUMAN [1961], MORGAN [1965]).
These three types of noise differ significantly in their dependence on luminance level. The sensation noise may be expected to remain constant -independent of luminance. The other noise terms are affected by the “gain” of the visual system. Since the gain factor ( k in eq. (3)) depends strongly on the adaptation level and, therefore, on the retinal illumination, these terms, too, must be expected to vary with illumination. In addition, whereas the detector noise should remain constant, the radiation noise varies directly with the square root of the illumination, as shown by statistical considerations. Thus there are at least three terms in the description of the illumination - dependence of noise, N y , in the sensation domain:
N y ( E ) = k(E)n,B+k(E)(adE)B+n,, (11) where a is a constant and no, n, are the noise levels defined above. We drop the Lo-term in eq. (3), because it is negligible when operating near the adaptation luminance level. It is usually more convenient t o express the dependence in the stimulus domain, and this is readily written by dividing each term by k and raising it to the 8-l power: N,(E) = n,+adE+“,/k(E)I1/fi. (12) If we substitute for k its value as given in eq. (4),we find, finally:
In the limits, then, we have for the illumination-to-noise ratio:
E - N
E/cl
for E << K1lB,(.n,/a)2
Ns ( E l and
E lim -E+W N,(E)
c2,
where c1 = n,+[n,K/Bo]l’B
and
c,
=
(B0/n,)l/fi
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are constants. In the intermediate range, the middle term of eq. (13) seems to control (ROSE[1957], BOUMAN [1961], MORGAN[1965]):
EIN, m 1/Ela.
(15)
4.3. SPATIAL SPECTRUM O F NOISE
No data concerning the spatial spectrum of noise in the visual system seem, as yet, to have been published. The following approach could, in principle, be used to find it. In the threshold method of finding the visual mtf (T,), it is taken to be proportional to the reciprocal of the modulation ( M )at threshold. This is based on the assumption of a fixed signal-to-noise ratio (p) at threshold: P = M(y)Tv(y)/n
and hence
M-l(v) = T,(v)/pn. This is proportional to T,(v) if the noise n, too, is fixed. If n varies with frequency, however, the frequency dependent quantity which is found, will be
T X y ) = Tv(.)/n(v).
(17)
(Here we have assumed that only the portion of the noise in the neighborhood of Y is effective in masking the signal; the other portions of the noise can, presumably, be filtered out.) On the other hand, the supra-threshold methods do yield T,(v). Thus we can find the noise spectrum from
4.) = T&)/T:(V),
(18)
the ratio of the mtf values obtained by the two methods. Unfortunately, the various results published for both T , and T$ are so inconsistent, that no meaningful ratio could be taken. 4.4. AMPLITUDE DISTRIBUTION O F NOISE
Since visual noise levels are not directly accessible to measurement, indirect methods must be used to find them. The principle underlying one method is illustrated in Fig. 7, which depicts the statistics of an experiment in which the observer is to decide whether luminance L A or LB was presented. The perceived brightness values B, and BB corresponding to these are determined by the brightness function and
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are marked on the abscissae-axis. Because of the random fluctuations in the visual system, B, and B, represent only mean values of the perceived brightness. The value of the brightness actually perceived will deviate from B, and B, with a probability density shown by the
BI
BA Bo BB Bz Brightness
Fig. 7. Detection probabilities with hypothetical noise distribution.
hypothetical bell-shaped curves. The solid curve represents the probability density when luminance L , is viewed and the broken curve the probability density when luminance L , is viewed. The range of abscissae B , t o B,, which spans the region of overlap, represents, then, the range of observed brightness which will leave the observer in doubt as t o which luminance was viewed. If the observer is forced to make a decision, his method may be presumed * to involve the choice of a partition point, B, ; if the observed brightness is less than B,, he will decide for L,, otherwise for L,. The exact choice of B, can be shown to be influenced by the relative frequency of L , and L , and by the rewards and penalties involved in making the right and wrong decisions (GREENand SWETS[1966]). In any event, the shaded area represents the error probability when in fact L A is viewed and the crosshatched area when L , is viewed. With a fixed L A , as L , is increased, the region of overlap will shrink at a rate determined by the shape of the curves. Thus it should be possible to determine the form of the bell-shaped curves by compiling statistics of the error rates for variously spaced L, and L,. In practice, the determination of the probability densities is hindered by the very large number of detection-decisions that must be made before the * His partition point itself could be presumed to be randomly distributed around a mean value, such as B,, but we shall not consider this more complicated assumption here.
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shape of the curves can be determined with any degree of certainty. One effort along this line (BLACKWELL [1953]) failed to find a clearcut decision on whether the noise or itslogarithm is normally distributed. 4.5. NOISE ON THE OBJECT
When the object enters the visual system already masked by noise, the detection problem must be treated on a system basis. Such investigations have been made (MORGAN[1965], COLTMANand ANDERSON [1960]) but are outside the scope of the present review.
5 5.
Shape of MTF, Linearity and Stationarity
5.1. LINEARITY O F BRIGHTNESS FUNCTION
Fourier transform and, therefore, the concept of mtf will lead to useful results only in systems that are linear, or almost so. If the mtf depends on the amplitude of the signal, the response at any spatial frequency will be influenced by the signal level at other frequencies and by their relative phases. In the visual system it has been found that the brightness function obeys a power law with an exponent, @ (0.33 < @ < 0.5). It is therefore quite non-linear. For very small modulations, however, we may approximate the brightness variations by @ times the illumination variations so that the techniques of linear systems can be used for such limited modulation amplitudes (DAVIDSON [1968], WATANABE et al. [1968]). Note that these non-linearities will not show up in split-field measurements. The test field and the comparison field are affected equally by the non-linearity; the comparison is made in the sensation domain and the measurements of both in the stimulus domain. The only mtf measurements which could, in principle, reveal this nonlinearity are those based on direct magnitude estimation (DAVIDSON [1968], WATANABE et al. [1968]), and these, as mentioned, suffer from such a great scatter that it is difficult to derive absolute modulation values from them. 5 . 2 . SHAPE O F THE VISUAL M T F
Besides the brightness function, the main determinants of the mtf are the area effects - brightness sensation at one point due to illumination at another. Their linearity, too, must be investigated. As a first step, these area effects themselves must be identified and we attempt this on the basis of the mtf shape.
366
VISION IN COMMUNICATION
[VIL
9 5
The mtf of ordinary passive optical systems must have its maximum value at the origin (V = 0 ) . If the mtf at any other spatial frequency (v # 0 ) exceeds that at the origin, this implies a spread function which is negative in some regions. * This, in turn, implies a negative illumination which is impossible with “passive” systems. The observation of a maximum away from the origin therefore implies a negative, or inhibitory effect in the visual system. Specifically, it seems to point to an effect whereby any stimulated element radiates a far-reaching inhibitory influence into its environment (SCHADE[1956], DE PALMA and LOWRY[1962], FRY[1969]), in addition to a short-range positive spread due, perhaps, to scattering [1967]). Ator similar effects in the retina (VANNES and BOUMAN tempts at fitting such two-term spread functions to the observed effects have been made in terms of two Gaussian functions (SCHADE [1956]) and using an exponentially decaying curve in analogy t o the scattering in photographic emulsions (VANNES and BOUMAN [1967]). 5.3. NON-LINEARITIES O F AREA EFFECTS
When considering a hypothesis of a spread function which is negative over part of its range, the question immediately arises: has anyone actually observed a negative brightness all by itself? Is there a sensation of “blacker than black”? In the absence of reports of such a sensation, we must assume that the inhibitory mechanism is just that, that it can only inhibit existing stimulation but not produce negative stimulation in isolation. This implies a saturation effect in the inhibitory mechanism - its effectiveness drops in low luminance regions. Such a saturation effect can be observed in the asymmetry of the Mach-bands (MARIMONT [1963]) and in the appearance of sinusoidal luminance patterns (BRYNGDAHL [ 1966]), to be discussed in more detail below. The non-linearity just considered is an “effect non-linearity” since it is controlled by the illumination level at the effect site. There is evidence also of “cause non-linearity” controlled by the illumination a t the cause site or by the adaptation level.** It seems that the in-
* Since the mtf is (the absolute value of) the Fourier transform of the line spread function, L ( x ) ,this implies :I J-L(x)exp(i2nvx)dxl > I JL(x)dxl. The triangle inequality shows that this is impossible with L ( x ) real and positive: IJL(x)exp(i2nvx)dxl5 J IL. (x)exp (i2nvx)Idx = S L ( x )lexp (i2nvx)Idx SL (x)dx. ** These have been called “finite-spread’’ non-linearities in contrast to the “zerospread” non-linearities treated in the preceding section (INGELSTAM [1965]).
VII,
s
51
367
SHAPE O F MTF, LINEARITY A N D STATIONARITY
hibitory effect grows super-linearly with the illumination at the point causing the inhibition or with the adaptation level. The inhibitory effect seems to decrease with mean illumination to such a degree that one worker (PATEL[1966]) has found the low-frequency depression of the mtf t o disappear entirely at 3 Td. Such a non-linearity would also account for the broadening of the low-frequency depression as the luminance rises, as reported by many who have studied the effects of mean luminance on mtf, regardless of the method used (SCHADE [1956], PATEL[1966], DE PALMA and LOWRY[1962], VAN NES and BOUMAN [1967], BRYNGDAHL [1966]). In Fig. 5 this finds expression in an upward shift of the peak frequency with rising luminance. Only one worker (BRYNGDAHL [1966]) seems to have reported separate brightness data for peaks and troughs of sinusoidal test patterns, permitting a more detailed study of non-linearities. He shows the apparent luminance of peaks and troughs as a function of modulation; one typical example is reproduced in Fig. 8.
0.25
0.5 Modulation
0.75
I.o
Fig. 8. Apparent (solid lines) and actual (broken lines) peak and trough luminance in a sinusoidal test pattern of 15 cycles/mm on the retina. (From BRYNGDAHL [1966].)
At photopic brightness levels, the curves for the apparent troughluminance show a descent rate which is much higher than that for the actual trough-luminance (shown in a broken line in Fig. 8). But when the modulation exceeds about 0.3, the descent begins to slow down progressively. (For modulations of 0.5 and larger, the apparent trough luminance remains almost constant - a t zero.) This is the behavior expected on the basis of the earlier hypothesis of “effect
368
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[VII,
APP.
sub-linearity”. The initial high descent rate is simply a manifestation of the inhibition effect due to the neighboring luminance peaks, as these become more and more pronounced. The subsequent flattening is the result of the saturation effect. The super-linearity of the apparent peak-luminance is less obvious. It may be explained, however, on considering the effect of the comparison field on adaptation. When this field is less luminous than the test pattern, as it is during trough measurements, it will not have much effect on adaptation. When it is brighter, however, as it is during peak measurements, it will affect adaptation significantly (STEVENS [1966]) and, hence, enhance the inhibition effect and, with it, the apparent relative peak luminance, due to the “cause super-linearity’’ hypothesized earlier. 5.4. STATIONARITY, HOMOGENEITY, OR ISOPLANATISM
Fourier transform analysis is applicable only if the system characteristics are spatially constant. Clearly, if the mtf changes in the distance covered by one signal cycle, it cannot be very meaningful to speak of an mtf. I n vision this may mean that such analysis must always be restricted to rather small area elements. If this restriction is observed, however, the mtf concept can still be very useful (DAVIDSON [1968]). This requirement, for mtf invariant with location, is analogous to the stationarity requirement in statistical analyses. It has also been called homogeneity (DAVIDSON[ 19681) and isoplanatism (BORNand WOLF[1965]).
Acknowledgments The work for this review was supported by the Office of Naval Research. The encouragement by Dr. G. C. Tolhurst, Chief, Physiological Psychology Branch, ONR, and Prof. H. Lustig, Chairman, Dpt. of Physics, City College, is gratefully acknowledged. APPENDIX
Methods of Measuring the MTF of the Total Visual System above Threshold Three methods of measuring the visual mtf above threshold were mentioned. Here these are described in some more detaii.
VII, APP.]
M E T H O D S O F MEASURING THE M T F
369
In the first method (BRYNGDAHL [1964, 19661) the field is split down the middle. In one half of the field the observer sees a sinusoidally varying luminance pattern and in the other half a uniformly illuminated field. The observer then adjusts the luminance of the uniform field until it matches the peaks of the sinusoidal luminance pattern, and the known luminance Lo,,, of the uniform field is recorded. This is then repeated for a match to the troughs, yielding the minimum apprehended luminance equivalent (Lomin). These methods yield the luminance-equivalent perceived modulation:
Mo
= (Lomax--lomin)/(Lomax+Lomin).
When this is compared with the objectively measured modulation, M , in the test pattern, the value of the luminance-equivalent mtf at that frequency is obtained: T(Y) =
M,/M,
where the modulation
are, respectively, the actual luminances at the peaks and LmaX,L, and troughs of the test pattern. In the other split field approach the observed luminance variations are measured across an edge which, objectively, represents a rapid transition from light to dark. When such a transition is viewed, an “overshoot” phenomenon is observed, i.e. an even lighter band appears in the light region near the transition and an even darker band in the dark region. These bands are referred to as Mach bands (GRAHAM [ 19651). Such resulting apparent luminances were measured by means of a controllable comparison field and the results of these measurements yield the integral of the line spread function of the visual system. The Fourier transforms were found for the derivatives of both the apparent and the actual luminance functions. Their ratio yields the mtf (LOWRY and DE PALMA [1961]). In the direct method, two sinusoidal patterns are presented t o the observer successively, and he is asked to indicate which has the greater modulation. One of these is at the “standard” spatial frequency, which is picked arbitrarily, and the other is at the frequency at which the mtf is to be found. This method yields, then, the mtf relative to that at the “standard” frequency (DAVIDSON [1968], WATANABE et al. [ 19681).
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I n this context a brief criticism of the various techniques may be appropriate. The threshold techniques suffer from a weakness analogous to the one mentioned in connection with the brightness function. In these techniques, the actual quantity measured is the threshold contrast. The reciprocal of this contrast - as a function of spatial frequency is then taken to be identical with the mtf, within a proportionality factor. This conclusion is based on the tacit assumption that the “noise” in the visual system affects the detection of all spatial frequencies equally. The validity of this assumption is the subject of Section 4.3. In the supra-threshold split-field methods, luminance is compared to luminance so that the non-linearities of the brightness function (Section 2 . 2 ) are canceled out of the results. Therefore we should not expect the mtf-values obtained to correspond to the perceived brightness mtf. (For small modulations, the perceived brightness mtf should be /Itimes the measured luminance mtf.) I n the split-field method employing the sinusoidal pattern, the experiment is clearly set up so that it must yield unity mtf at the origin (v = 0 ) , so that the absolute values of the mtf obtained there have no physical significance. Thus, the modulation “enhancement” apparent at intermediate frequencies may not be an enhancement in the absolute sense. In view of the heavy dependence of mtf on adaptation level (cf. Fig. 5 ) , the major weakness of this method would seem to be its interference with adaptation. Changes in adaptation level, as measurements are made, would seem to be inevitable and this, in turn, must distort the results obtained. This is discussed further in Section 5.3.
The supra-threshold method in which modulations at different frequencies are compared successively would seem to suffer from the same weakness as the magnitude estimation methods - inherent inaccuracies and large scatter.
References AKNULF,A. and 0. DUPUY,1960, Compt. Rend. Acad. Sci. Paris 2 5 0 , 2757. BERGER-L’HEUREUX-ROBARDEY, S., 1965, Rev. Opt. 4 4 , 294. BLACKWELL, H. R., 1946, J . Opt. SOC.Am. 36, 624. BLACKWELL, H. R., 1953, J. Opt. SOC.Am. 43,456. BORN, M. and E. WOLF,1965, Principles of Optics, 3rd ed. (Pergamon, London) p. 482.
VII]
REFERENCES
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BOUMAN, M. A., 1961, History and Present Status of Quantum Theory in Vision, in: Sensory Communication, ed. W. A. Rosenblith (MIT, Cambridge) p. 377. BRYNGDAHL, O., 1964, J. Opt. Soc. Am. 5 4 , 1152. BRYNGDAHL, O . , 1966, J . Opt. Soc. Am. 5 6 , 811. CAMPBELL, F. W., 1968, Proc. I E E E 5 6 , 1009. CAMPBELL, F. W. and D. G. GREEN,1965, J. Physiol. 1 8 1 , 576. CAMPBELL,F. W. and R. W. GUBISCH,1966, J. Physiol. 1 8 6 , 558. COLTMAN,J . W. and A. E. ANDERSON, 1960, I.E.E.E. Proc. 4 8 , 858. DAVIDSON, M., 1968, J. Opt. Soc. Am. 5 8 , 1300. DE GROOT,S.G. and J. W. GEBHARD, 1952, J . Opt. SOC.Am. 4 2 , 492. DEMOTT,D. W., 1959, J . Opt. SOC.Am. 4 9 , 571. DEPALMA, J. J . a n d E . M. LOWRY, 1962, J . Opt. SOC.Am. 5 2 , 328. EKMAN, G., 1958, J . Psychol. 4 5 , 287. FLAIMANT, F., 1955, Rev. d’Opt. 3 4 , 433. FRY, G. A , , 1969, J . Opt. SOC.Am., 5 9 , 610. GRAHAM, C. H., 1965, Vision and Visual Perception (Wiley, New York) p. 549. GREEN,D. M. and J . A. SWETS, 1966, Signal Detection Theory and Psychophysics (Wiley, New York) Ch. 4. H., 1963, Vision Res. 3 , 457. GROSSKOPF, INGELSTAM, E., 1965, Japan J. Appl. Phys. 4, Suppl. 1, 15. KRAUSKOPF, J., 1962, J . Opt. SOC.Am. 5 2 , 1046. LEVI,L., 1969, Nature 2 2 3 , 396. LOWRY, E. M. and J . J . DE PALMA, 1961, J . Opt. SOC.Am. 5 1 , 740. MARIMONT, R. B., 1963, J . Opt. Soc. Am. 5 3 , 400. MENZEL,E., 1959, Naturwissenschaften 4 6 , 316. MORGAN, R. H., 1965, Am. J. Roentgenol. Radium Therapy Nucl. Med. 9 3 , 982. O’NEILL,E. L., 1963, Introduction to Statistical Optics ( Addison-Wesley, Reading, Mass.) Appendix A-3. PATEL, A. S.,1966, J . Opt. SOC.Am. 5 6 , 689. ROHLER,R., 1962, Vision Res. 2 , 391. ROHLER,R., U. MILLERand M. ABERL,1969, Vision Res. 9, 407. RONCHI,L. and F. L. VANNES, 1966, Atti Fond. Giorgio Ronchi Contrib. 1st. Nazl. Ottica 2 1 , 218. ROSE,A , , 1967, Advan. Biol. Med. Phys. 5 , 211. ROSENBRUCH, I<. J . , 1959, Optik 1 6 , 135. RUSHTON, W. A. H., 1963, J . Opt. Soc. Am. 5 3 , 104. SAUNUERS, J . E., 1968, Vision Res. 8, 451. SCHADE Sr., 0. H., 1956, J . Opt. Sot. Am. 4 6 , 721. SCHOBER, H. A. W. and R . HILZ, 1965, J . Opt. Soc. Am. 5 5 , 1086. SOUTHALL, J. P., 1937, Physiological Optics (Oxford; Dover, New York 1961). STEVENS, J . C. and S.S. STEVENS, 1963, J. Opt. SOC.Am. 5 3 , 375. STEVENS, S. S., 1956, Am. J. Psychol. 6 9 , 1 . STEVENS,S.S.,1961, Science 1 3 3 , 80. STEVENS, S . S., 1966a, J . Acoust. SOC.Am. 3 9 , 725. STEVENS, S. S., 1966b, Perception and Psychophys. I , 96. VANNES, F. L. and M. A. BOUMAN, 1967, J . Opt. Soc. Am. 5 7 , 401. WATANABE, A,, T. MORI,S.NAGATA and K . HIWATASHI, 1968, Vision Res. 8, 1245.
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WATSON, G. N., 1962, A Treatise on the Theory of Bessel Functions, 2nd ed. (Cambridge University Press, London). WESTHEIMER, G., 1960, J. Physiol. 1 5 2 , 67. WESTHEIMER, G., 1963, J. Opt. SOC.Am. 53, 86. WESTHEIMER, G. and F. W. CAMPBELL,1962, J. Opt. SOC.Am. 52, 1040.
VIII
THEORY O F PHOTOELECTRON COUNTING * BY
C. L. MEHTA University of Rochester, Rochester, N . Y . , U S A
*
Work supported by the U.S. Army Research Office (Durham).
CONTENTS
3
1.
INTRODUCTION . . . . . . . . . . . . . . . . .
375
9 2 . PHOTOELECTRON COUNTING FORMULA . . . . 377 9 3. INTENSITY FLUCTUATIONS . . . . . . . . . . . 4 . PHOTOCOUNTING DISTRIBUTION .
384
. . . . . . .
399
9
5.
DEAD TIME EFFECTS . . . . . . . . . . . . . .
411
9 3 9
6.
MULTIPLE CORRELATIONS . . . . . . . . . . .
418
7.
INVERSION PROBLEM . . . . . . . . . . . . .
423
8. TWO PHOTON ABSORPTION
. . . . . . . . . .
429
APPENDIX A . SOME PROPERTIES OF COMPLEX GAUSSIAN DISTRIBUTIONS . . . . . . . . . . . . .
431
A P P E N D I X B . SOLUTION O F AN INTEGRAL EQUA434 TION . . . . . . . . . . . . . . . . . . . . . . REFERENCES . . . . . . . . . . . . . . . . .
. . . 437
5 1.
Introduction
Fluctuations of light beams have been, for a long time, the subject of extensive investigation. Since the work of EINSTEIN [1909a, b] on fluctuations of blackbody radiation, several workers (EINSTEIN and HOPF [1910]; SMEKAL[1926]; BOTHE [1927]; FURTH[1928a, b]; MANDEL [1958]; WOLF [1960]; BBDARD[1966a]; GLAUBER[1966]; JAKEMAN and PIKE[1968]) have studied the radiation fluctuations in light beams of arbitrary spectral profile, on the assumption that the light amplitude can be described by a Gaussian random process. The development of highly coherent sources like lasers, where it is well known that the wave amplitude is not described by a Gaussian random process, stimulated the interest in fluctuations of light beams obtained from non-thermal sources. One of the most practical methods of studying fluctuations of light beams including the determination of their spectral and statistical properties is by means of photoelectric detectors. Widespread interest in developing the photoelectric detection techniques in recent years has led to several theoretical as well as experimental investigations to determine the exact relationship between the photocounting data and the statistics of the incident light radiation (BROWNand TWISS[1956, 1957a, b]; MANDEL, [1958, 1959, 1963a, b]; MANDEL et al. [1964]; KELLYand KLEINER[1964]; BELLISIOet al. [1964]; WOLF and MEHTA [1964]; GLAUBER[1966]; ARMSTRONGand SMITH [1967]; KORENMAN[1967]; LEHMBERG [1968]). Several review articles have discussed this problem in one form or another. Statistical description of the optical fields, particularly the introduction and properties of the coherence functions may be found in articles by MANDEL and WOLF [1965] and by GLAUBER [1965]. Many of the applications of fluctuation measurements are discussed by MANDEL[1963a] and MANDELand WOLF [1965]. An account of the experimental investigations on intensity fluctuations of and SMITH[1967]. Some statistical laser fields is given by ARMSTRONG 375
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THEORY O F PHOTOELECTRON COUNTING
[VIII,
5
1
properties relating to photoelectron counting and, in particular, the distribution of the counting interval between two photocounts has [ 19691. Theory of laser fluctuations is been considered by ROUSSEAU discussed by RISKEN[1970] in another article in this volume. A particularly interesting application of fluctuation measurements to light [ 19701 in beating spectroscopy is discussed by CUMMINSand SWINNEY another article in this volume. References to most of the original articles may be found in these review articles. In the present article, we will mainly consider the relationship between the statistics of the photoelectron counting and that of the light falling on it. More specifically, we will study the probability distribution p ( a )for the emission of n. photoelectrons and some of the statistical constants associated with it (e.g. the mean, the variance, the factorial moments etc.) as functions of the detecting time, the coherence time, and other statistical and spectral properties of the light beam falling on it. From the experimental measurements on the photoelectron counting, one can draw conclusions on the statistical properties of light which in turn have wide applications to fields such as spectroscopy and stellar interferometry. The basic quantity of interest which enters in the formula for p ( n ) is the probability density P ( W ) of the light intensityintegrated over a fixed time interval. Even when one knows the statistical distribution of the wave amplitude function, it is quite difficult to determine the probability density function P ( W ) of the integrated light intensity. Similar problems also appear in dealing with noise in electric circuits, where one is interested in the statistics of the output power, when that of the input current is given. RICE[1944, 19451 has discussed this problem a t length. Further development was carried out, and in fact solutions in certain specific cases were given by SLEPIAN[ 19581; KACand SIEGERT [ 19471; MIDDLETON[ 19571. In these problems, the input signal is described by a real random process. However, in the problems treated in this article, it is advantageous to use the complex analytic signals associated with the real fields (GABOR[ 19461; MANDELand WOLF[ 19651). This generalization from real to complex random processes is rather straightforward. The use of analytic signals come more naturally in discussion of the interaction of radiation with atomic systems (MANDELet al. [ 19641). We begin in 9 2 with a brief account of the counting distribution formula, which was first obtained by MANDEL [ 19581 on purely classical arguments. A corresponding relation has later been derived quantum
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§ 21
PHOTOELECTRON COUNTING FORMULA
377
mechanically (KELLEYand KLEINER[1964]; GLAUBER [1966]; LEHMBERG [1968]; MOLLOW [1968]; KORENMAN [1967]). If use is made of the Sudarshan diagonal representation of the density operator (SUDARSHAN [ 19631; GLAUBER[ 19631; MEHTA and SUDARSHAN [1965]; KLAUDER et al. [1965]; MEHTA [1967]; KLAUDERand SuDARSHAN [1968]), it is possible to rewrite this relationship in a form identical with Mandel's original formula. The use of c-number functions rather than operators in discussing these problems is therefore quite adequate. In singular cases the probability density P ( W ) , appearing in this manner need not satisfy the properties of a classical probability density, and has to be interpreted as a generalized function or as a distribution. However, for the typical cases considered in this article, P ( W ) is always a well behaved function. In the next two sections, we will discuss the form of the probability density P ( W ) and the counting distribution p ( n ) in several typical cases. In these discussions, it is assumed that the different photoelectric counts may be taken to be statistically independent. However, this is not so in general. The corrections due to the presence of dead time effects (DELOTTOet al. [1964a, b]; JOHNSON et al. [1966]; BBDARD[1967a]) is considered in § 5 . In 6, we consider the correlations in the output of two or more photodetectors. The existence of such correlations was clearly demonstrated by the early experiments of BROWNand TWISS [ 1954, 1957a, b]. These correlation measurements have applications to stellar interferometry (BROWN and TWISS[1954, 1957a, b]; PURCELL [1956]; MANDEL [1963a]; MANDEL and WOLF [1965]; WOLF [1966]; BROWN[1964, 19681). From such measurements, one can in principle also determine some of the higher order coherence functions of the light. The determination of the complete statistical distribution of the integrated light intensity from photocounting measurements is considered in 9 7 . Lastly in 5 8, we consider the counting statistics when the photoelectric emission takes place with simultaneous absorption of two photons. This is the simplest nonlinear interaction of radiation with atoms in the photodetector.
Q 2. Photoelectron Counting Formula The probability distribution p(n, t, T ) of registering n photoelectrons by an ideal detector in a time interval t , t+T is given by a Poisson transform relation
p ( n ,t , T ) =
n!
e-awP(W)dW,
(2.1)
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THEORY OF PHOTOELECTRON
COUNTING
[VIII,
g 2
where ct is the quantum efficiency of the detector and W is the integrated light intensity ( I )
W
=
I(t’)dt’.
(2.2)
P ( W ) is the probability density of the random variable W . The formula (2.1) was first derived by MANDEL [1958, 19591 by classical arguments. The two basic assumptions made in his derivation are: (1) the probability of registering a photoelectric count in a very short time interval At is directly proportional to At and to the instantaneous intensity of the light falling on the detector. (2) Different photo-electric counts are statistically independent events. However, since the photoelectric effect is itself a quantum phenomenon, the two assumptions made above on classical grounds are not completely satisfactory. MANDELet al. [ 19641 used first order perturbation theory to rederive formula (2.1). The method was semiclassical, in that the radiation field was considered to be a classical stochastic process and its interaction with the electrons of the detector was treated quantum-mechanically. They considered first a single realization of the electromagnetic field interacting with one atom detector. Then assuming that in practice, a photoelectric detector could be considered as a group of independent atoms interacting with the radiation field, they were able to show that the probability of photoemission of an electron in a time interval t, t+At is proportional to the classical measure of the light intensity defined in terms of the complex analytic signal: P(t)At = c t l ( t ) At. (2.3) Here I ( t ) = V*(t) . V(t), (2.4) V(t) being the analytic signal (GABOR[1946]; MANDEL and WOLF [1965]) associated with the real vector potential A ( t ) of the electromagnetic field, and cc is the quantum efficiency of the detector. cc depends on the geometry and various other parameters of the detector. It was also assumed in this derivation that the light falling on the detector is a quasi-monochromatic plane wave and that the time interval At is much smaller than the coherence time of the light but much larger than the period of the light. From eq. (2.3) and on the assumption that different photoelectric emissions are statistically independent events, it follows as shown below (see also MANDEL [1963a]) that the probability that there be
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g
21
PHOTOELECTRON COUNTING FORMULA
379
n photoelectric emissions in a finite time interval t , t+T is a Poisson distribution W" e-W, (2.5) n! ~
where W is the time integrated light intensity defined by eq. ( 2 . 2 ) . Eq. ( 2 . 5 ) refers to the counting distribution appropriate to a single realization of the intensity ensemble. The probability that would normally be derived from counting experiments is obtained by taking average of the expression (2.5) over this ensemble and one then obtains the result expressed by eq. ( 2 . 1 ) . To see that ( 2 . 5 ) follows from ( 2 . 3 ) , we divide the time interval t , t f T in a large number N of sub-intervals each of length AT = T / N . The number N is so chosen that AT satisfies all the requirements of At used to derive ( 2 . 3 ) . Let zk be a random variable which takes on the values 1 or 0 respectively, depending on whether or not there has been a photo-emission in the interval t + ( k - l ) A t , t+kAt; (k = 1 , . . ., N ) . The total number .n of photoemissions is then given by the relation N n= 'k'
c
k=l
Let Gr(A; t, T ) be the generating function of the random variable n, which is defined by the relation *
G,(A, t, T ) = Z: n
Assuming that all zk are independent, we find that N
Gr(A>t , T ) =
Cn
(1-AjZr)
k=l
N
((1-A)Z.).
=
(2.8)
k=l
Since zk is either 0 or 1, (l-n)..
=
l-Azk
and we therefore obtain
N
Gr(A, t, T ) = 17 { 1 - A $ ( z k k=l
1))
N =
JJ { l - h d ( t + K A t ) A t } k=l
--f
exp [-a2
SI"
I(t')dt'] as N - t co.
(2.9)
* Subscript r is used here to emphasize that we are considering a particular realization r of the intensitv ensemble.
380
THEORY O F PHOTOELECTRON COUNTING
The probability
pr(n,t , T ) is now given by
[VIII,
p
2
(2.10)
in agreement with ( 2 . 5 ) .It may be noted that the intensity fluctuations may also be taken into account by taking ensemble average of the generating function
G(1, t , T ) = (G,(A, t , T ) r =/om
ecawhP(W)dW.
(2.11)
The generating function is thus the Laplace transform of the probability density P ( W ) .If, as is usually the case, the incident field may be described as a stationary process, the generating function as well as the probability distribution are both independent of the initial counting time t . Our discussion shows that the fluctuations in the photoelectric emission may be regarded as due to two causes: ( 1 ) Intrinsic fluctuations in the detection process. This is due to the random ejection of the photoelectrons, even when there are no fluctuations in the intensity of the light beam falling on the detector and results in a Poisson distribution of the photo-electric counts. (2) Fluctuations in the intensity of light falling on the detector. In general, the resultant formula (2.1) is, of course, not a Poisson distribution. A complete quantum mechanical derivation of the photoelectron counting formula was first derived by KELLEYand KLEINER[1964] (see also GLAUBER[1966]). More recently KORENMAN [1967] and LEHMBERG [1968] have also given a quantum mechanical derivation of the counting distribution with less restrictive assumptions. These derivations are fairly involved. The final result may be expressed in a form similar to eq. (2.1). I t is found (KELLEYand KLEINER[1964]; GLAUBER [1966]; LEHMBERG [1968]) that the probability of counting n photoelectrons in a time interval t , t+T is given by
p ( n ,t , T ) =
(:9 :- .) e-aw.
,
(2.12)
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5 21
PHOTOELECTRON COUNTING FORMULA
381
where u is again a constant, the quantum efficiency of the detector, and W is given by
'$l
=
IC
d s S I T dt' A"t(r,t ' ) . A^(r,f).
(2.13)
A
In eq. (2.13), A (r,t ) is the positive frequency part of the field operator (vector potential) and the integration ds is performed over the surface of the detector. The colons in (2.12) denote normal ordering, and the angular brackets denote the quantum expectation value (0)= Tr(38) where j3 is the density operator of the radiation field. Let us expand the field operators A ( r , t ) and A t ( r , t ) in the form h
A
A .
A(r,t )
=
2h a",u,t(r,q ,
(2.14a) (2.14b)
The operators a",, a"1 are the annihilation and creation operators respectively of the photon with mode label A, and satisfy the comLet I(un>) = JJ,Iu,) and Iuh) be mutation relations [a,, u1.1 = an eigenstate of a", : &,I%> = uAluA). (2.15) n
(2.16) (2.17)
If we make use of the diagonal representation of the density operator (SUDARSHAN [1963]; GLAUBER[l963]; MEHTA [1967]; KLAUDER and SUDARSHAN [1965]) (2.18) we may express the expectation value on the right-hand side of (2.12) as an integral
(2.19)
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where
W’ = W’(t,1‘)= I c d r / t t + T d t ~ v * ( t’) r , V ( r ,t’).
(2.20)
In obtaining (2.19), we also used eq. (2.16) and its Hermitean adjoint. Further, if we define
we may rewrite eq. (2.19) in the form (2.22)
The functional +({v,}) is properly normalized, but, in general, it is not a positive definite functional. Consequently in general P ( W ) is not a positive definite function. However, for radiation fields produced from most of the available sources one may interpret P ( W ) as a probability function. In general, of course, one must regard it as a generalized function. We thus find that the basic formula of photoelectron counting is essentially unaltered by field quantization. Let us consider some general consequences of the photoelectron counting formula (2.1) or (2.22). The average and the mean square of the number of photoelectrons is given by (n) =
2 .P(%
t , T ) = .(W(t, TI)
(2.23)
n
(n2)=
znn2p(n, t, T ) = cx<W)+a2(W2).
(2.24)
n
From (2.23) and (2.24), we obtain the following expression for the variance, first given by MANDELet al. (1964), ( ( A n ) 2 )= =
(n2)-
(n)2
(.>+.Y(AW)z>,
(2.25)
where
((AW)’}
=
(W2)-(W)2.
(2.26)
Formula (2.25) shows that the variance of the fluctuations in photoelectrons may be regarded as consisting of two parts: (1) The fluctuations in the number of classical particles obeying Poisson distribution (term ( n ) ) ; (2) The fluctuations in the classical wave field (the wave
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interference term c ~ ~ ( ( A W ) ~This ) ) . result is strictly analogous to a celebrated result of EINSTEIN [ 1909a, b] relating to energy fluctuations in an enclosed blackbody radiation.* A similar formula was later derived by FURTH[1928b] for energy fluctuations in a thermal radiation field of arbitrary spectral profile. More recently GHIELMETTI [1964] derived an expression analogous to eq. (2.22),withn representing the total number of photon (rather than the number of photoelectrons emitted in a detector) in a radiation field. Thus we find that strictly analogous formulae hold for both the energy fluctuations in a closed radiation field and those in the photoelectric counts registered in a photo-detector. It was noted earlier in the quantum mechanical derivation of formula ( 2 . 2 2 ) that P ( W ) is, in general, not a positive definite function. Thus the result that ((AW)z) 2 0 which holds for all classical probability distributions P ( W ) is not necessarily true in general. One may therefore expect to find cases where the variance of the fluctuations in the number of photoelectric emissions becomes smaller than that expected from classical particle statistics. For example, when the radiation field has a well defined number of photons (ie. when the density operator corresponds to an eigenstate of the number operator), ( ( A n ) 2 )= 0, and from ( 2 . 2 5 ) we see that ( (AW)z) is then negative. For radiation fields from a well stabilized laser, the intensity is essentially constant and ( (AW)z) = 0. The variance ( (Am)2) is then seen to be equal to ( m ) i.e. same as that for a system of classical particles. For fields obtained from thermal sources, P ( W ) is always positive so that for such fields 2 0 and hence the variance of the fluctuation in the number of photoelectrons is always greater than ( n ) . One may also relate various other moments of n to those of W . Thus in particular, one finds that the Kth factorial moment of n is simply proportional to the Kth moment of W : (dk’)
3
(n(n-1) . . .(%-A+
1)) = M k ( W ’ k ) .
(2.27)
* Einstein gave a purely dimensional argument to interpret the second tcrm in his formula for the variance of the energy fluctuations. LORENTZ [1916] later verified the correctness of this interpretation (see also the footnote on p. 434 of this article). Einstein’s forniula may thus be regarded as a reflection of the wave particle dualism of the radiation field. For a lucid account of the significance of Einstein’s result, see BORN [ 19491.
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Q 3. Intensity Fluctuations The basic quantity which enters in the formula for the photoelectron counting distribution is the probability density of the integrated light intensity W . In this section we will investigate the form of this probability density for few of the typical cases of interest. 3.1. POLARIZED THERMAL LIGHT
Let us assume that the light beam is completely polarized. In this case we can describe the wave field by a scalar random process V ( t ) in the form of an analytic signal. * We also assume that the light beam falling on the detector originates from a thermal source. The random function V ( t )may then be represented as a stationary complex Gaussian process. The instantaneous intensity I ( t ) is given by
I ( t ) = V*(t) V(t).
(3.1)
Since V is distributed according to a Gaussian distribution, the probability density of I is an exponential function
P(I)=
1 ~
exp(-I/(I)).
(0
(3.2)
We are interested in the statistical properties of the integrated light intensitv (3.3)
From (3.1) and (3.3) it follows immediately that the mean and variance of W are given by
( W >= ( O T ,
=
where
I+)
J, J
(3.4)
jr(t-t’) 12 dt dt’,
(3.5)
is the correlation function r(T) =
(V*(t)V(t+t)).
(3.6)
* For an introduction to the statistical description of wavefields see MANDELand WOLF[I9651 $ 3 .
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I n deriving eq. ( 3 . 5 ) we have made use of the moment theorem relating to complex Gaussian random process [cf. eq. (A.5b) of the appendix]. It is shown later in this section (eq. (3.31)) that the nth cumulant of W can be expressed as rT
rT
A result similar to this was conjectured for a real Gaussian random process by RICE [1945] and was later proved by MIDDLETON [1957] and SLEPIAN[1958]. Eqs. (3.4) and ( 3 . 5 ) are special cases of (3.7). From the knowledge of the cumulants, one can determine the moments of W . Thus in particular ( W > = K1, ( W 2 ) = .2+.:, (W3)
=
K3+
3 K 2 K1+
K:,
(W4)= K q + 4 K 3 K 1 + 3 K ~ + 6 K : K 2 + K ~ ,
where the summation on the right-hand side of the last expression includes all possible positive integers nl, n 2 , . . ., nk such that n,+n2+
. . . +nk
=
n.
(3.9)
So far we have considered only the statistical constants of W . It is very difficult to derive an exact expression for the probability density of W in which T is arbitrary. In fact no simple expression for P ( W ) is known for any case of direct physical interest. However, it is not difficult to derive asymptotic expressions for P ( W ) when the parameter T is either very small or very large. When T is very small compared to the coherence time T,, the intensity I ( t ) may be considered to be constant in the time interval of duration T and W is then, approximately, equal to I T . Hence from eq. ( 3 . 2 ) we may write (3.10)
where ( W ) = T ( I ) .
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On the other hand, when T is very large compared t o the coherence time, we may divide this interval into a large number of sub-intervals each of which is greater than or of the order of T,. The contributions to W from each of these sub-intervals are random variables and may be considered as statistically independent. From the central limit theorem, one may then conclude that W is approximately normally distributed (cf. RICE [1945]):
P ( W ) = (232((AW)2)}-* exp {-+(W-(W))2/((AW)2)}.
(3.11)
The mean ( W ) and the variance ((AW)2) may be determined from eqs. (3.4) and (3.5) respectively. In the limit when T becomes very large, all the fluctuations in the intensity may be expected to be smoothed out on integration. W may then be regarded as a constant corresponding to a &function distribution: P(W)= 6(W-(W)). (3.12) Such a distribution is expected, to be appropriate for light from an incandescent lamp, for example, for which even the fastest available detectors will average out all the fluctuations present in the light beam. One may also obtain an approximate expression for P ( W ) when T is arbitrary. Let us divide the time interval T into say N subintervals each of length 6t, (T = N 6 t ) . Let us further assume that it is possible to choose 6t so small that there are no appreciable fluctuations in the wave field during this time and also so large that the wavefields belonging to different time intervals are uncorrelated. Thus 6t is of the order of the coherence time. We may then regard V(n6t);n = 0, 1, . . ., N-1, as N independent complex Gaussian random variables with equal variance and we may write N
wm 2
V" (n6 t ) V ( n6 t ) 6t.
(3.13)
n=O
From eq. (A.16) of the appendix, it then readily follows that aN
P(W)= -
WN-1
Z N (N-l)!
e-+aW
(3.14)
The constants a and N may be determined from the requirement that the mean and the variance of W should agree with those given by
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INTENSITY FLUCTUATIONS
eqs. (3.4) and (3.5). Thus one obtains
N
=
[
T2
/oT/
Jy(t-t’)
J2
dt dt’]
-’,
(3.15)
and a = 2N/(W),
(3.16)
where y ( 7 ) is the normalized correlation function
Y(.)
=
r(t)/r(o).
(3.17)
The distribution (3.14) of the integrated intensity W which is seen to be a Gamma distribution was first suggested by RICE [1945] as an appropriate approximate distribution. It agrees very well with the exact distribution in the two extreme limits when either T is very small or when it is very large. When T is very small, we see from (3.15) that N is nearly unity and P ( W )then reduces to an exponential function in agreement with eq. (3.10). When T is very large, N is also very large and in this limit P ( W )may be approximated by a Gaussian distribution and eventually tends to a &function in agreement with eqs. (3.11) and (3.12). The time interval 6t chosen in deriving the gamma-distribution (3.14) has the physical interpretation of being of the order of coherence time. From (3.15) we find on simplification that (3.18)
When T is large, (3.18) reduces to Mandel’s definition of the coherence time (MANDEL [ 1959]), (3.19)
and appears to be a reasonable measure of coherence time for at least thermal radiation (see also WOLF [1958]; MANDELand WOLF[1962]; MEHTA [1963]). The problem of determining the probability density P ( W ) may be reduced to solving an associated integral equation (SLEPIAN [1958]; KACand SIEGERT[1947]). Let us assume that A,, A,, . . . are the eigenvalues of the integral equation (3.20)
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arranged in decreasing order A, 2 A, 2 . . .. The kernel r(t-t') is Hermitian and positive definite (MEHTA et al. [1966]) and hence the eigenfunctions can be chosen to form an orthonormal set JOT +*(lC)
(t)+tL) (t)dt = 8,,
(3.21)
and we may write (3.22) k
Let us also express the random function V ( t )as
v(t)= 2
(3.23)
Ck+(k)(t)>
k
where ck are random coefficients
*. We may then write
r(t-t')= (V*(t')V ( t ) )= 2 (c : c , > # ~ * ( ~ ) ( t ' )+("(t).
(3.24)
On comparing (3.22) and (3.24) we obtain (3.25)
= 'k'kt'
(c:cI)
Further, since V ( t ) is a Gaussian random process, the coefficients ck which are linear functions of V ( t )are distributed according to a multivariate Gaussian distribution and it follows from (3.25) that
$(iC))
=
expi-
(n'k)-l
2
A,11Ck12).
(3.26)
k
Now from eqs. (3.23), (3.3) and (3.21) it follows that (3.27)
From eq. (A.14) of the appendix we therefore obtain the following expression for the characteristic function of W : c ( h ) = (,Ihw)
(1-iAkh)-1.
=
(3.28)
k
We see that the problem of finding the characteristic function associated with the random variable W is reduced to finding the eigenvalues Ak of the integral equation (3.20) and then evaluating the product (3.28). From (3.28) we may also write down for the cumulant gener-
* Representation (3.23) of the random function V ( t )is known as Karhunen-LoBve expansion (see for example DAVENPORT and ROOT[1958] p. 96).
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FLUCTUATIONS
ating function of W :
(3.29)
Hence the rtth cumulant of W is given by == (9'-
K,
1)!
2 A:,
(3.30)
k
from which it follows that K,
=
1)!
(yt-
soT
r(")(t, t ) dt,
(3.31)
T(t-t'),
(3.32)
where
P ) ( t ,t ' )
=
and
r(,)(t, t ' ) =
P - 1 )
(t, t " ) P )(t", t') dt",
rt
2 2.
(3.33)
The evaluation of the eigenvalues 1, of the integral equation (3.20) can be carried out explicitly for the interesting case when the spectral [1958]), i.e. when profile of the light is Lorentzian" (SLEPIAN (3.34)
In eq. (3.34), Y,,is themid-frequency and cr is half-width of the spectral line. In this case the correlation function r(t)is given by r(Z) =
r(o)e-.l7l e-Zvivo7
(3.35)
The integral equation with this kernel ** is solved in Appendix B. From eqs. (B.12) and (B.19) of that appendix we obtain the following expression for the characteristic function: C ( h ) = euT [cosh 2+8 sinh z
(3.36)
\
* Strictly speaking g ( v ) must be zero when v < 0. However for the quasi-monochromatic case y o >> 0,we may take (3.34) to approximately hold for all frequencies. ** Actually the solution t o the integral equation with kernel I'(~-~')exp(2niv,(t- -T')} is given in that appendix. However the eigenvalues 1, are the same in both cases.
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where 2 =
{$T2-2io(
W)h}*.
(3.37)
In Fig. 1 the moduli of the characteristic functions calculated from 1.0
I
I
h-1.0
IC(h)l
0.5 - h = 2.0
-_h = 4.0 h.10.0
---_
_---
------__
_ _ ---_ I
0
/
--===- -------
/
I
t P(w/iv)
1.5
1.0
0.5
0
0.5
1.0
1.5
2.0
Fig. 2. The probability density of the normalized integrated intensity of completely polarized (9= 1 ) thermal light. (After JAISWAL and MEHTA [1969].) The spectral profile is Lorentzian.
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INTENSITY FLUCTUATIONS
the approximate expression (3.la), viz.
C,(h)
=
(1-2ih/~)-~
(3.38)
are compared with the exact values calculated from (3.36). As expected the two curves coincide in the two extreme limits when aT << 1 and aT >> 1. The probability density P ( W ) may be obtained by taking the Fourier inverse of (3.36). The results of numerical computations are shown in Fig. 2. It is found that even for aT 1 the values of P ( W ) given by the approximate expression (3.14) agree very well with those given in Fig. 2. For a Lorentzian spectral profile, one may also evaluate the first few cumulants of W explicitly. From (3.7) one obtains after straight forward but lengthy calculations the following expressions for the first five cumulants (MIDDLETON[ 19571): N
K1
==
K~
=
(W), (W)2(28-1+ep2fl)/(282),
K3
=
3(W)3{
K~
Kg
=
=
(B-
+ (B+
1)e-2fl}//33> 10e-2fl$-5 28e-28+ep4fl-29
1)
[- B2 + + 1. 8ec2fl 36ec2fl 3 ( 2 0 e ~ ~ f l + e - ~ j + 7 ) + 5 ( W ) 5 [+ B2 P3 B4 6(W)4
2e-2P
___--
8B4
2P3
f
_.
~
~
13) 1, +-3(12e-2fl+e-4flB5
(3.39)
where aT.
(3.40)
If one uses (3.8) and (3.39) one may also evaluate the first few moments of W . 3.2. PARTIALLY POLARIZED THERMAL LIGHT
Next let us consider a plane stationary, partially polarized wave traveling in the z-direction, and let V(t)be the vector analytic signal describing the field at a fixed point in space at time t. The integrated light intensity is then given by
W ( T )=
loT
V*(t)* V ( t )dt.
(3.41)
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The Cartesian components V,(t) and V,(t) of V are assumed to be distributed according to a complex Gaussian random process. The statistical properties of V are then completely characterized by the 2 x 2 coherence matrix (3.42) where
Tij(.) = (V ?(t)Vj(t+.)). Let
(3.43)
+im) be the eigenfunctions of the matrix integral equation
IoT 2
rij(tl-tz)
(i = X , Y),
+im)(tz)dt2= v m + j m ) ( t l ) J
(3.44)
i=o, y
corresponding to the eigenvalues v, . The functions 41"' may be chosen to satisfy the orthonormality condition JOT
4:'") ( t )
( t ) dt = 6,,
.
(3.45)
Following a method strictly analogous to that used in deriving eq. (3.28) we may express the characteristic function C ( h ) of W in the form C ( h ) 3 (eihw) = (l-iv&-l. (3.46) m
The cumulants of W are now given by the formula K
~
=
( k - l ) ! I T d t 1 . . . J o T d t k x . .. ~ F i l i z ( t l - t z x) 0
il
is
XFi,i,(t2-t2) . . . P ( k i l ( t k - t l ) , (3.47)
= rji(.). where fij(.) When T is very small, in comparison with the coherence time, we may write eq. (3.44) in the form
(3.48) Since the two eigenvalues of the matrix J ( 0 ) are &(l+cY)(I); $(l-Y)
v2 =
$(l-S)(W).
(3.49)
From eqs. (3.46) and (3.49) we then obtain (see also MANDEL [1963b]) C (h) = (1 -$ (1+Y) (W)k}-l (1-$i (1-9) (W)h}-l,
(3.50)
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INTENSITY FLUCTUATIONS
and
P ( W )=
1 ~
P ( W ) (exp
)I.
2 w
(- (1+1m > exp (- V - P ) ( W ) 2w
-
(3.51)
Fig. 3 shows the behavior of this distribution for various values of the degree of polarization P.
I
1.0
T <
-
0.8
-
0.6
-
0.4
-
0.2
0
I
I
I
2
3
Wfi
Fig. 3. The probability density of the normalized integrated intensity of partially polarized thermal light; T << T,.(After MANDEL[1963b].)
When T is very large compared to the coherence time, one may use the central limit theorem, as before, to show that P ( W ) is Gaussian and tends to a delta function d ( W - ( W ) ) for extremely large values of T . In the special case when the second order cross-spectral density (MEHTA and WOLF [1967]; MANDEL and MEHTA [1969]) is approximately Lorentzian, we have M
I'ij(0)e-ulrl.
(3.52)
The eigenvalues v, of the matrix integral equations (3.42) may now
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be determined and the product on the right-hand side of (3.46) may be evaluated. We find that (HELSTROM [1964]; JAISWAL and MEHTA [19691) C ( h ) = C+(h)C-(h), (3.53) where cosh z*+$ sinh z*
and B again denotes the degree of polarization. The probability density P ( W ) may be obtained numerically by taking the Fourier inverse (3.56) of (3.53). By contour integration, it is possible to express this integral as a rapidly convergent series (JAISWAL and MEHTA [1969])
where
Q(y)
= el
(cosh y + t sinh y
(3.58)
B
Y
and (3.59)
(3.60) In eq. (3.58), = oT and a,,are the roots of eq. (B.9) arranged in an increasing order, i.e. wk < wo being the first positive root. A similar series expansion was obtained by JAKEMAN and PIKE[1968] for the completely polarized case (P = 1). Fig. 4 shows the behavior of P ( W )for various values of the parameter ,h' for completely unpolarized radiation (-9 = 0).
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395
t
Fig. 4 . The probability density of the normalized integrated intensity of the unpolxized (9’ = 0) thermal light. (After JAISWAL and MEHTA[1969].) The spectral profile is T,orentzian.
3.3. LASER LIGHT
An ideal laser emits light of a well stabilized intensity. This implies that even though there may be fluctuations in the phase, the amplitude of the wave field remains constant. The probability density of the instantaneous intensity may now be approximated by a delta function: P ( 1 ) = 6(1-(1)). (3.61) However, the probability density P ( I ) given above is not completely consistent with experimental observations. A close analysis of available photocount experimental data by ARECCHIet al. [1966a] has indicated that the moments of the photocounts observed experimentally are consistently larger than those expected from (3.61). A better experimental fit can be obtained if one assumes that the probability density P ( I ) is a Gaussian distribution, with variance much smaller than its mean ( R ~ ~ D A R[1966b]). D This modification is consistent with most of the recent theoretical models for laser noise (RISKEN[1965, 1968, 19701; LAXand HEMSTEAD [1967]; MCCUMBER [1966]; SCULLYand LAMB[1967]). We give below the probability
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density of the laser output intensity as derived by Risken, in his treatment of the laser as a Van der Pohl oscillator: 2
1
P(I)= exp &Io l+erf w
{-
(i
-w)2] .
(3.62)
The parameter I , is related to the average intensity ( I ) , (3.63) and the parameter w varies from large negative values to large positive values as the laser is brought from well below threshold to well above threshold. It is to be noted that, since the coherence time of the laser light is usually very long compared to the counting interval T , the probability density of the integrated intensity W is simply proportional to that of the instantaneous intensity I . In another model used for predicting the statistical properties of laser light, one considers the laser output to be an amplitude stabilized field on which a small amount of thermal noise is superimposed (LACHS[1965]; GLAUBER[1966]; MAGILL and SONI[1966]). Lachs and Glauber considered a single mode case and assumed the amplitude stabilized part of the field to be in a coherent state
6,
=
Iv,>(v,~
=
s
S ( 2 ) ( ~ - ~ c ) ( ~ )d2v, (d
(3.64)
whereas the thermal part has the usual Gaussian diagonal representation (3.65) The density operator of the superposed field is then given by
Assuming that the counting interval is small compared to the coherence time and using eqs. (3.66) and (2.1) one finds that the counting distribution may be expressed in terms of the Laguerre polynomial
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INTENSITY FLUCTUATIONS
Here (n,) = U C T I V , / ~ and (nT) = uT(IT) are the average counts obtained from the coherent and from the thermal fields respectively. As may be verified, the average and the variance of n are given by
< ( A n ) 2 )=
(nC>+(lZT);
(3*68)
The problem of determining the statistics of a harmonic signal field mixed with a thermal noise field has been extensively studied in recent years (MAGILL and SONI[1966]; LACHS[ 1965,19671; FILLMORE [1969]; JAKEMAN and PIKE[1969]; JAISWAL and MEHTA [1970]; MEHTA and JAISWAL [1970]) and is considered in the next section. 3.4. HARMONIC SIGNAL M I X E D WITH T H E R M A L F I E L D
Let us assume that the field V ( t )is obtained on superposition of a harmonic signal plus a thermal field, both of which are completely polarized. I t is further assumed that the states of polarization of the two fields are identical. We may then write
V ( t )= Vc(t)+VT(t).
(3.69)
The harmonic signal
V , ( t ) = j V ,lei(+@
(3.70)
has a constant amplitude and a random phase y . The thermal field V T ( t )is considered to be a Gaussian random process with an autocorrelation function
r(z)
=
(V:(t) v T ( t + t ) ) .
(3.71)
Let us expand the fields V,(t) and VT(t)in the form (3.72) (3.73) where
+(k)
are the orthonormal eigenfunctions of the integral equation
IOT
~ ( z - T ’ ) +(k) (t’)dt‘
=
(t).
(3.74)
Following a method analogous to that used in deriving eq. (3.28), we find that the characteristic function C (h) of the integrated intensity P T
(3.75)
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THEORY O F PHOTOELECTRON COUNTING
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is given by
The product on the right-hand side of eq. (3.76) has been evaluated explicitly by JAKEMAN and PIKE[1969] for the special case when the spectral profile of the thermal field is Lorentzian. The probability density P ( W ) is, of course, obtained by taking the Fourier inverse of the above expression. When T is small compared with the coherence time of the thermal field, we find that only one eigenvalue namely A = T r ( 0 ) contributes significantly to the product on the right-hand side of eq. (3.76). It may be shown that this approximation leads to a counting distribution identical to that given by eq. (3.67) (see also MAGILL and SONI[1966]; JAISWAL and MEHTA [ 1 9 7 0 ] ) . For arbitrary values of T , an expression similar to (3.31) may be obtained for the cumulants of W . We have from (3.76)
The rtth cumulant of W is therefore given by K,
=
(n-1) !
2 A,”+%! 2 luk12A;--1 k
=
k
( n - 1 ) !soTI.(n’(l. l)dt+n!/oT/dt d l ’ ~ ~ ( l ) ~ ( n - l ) ( l , l ’ ) ~ ~ ( ~ ’ ) , (3.78)
where P ) is the kth iterated kernel as defined by eqs. (3.32) and (3.33). Eqs. (3.8) and (3.78) may be used to evaluate the moments of W . In particular we find that
<w>= (W,>+(WT> ( W 2 )= (W)2+
soTs
II’(r-d)12drdz’+
The results of this section may readily be extended to include the case when the incident light is in any particular state of polarization.
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The nth cumulant of the integrated intensity may in this case be shown to be given by
S, 7I‘;,) t ) dt + T
K,
=
(n- 1 ) !
(t,
(3.80)
where
I - p (t, t’) = (V&(t’)V.&)),
(3.81)
Q 4. Photocounting Distribution As pointed out earlier, the light fluctuations are not measured directly, but are usually inferred from the photoelectric measurements. According t o Mandel’s formula, the probability p (n) of detecting n photoelectrons in a time interval T is given by
p ( n )=
IOm n!
ecaWP( W )dW.
In 9 3 we evaluated the probability density P ( W ) in a few typical cases, and for various values of the counting time T . In this section we will study the corresponding behavior of p (n). 4.1. POLARIZED THERMAL LIGHT
Let us first consider a plane wave beam of completely polarized thermal light. When T << T,, we note from eq. (3.10) that the probability density P ( W )is exponential. The corresponding photocounting distribution p(n) is readily seen to be given by the Bose-Einstein formula * (4.2)
On the other hand, if T is very large compared to the coherence time T,, so that the conditions of eq. (3.12) are satisfied, the counting dis-
* I t is of interest to observe that the Bose-Einstein distribution is also the most likely distribution, if the only information given is the average number of counts
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f 4
tribution is Poissonian. For moderately large values of T (- 10 T,), the probability density P ( W ) is approximately Gaussian [eq. (3.11)]. If we retain terms to the first order in ( ( A W ) z ) / ( W ) zwe , obtain the following expression for the counting distribution (MCLEANand PIKE[1965], see also BBDARD[1966b]):
where ( n ) = ct(W). For a polarized thermal light beam with Lorentzian spectral profile, GLAUBER [1965, 19661 has suggested another asymptotic formula valid for T >> T,, namely
where
c = {(l/T~)+2(n)/(TT,)):,
(4.5)
S,(x)= (2x/n):e"K,_+(x),
(4.6)
and K,-; is the modified Hankel function of order n-$. This formula is in good agreement with the exact expression for p ( n ) only when T 2 lOT,. Since no explicit expression is available for P ( W ) for arbitrary values of T, it is not possible to give the corresponding expression for * ( a ) . However, if we use the Rice's approximate expression for P ( W ) [eq. (3.14)], we obtain from (4.1) the following formula for p ( n ) (MANDEL [1959]):
ll(n+N) +(%)
=
1
n!r(N)( l + ( n ) / N ) N
1
(l+N/(n))"'
(4.7)
The parameter N is given by eq. (3.15). Formula (4.7) is encountered in statistical mechanics in connection with the fluctuation of bosons in N-cells of phase space; in the present context N is, however not necessarily an integer. The expression (4.7) is valid in the two extreme limits T << T, and T >> T,, and appears to be a fairly good approximation for the intermediate values of T also, as is evident from our earlier discussion in connection with the corresponding probability density P ( W ) . For the special case when the spectral profile of the light beam is either Gaussian or rectangular, BBDARDet al. [1967] have evaluated the first few factorial moments using eq. (4.7) and
10
I
10-1
I
I
I
I
16'
lOl
I
10
10-2
PT
I
I
I
10'
I
10
oT
Fig. 5. A comparison of the factorial moments calculated from the approximate probability [eq. (4.7)] (broken curves), with the exact values calculated from the cumulants [eq. (3.7)]: (a) Rectangular spectral profile; (b) Gaussian spectral profile. (After BBDARDet al. [1967].)
w
z
405
THEORY OF PHOTOELECTRON COUNTING
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compared them with the exact values obtained from eqs. (2.27), (3.7) and (3.8). Their results are reproduced in Fig. 5. It is to be noted that the generating function
is related to the characteristic function
C (12) =
eihwP(W) dW /om
of W by the formula
G(s) = C(itcs).
(4.9)
From eq. (3.28) we may therefore write
G ( s ) = JJ ( 1 + t c d k ) ~ l ,
(4.10)
lc
where 3Lk are the eigenvalues of the integral equation (3.20). The product on the right-hand side of eq. (4.10) is evaluated explicitly in Appendix B for light with Lorentzian spectral profile. From eqs. (4.9) and (3.36), we find that coshz+&sinhz
(",' + iT) )-', -
-
(4.11)
where z = .[0~T~+2oT(n)s}~.
The counting distribution p ( k ) and the factorial moments may be obtained from G (s) by repeated differentiation: dk
k!
dsk
(4.12) (firr1>
(4.13) s=l
(4.14)
The factorial moments in this case may, of course, be directly obtained from eqs. (2.27), (3.8) and (3.39). In Fig. 6 we compare the first few counting distributions and the factorial moments obtained from eqs. (4.4) and (4.7) with those obtained from the exact formulas (4.13) and (4.14).
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4.2. PARTIALLY POLARIZED THERMAL LIGHT
When the counting time T is small compared with the coherence time, the probability density P ( W ) for partially polarized thermal light of degree of polarization B is given by eq. (3.51). From (3.51) and (4.1) we then obtain the following expression for the counting distribution $(a) (MANDEL [1963b]):
(4.15)
One may interpret this result as a distribution of n bosons in two cells of phase space with occupation numbers in the ratio ( 1 - 9 ) to ( 1 +P). The variance ( ( A n ) 2 )is given by ( (An)
> = (n>{1+4 (1 +g2) <.>>.
(4.16)
When T is large compared to the coherence time, P ( W ) is approximately Gaussian and+(%)is therefore of the form given by eq. (4.3). It is possible to obtain an approximate expression for p (n)analogous to (4.7). The coherence matrix J ( 0 ) of eq. (3.42) may be diagonalized by a unitary transformation. The intensity I ( t ) may thus be divided into two parts I l ( t )and 12(t),which, on account of the Gaussian nature of the wavefield, are statistically independent random variables. Their averages are the eigenvalues of J ( 0 ) :
I ( t ) = Il(t)+I,(t),
(4.17)
(1,) = + ( l + q < o >(1,) = + ( 1 - 9 ) ( I ) .
(4.18)
The contribution to the photocounting distribution pl(K) and p , ( k ) from I l ( t )and12(t)separately may be approximated by (4.7). We may therefore write (see also HELSTROM [1964]) n
P(n) =
2 $1(K)92(n-J4)
1c=o
2N ]-n+k.
(n>(1 -9)
(4.19)
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405
PHOTOCOUNTING DISTRIBUTION
It is to be noted that this expression holds for light beams with arbitrary spectral profile and that it leads to the correct distribution in the two extreme limits T >> T , and T << T,. From (4.19) we find that the mean square fluctuation of the number of counts is (4.20) in agreement with the formula of WOLF[l960]. The moment generating function G(s) = ( ( l - ~ ) ~may ) be expressed in terms of the eigenvalues of the matrix integral eq. (3.44): G(s) = (~+c~s,u~)-~. (4.21 m 100.0
,
,
I
I
4
t-
-1 ......
___----....... .......... ................
O ' ........................... ' l
0
lo./.--
1
........... 10 .__..( ...... ............. __.. .......
.....
0.5
9-
10
-
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THEORY O F PHOTOELECTRON COUNTING
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4
-----__ -----__
--__ ...._..
'
.
Fig. 8. Variation of the normalized factorial moments with nT. Different curves for factorial moments of the same order correspond to B = 0, 0.25, 0.5, 0.75 and 1.0 respectively in the increasing order. (After JAISWAL and MEHTA [1969].)
For the special case when the spectral profile of the light is Lorentzian, i.e. when eq. (3.35) holds, the product on the right-hand side may be evaluated explicitly (cf. eqs. (4.9) and (3.53)). The first few factorial moments may also be evaluated in this case by using eqs. (2.27), (3.8), (3.47) and (3.52). Results of numerical evaluation are shown in Figs. 7 and 8. 4.3. LASER LIGHT
Light from an ideal laser would not exhibit any intensity fluctuations [cf. eq. (3.6l)l and the counting distribution in this case would be Poissonian: (4.22)
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PHOTOCOUNTING DISTRIBUTION
407
However as mentioned already in 9 3.3, laser fields do exhibit some intensity fluctuations and the fcrmula (4.22) needs modification. If we use Risken’s result (eq. (3.62)) for the probability density of the intensity, and also assume that the counting interval is small compared to the coherence time, we obtain from eq. (4.1), the following expression for the counting distribution (RISKEN[1965, 19681; BBDARD[1967c]): 2 Dnexp(-wD+aD2)
p ( n )= - +i n!
lferf w
I-,
e-22(x+c)n dx,
(4.23)
where D = crI,T, c = w - i D , and the other parameters are the same as defined earlier in 5 3.3. The integral on the right-hand side of (4.23) may be expressed in terms of incomplete gamma functions or as parabolic cylinder functions. The counting distribution obtained on the assumption that the field may be approximated by a harmonic signal plus Gaussian noise is given by eq. (3.67). There is no simple expression for the counting distribution when T is arbitrary. However for the model in which the output is considered as a mixture of a harmonic signal and Gaussian noise, one may use eqs. (2.27), (3.8) and (3.78) to obtain the factorial moments of n (JAISWAL and MEHTA [1970]; see also JAKEMAN and PIKE[1969]). 4.4. BUNCHING EFFECTS
We have seen earlier [eq. (2.25)J that the variance of the photoelectric counts is in general different from, and is usually greater than, that expected from a Poisson distribution. This is a reflection of the fact that photons do not arrive at random, but they possess a certain bunching property characteristic of Boson particles (MANDEL [1963a]; UHLENBECK and GROPPER[1932]; LONDON[1938, 19431). Bunching effects may more clearly be understood in terms of the conditional probability p , (t1z)dz that a photoelectric count be registered in a time interval dz at t+t, given that one count has been registered at time t. Assuming that the light is stationary, it may readily be shown (MANDEL [1963a]; MANDEL and WOLF [1965]) that this conditional probability density is given by the formula
$,(tit)
=
.(I(t) I ( t + r ) > / ( I ( t ) > .
(4.24)
From eqs. (2.27) and (4.24) it follows that the second factorial moment
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THEORY O F PHOTOELECTRON COUNTING
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s
4
of the counts registered in a time interval T may be expressed in the form (4.25)
and on differentiating twice with respect t o T , we find that (4.26)
Eq. (4.24) may be used to evaluate the conditional probability density @,(tlz) for the typical light beams:
A. Intensity stabilized field In this case the instantaneous intensity is constant and we find that Pc(tl.) = (4.27) which is independent of z. The separate counts are therefore statistically independent as expected.
B. Polarized thermal light In this case the wave amplitude is a Gaussian scalar random process, and we find on using the moment theorem for Gaussian distribution that Pc(tlz) = a
T
Fig. 9. The normalized conditional probability V ( T ) = p,(tlt)/p,(tIm) for a thermal light with Lorentzian spectral profile.
VIII,
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409
PHOTOCOUNTING DISTRIBUTION
where y ( z ) is the normalized coherence function. The quantity q ( z ) = @,(tjz)/p,(tjm) is plotted in Fig. 9 for the special case of Lorentzian spectral profile.
C . Partially polarized thermal light Let r i j ( z ) = ( V y ( t ) V j ( t + z ) ) be the second order coherence tensor, where V ( t ) is the field perpendicular to the direction of propagation. In this case
Pc(tlz) = . ( 0 [ 1 +
c z: l ~ i ~ ( ~ ) l Z / ( W 1 . i
(4.29)
j
If we further assume that the light is cross-spectrally pure ( MANDEL [1961]; MANDEL and MEHTA [1969]), namely that its cross-correlation function obeys the condition (4.30)
z: 2 i
where
l r % j ( z ) l z= 3 ( 1 + ~ ~ 2 ) ( ~ ) 2 1 Y ( ~ ~ 1 2 >
(4.31)
j
B is the degree of polarization (WOLF [1959]). From eqs.
(4.29) and (4.31) we then find that Pc(tb)= 4 ) [ 1 + 3 ( 1 + W
lv(z) I”.
(4.32)
D. Harmonic signal p l u s thermal field Consider next the case when the field is given by eq. (3.69). We find in this case, that
[
Pc(tlz) = 40 1 +
IW)l2+2(rC>Ir(z) 1 cos [+b)+ (Wc-Wl-)TI
<w
1
7
(4.33)
where o C / 2 n is the frequency of the harmonic signal and r ( z ) = Ir(z)I exp [i(+(z)-wz)]. This equation may readily be generalized to partially polarized light. Finally by using the results of RISKEN[196S], one may evaluate the conditional probability$, ( t i t )for a Van der Pohl oscillator (RISKEN [1968]). In Fig. 10 the quantity
.l(r) = P c ( t / t ) / $ c ( t l a ) = l + W ( t ) Ar(t+z)>/(w is plotted for various values of the parameter w.
(4.34)
410
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THEORY O F PHOTOELECTRON C O U N T I N G
20 1
I
1
I
I
I
I
4
1
I
1 1O
0
k
Fig. 10. The normalized conditional probability q ( ~for ) a Van der Pohl oscillator. (After RISKEN[1968].)
The enhancement of the counting rate (excess of V(Z) over unity) has been demonstrated by recent experiments of MARTIENSSENand SPILLER [1964]; ARECCHIet al. [1966b]; MORGAN and MANDEL [1966]; DAVIDSON and MANDEL [1967]; MANDEL[1970]. The analogous
01 0 0
o
A-D
I
I 500
0
300
c
200
x
1000 600 400 (y sec)
1 1500 900 600
I 2000 1200 8 00
Fig. 11. The normalized conditional probability q ( z ) . -4 ( A - V = 1.25 cmjsec), (0- V = 2.09 cmjsec), C ( + - V = 3.14 cmjsec): with light from pseudothermal sources, D ( - Laser) : with single mode of a He-Ne laser. The values of V refer t o the linear velocities of the ground glass plate and are related t o the coherence times of the light. (After ARECCHIe t al. [196Gb].)
B
VIII,
51
DEAD T I M E E F h E C T S
r
(a I
84F.;'i
.-
'... \,
I
411
I
1
LORENTZIAN SPECTRUM w i t h A v = 200Mc/r
I I 1 2 3 4 5 6 INTERVAL r, in n see
Fig. 12. An illustration of the phenomena of photon bunching. (a):with light from a 198 Hg source; (b): with light from a tungsten lamp. The ordinate represents essentially a quantity which is proportional to the integral J:;T(z)dr, where z2 is a constant. (After MORGANand MANDEL[1967].)
enhancement in the rate of coincident counts recorded by two photo detectors illuminated by two partially coherent thermal light beams was first observed by TWISSet al. [1967] (see also TWISSand LITTLE [1959]; REBKAand POUND [1957]; BRANNEN et al. [1958]; JANOSSY et al. [196l]). The correlation of counts using two or more detectors will be considered in 9 6. The results of ARECCIIIet al. [1966b] and MORGANand MANDEL [1966] are reproduced in Figs. 11 and 12.
5 5.
Dead Time Effects
5.1. GENERAL THEORY
In the derivation of Mandel's formula [eq. (2.1)], it has been assumed that the photoelectric emissions in a photodetector are statistically independent of each other. However, in practice, this condition is not strictly satisfied. Most of the detectors require some characteristic time, called the recovery or dead time, after each registration of a count, during which the detector does not respond to any external field. In this section we study the effect of finite dead time on the statistics of photoelectrons. For the purpose of making a precise analysis, we will assume that the detector has a constant inoperative period t,i.e. after each registration of a count by the detector, there exists a time interval t during which no further photo-emission may be registered. KOLIN [1934] appears to be the first person to establish experimentally the effect of dead time on the counting statistics in photoelectric emissions of ultraviolet radiation. The first theoretical in-
412
THEORY OF PHOTOELECTRON COUNTING
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5 5
vestigation of the dead time effects appears to be due to DELOTTO et al. [1964]. Following the method of FELLER [1948] they were able to obtain an expression for $ ( a ) with dead time corrections up to the order of ( Z / T ) More ~ . recently BBDARD[1967a] has found an exact expression for $(n) taking into account the dead time effects. We follow essentially his treatment. It is to be noted that the dead time effects are only appreciable when t / T is not too small. In practice z is usually small, we will therefore assume that T is also small compared with the coherence time, The integrated intensity W may therefore be taken to be proportional to the instantaneous intensity
:J
I ( t )dt w I T .
W ( T )=
I n the absence of the dead time effects, the probability distribution @ ( a of ) the photo counts is given by the formula
Let us take a particular rth realization of the stationary ensemble of the fluctuating intensity. For this realization, the counting distribution in the absence of dead time effects is Poissonian
(aIT)"
A(%T ) = -__
n!
exp ( - a I T ) .
(5.3)
Let S, be the interval of time extending from the initial time up to the (Kf1)th count. Obviously the probability that S , be less than or equal to t is identical with the probability that there be at least ( K + l ) counts in the interval t. Let us denote this cumulative probability distribution by F,(K, t ) , i.e., let F,(k, t )
= Prob.
(S,
5 t) (5.4)
It is then readily seen that
p,(k t ) = F , ( k - L t)--F,(K,
t).
(5.5)
We also introduce the probability f , ( k , .u)d.u that S, lies in the in-
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5 51
413
DEAD TIME EFFECTS
terval u,u+du, so that
Also let T , be the sub-interval of time extending from the Kth to the (k+l)th count; Tobeing the sub-interval between initial time and the first count. Then S , is the sum of these sub-intervals s k =
To+T,+
. . . +T,.
(5.7)
All the T , are independent random variables and all of them except T o have the same probability density which we shall denote by +(t). ( T ois being singled out because there is no dead time effect up to the first count.) Since To = S o , the probability density of To is f,(O, T o ) and can be evaluated from eqs. (5.3), (5.4) and (5.6). We find that Jo'f,(O,
.u) d.u = F,(O, =
4
l-P,(O, t ) ,
(5.8)
t 2 0.
(5.9)
and hence f,(O,
t ) = ale-"",
To evaluate +(t), we note that the requirement that T , be greater than t is identical with the requirement that there be no count in the interval (Skp1+z, S,-,+t), where z is the dead time of the counter. Hence we find that Prob. (T, 2 t )
=
ItW
+(t) dt
= P,(O,
t-z),
(5.10)
and on using (5.3) we obtain the result
+[t)= tlIe-ar(t--7), t 1z =
t
0,
(5.11)
Let @(s) and @,(s) denote the Fourier transforms of +(t) and f , ( K , t ) respectively, i.e. @ ( s ) ==
and Q k ( s )=
Jam
+(t)eistdt
s," f , ( K ,
t)eistdt.
(5.12)
(5.13)
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THEORY O F PHOTOELECTRON
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5
Since T o ,TI, . . ., T , are all independent random variables and since S, = To+T,+ . . . + T k , we obtain the following relation:
From eqs. (5.9)-(5.13) we find that Q 0 ( s )= ccl/(aILis),
(5.15)
a' uI-is
(5.16)
and @(s) =
eisr.
~
On substituting from (5.15) and (5.16) in (5.14) and on taking the Fourier inverse, we obtain
Hence the cumulative distribution function F,(k, t ) is given by
(5.18) where (5.19) is the incomplete gamma function (ABROMOWITZ and STEGUN [1965]) and Pk = B k ( ~ = ) cclT(l--K~/T). (5.20) We have up till now considered only a particular realization r of the ensemble of fluctuating intensity. However the photoelectric measurements will provide us with the average over this ensemble,
F ( k T , ).
= =
(F,(k, T ) )
I
F,(k, T ) P ( I )d l .
(5.21)
If we make use of the series expansion (5.22)
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415
D E A D TIME EFFECTS
of the incomplete gamma function, we may readily express F(K, T , t ) in the form (-l)’[~(l--Kz/T)]”+”+~
1
F(K, T , t) = k ! 2-
s ! ( K + ~ + 1)
h+s+l~
(5.23)
where p l is the lth moment of the probability density P ( W ) of the integrated light intensity:
W ’ P ( WdW, )
W =IT.
(5.24)
The photocount distribution p(n, T ) is obtained from eq. (5.5) and is given by $(%,
T , t) = F(n-1, T , t ) - F ( a , T , t) 1
= - “ ( Y h Pn-l)>-(Y(n+l,
(5.25)
n!
I t may readily be verified that in absence of dead time effects we obtain the usual relation
(t =
0),
(5.26)
and the Zth moment ,ul of P ( W )in this case is equal to the Zth factorial moment of the photocount distribution. Equality (5.26) no longer holds when dead time effects are present. The first order correction due to dead time effects may be obtained by retaining terms up to order t / T . From (5.23) and (5.25) we find that
P ( % ,T , t) =
( ~
e-aw [ l + n ( ~ W - n + l ) 21) T +o
(;I.
(5.27)
Let us now apply these results to laser light and to thermal light. 5.2. INTENSITY STABILIZED LASER LIGHT
For a well stabilized single-mode laser, the probability density of the light intensity is given by
P ( I ) = 8(1-(1)).
(5.28)
For counting time intervals of duration T short compared with the
416
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T H E 0RY 0F P H O T O E L E C T R O N COUNT I N G
s
5
coherence time, we obtain from eq. (5.25) the following expression for
where
Pk Pk(%)== ~ ( 1 T(l--Kt/T). )
(5.30)
From the remarks of 9 3 on p. 386, it is evident that this result also holds for white light; for such light the coherence time is extremely short compared to any of the characteristic times appearing in the detecting process. JOHNSON et al. [ 19661 have observed dead time effects using tungsten lamp. In Table 1 below, we compare the PoisTABLE1 Typical photo-count distributions for light from a tungsten lamp
~
0 1 2 3 4 5 6 7 8 9 10
~~~
0.266069 0.352275 0.233206 0.102922 0.034067 0.009021 0.001992 0.000376 0.000063 0.000009 0.000000
0.266069 0.361202 0.235906 0.098721 0.029743 0.006873 0.001267 0.000192 0.000025 0.000002 0.000000
0.266072 0.361124 0.235805 0.098750 0.029819 0.006926 0.001280 0.000196 0.000025 0.000003 0.000000
The values of the parameters fia and t / T providing the best fit to the experimental data are 1.324 and 0.01908 respectively. The subscripts refer t o the Poissonian distribution (P),the calculated distribution (c) and the experimental~D ly observed distribution by JOHNSON et al. [1966] (E). (After B ~ D A I[1967a].)
son distribution and the distribution obtained from (5.29) with the experimentally observed distribution. The existence of the dead time effect is evident from the excellent agreement between the values in the last two columns of Table 1. To the first order in z / T , we find from (5.27) that the quantity f ( n ) = (~+l)P(~+ll/P(nyL)
(5.31)
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$ 51
417
DEAD TIME EFFECTS
where Go = a ( I ) T , is linear with slope --2E0z/T. The results of experimental observations due to Johnson et al. is presented in Fig. 13.
t
0
1
1
2
3
4
5
6
7
8
n
Fig. 13. Variation of the quantity f ( n ) = ( n + l ) p ( n + I ) / p ( n with ) n . The crosses represent the experimentally observed values; the dashed line represents a Poisson distribution for a mean of 1.324 counts per microsecond and the full line represents the dead time corrections [eq. (5.31)] corresponding to a dead time of 19.09 nsec. (After JOHNSON e t al. [1966].)
5.3. THERMAL LIGHT
Consider partially polarized thermal light. We have seen earlier in 9 2 that the probability density for the integrated intensity in a partially polarized thermal light is given by 1
pP(w>[exp (-
P ( W ) = ___
2
w
(1+.5P)(W)
1
-exp
(-
(1--B)(W) 2w
1
1
9
(5.32)
418
THEORY OF PHOTOELECTRON
COUNTlNG
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$ 6
where 9 is the degree of polarization. It is being assumed that the counting interval T is much smaller than the coherence time of the light beam. From eqs. (5.32), (5.24) and (5.25) we obtain the following expression for F (k T , z) :
F(k, T ,T )
1 =-
293
(5.33)
where
W,
=
(5.34)
a ( W ) +(l+S) (l-kt/T),
and
W _= .(W)
+(l-9) ( l - k ~ / T ) .
For completely polarized light that
(5.35)
(.P= 1) we readily find from 1-k t / T
I"',
(5.33)
(5.36)
where 5, = a ( W ) is the average number of counts in the absence of dead time effects. For t = 0, eqs. (5.36) and (5.5) give the Bosenamely Einstein distribution with parameter +in, $ ( k , T , 0)
n,'C =
~-
-
(1+ii,)"fl
(5.37)
For usual thermal sources, the condition T << T , cannot be satisfied in practice. However, one may use the socalled pseudo-thermal sources (MARTIENSSEN and SPILLER[1964]) to verify the validity of eq. (5.33).
Q 6. Multiple Correlations In this section, we consider correlations in the photoelectron counting with two or more detectors. Let us consider N detectors situated at different points in a radiation field of a plane quasi-monochromatic stationary light beam. Let n, be the number of counts registered by the kth detector in a time interval (tk,tk+Tk), k = 1, 2, . . ., N . Then, assuming a single realization of the intensity ensemble, it follows readily from eq. (2.5) that the joint probability of registering n, counts by the first detector, n2 counts by the second
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419
detector etc., is given by
where uB is the quantum efficiency of the kth detector,
and I k ( t )is the instantaneous intensity at time t of the light incident on the Kth detector. The probability that would normaIly be obtained from counting experiments is the average of (6.1) over the intensity ensemble:
(6.3)
The multi-dimensional generating function G(sl, s 2 , . . ., S N ) may be defined by analogy with (4.8) G(s1, s2, . . ., S N )
=
( ( I - S ~ ) ~ ~ ( ~ - .- .S( ~1 )- ~ s ~~ ). ~ ~ ) . (6.4)
From (6.3) and (6.4) we find that
From eq. (6.3) it follows that the multiple correlation of the counts is simply proportional to the multiple correlation of the integrated intensities : ( n l n 2 . .. .n,iy> = A ( W I W , . . . W N ) ,
(6.6)
where A
= U1U%. .
. UN.
(6.7 1
We may also write
( n l n 2 .. . % N )
=A
tN+TN
dz, . . . Jt
,
dtN X
xP'"N)(tl,
where
F
N
Y
N
)
. . ., znr; tl,. . ., ZN), (6.8)
is the (2N)th order coherence function
p ( N * N ) ( .t ., l ,t .N , t i , . . ., tN) z=
(v*(tl). . . v*(tN)V(t,) . . . v ( t N ) ) .
(6.9)
420
THSORY OF PHOTOELECTRON COUNTING
[VIII,
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If T I , T,, . . ., TN are all small compared with the coherence time, we find from (6.8) that (nln2 . . . nN)
N
(AT,T, . . . T N ) I ' ( N , N ) ( ~ , ,t,, . . ., t N ; t,, . . ., t ~ ) . (6.10)
The multiple correlation of the photoelectron counts in this case gives information about the higher order coherence functions of the field. Eq. (6.6) may also be expressed as a relation between correlations of the fluctuations An, = n,-(n,), and AW, = W,-(W,). By making a multinomial expansion of the product An, An,. . . AnN and using (6.6) repeatedly, we find that
(An,An,. . .An,>
= A(AW,AW,.
. . AWN).
(6.11)
The values of these correlations will of course depend on the type of light illuminating the detectors. If one assumes that the light originates in a laser with a well stabilized amplitude, these correlations vanish. The counting distribution $(n,,n,, . . ., nN) in this case as obtained from eq. (6.3) is a product of independent Poisson distributions: (6.12)
We consider now in some detail the case when the light originates in a thermal source. Consider first the correlation in two detectors. For the sake of simplicity, we will assume that the light is completely polarized, so that the wave fields at the two detectors may be characterized by complex scalar stochastic variables V,(t) and V,(t) respectively. From eq. (6.11) it follows that (AnlAn,)
Jt;Tl
= uluz
dt J.;TZ
dt' ~I'l,(t-t'~~2,
(6.13)
where T12b)
=
cv:
( t )V,(t+T)>
(6.14)
and where we have made use of the moment theorem of the Gaussian random processes [see eqs. (A.5) of the Appendix A]. By making the change of variables x = t-t', y = t+t' and integrating over y,we may rewrite eq. (6.13) in the form
VIII,
S 61
421
MULTIPLE CORRELATIONS
(AnlAn2)
= alu2
-Io
TrTz
(T,7.,n)~I'(tl-t2+x)l2dx]
.
(6.15)
When the counting intervals of the two detectors are equal (i.e. when T,= T , = T ) ,we obtain T
(AnlA.n,)
= X,~z
ST
( T - l ~ l ) l ~ 1 2 ( ~ + ~ ) l 2 d x , (6.16)
where t is the time delay t,-t,. The existence of this correlation was first observed by BROWN and TWISS[1956, 1957a, b]. A more detailed discussion and its applications to stellar interferometry is given by MANDEL [1963a] (see also BROWN[1964]; MANDELand WOLF[1965]; BROWN[1968]). In deriving eq. (6.15) [or (6.16)], it was assumed that the incident light is completely polarized. To consider the unpolarized orpartially by polarized thermal light also, one only needs to replace lT12(x)12
2 lrij(rl>
r29
-x)12-
i, j
Here Tij(rl, r,, x) is the second order coherence tensor I'ij(r1, r2,
x) = CVP(.,>
t ) Vj(r2, t+x)>,
(6.17)
and r,, r2specify the spatial locations of the two detectors. Next let us consider the correlations in three detectors. From (6.11) it follows that
(An, An, An,)
=
a, a, a, (A W ,A W ,A W3),
(6.18)
where
AW, = I t r T k V ? ( t )V,(t)dt-TT,(Vz(t) V,(t)).
(6.19)
For simplicity, it is again assumed that the light is completely polarized. Making use of the moment theorem (eqs. (A.5)), we find from (6.18) after some calculation that
432
THEORY OF PHOTOELECTRON COUNTING
[VIII,
5 6
By taking the integrating times T,, T,, T , small compared with the coherence time and also by suitably adjusting the time delays between t,, t , and t,, it is possible to use this correlation to obtain the information about the phase of r,,(T). This method of obtaining the phase of r from triple correlation measurements was suggested by GAMO [1963]. The problem of determining the phase of r from the knowledge of its modulus has been considered by a number of authors in recent years (WOLF[1962]; WALTER[1963]; ROMAN and MARATHAY [1963]; MEHTA [1965a, 19681; DIALETIS1119671; NUSSENZVEIG [1967]), as it is of considerable interest, particularly for stellar interferometry and interference spectroscopy. Alternative methods for determining the phase of from correlation measurements has been considered by MEHTA [1965a, 19681. I n the special case when the integrating times T I ,T,, . . ., T N are small compared with the coherence time, it is possible to evaluate the multi-dimensional generating function G(s,, s,, . . ., SN) ( B ~ D A R D [1967b]; see also CANTKELL[ 1970al). I n this special case we may write
r
W , = T,VZV,,
k
= 1, 2,
. . ., N
(no summation)
(6.21)
where V , are distributed according to the Gaussian probability distribution
Here the matrix A,, is proportional to the moment matrix 2(A-l),,
=r z l c =
(VV,>,
(6.23)
and 1A I denotes the determinant of A . From eqs. (6.4) and (6.21)-(6.23) we find that (6.24) G(s1, s,, . . ., S N ) = l&v-l, where l d ~isl the determinant of the N x N matrix whose elements are given by ( d ~ )= , ~8,,+cc,T,s,I',,
The probability torial moments G(s,, s,, . . ., S N ) If we further
(no summation over k ) .
(6.25)
distribution p(nl,n,, . . ., n N ) and the various facmay be evaluated by repeated differentiation of ( B ~ D A R[1967b]), D but the process is very laborious. assume that all the detectors lie within a single
VIII,
B
71
423
INVERSION PROBLEM
coherence area * on a plane normal to the direction of propagation we may write lrk,lz = r,,r,,.In this case eq. (6.24) simplifies to
G(s1,
Szj
..
. p
SN) =
{1+(~1)s1+(n,)sz+
. . . +(~~N)sN}-'-
(6.26)
On making use of the relation
(6.27)
we find that
Recently FILMORE [1969] has considered the problem of multidetector counting statistics for a mixed thermal and coherent radiation, again assuming that the counting intervals Tkare small compared to the coherence time. The general case of arbitrary T , is considered by DIALETIS[1969], CANTRELL[ 1970bI and MEHTA and JAISWAL [1970].
Q 7. Inversion Problem In previous sections, we have mainly considered the effect of the statistics of light beams on the statistics of the photoelectron counting. The problem of determining the probability density P ( W ) from a given $ ( a ) will be referred to as the inversion problem. A solution of this problem provides a direct method of determining P ( W ) and provides also some information about the statistics of the radiation field. We show below that in principle, it is possible to determine the complete probability density of the light intensity from the knowledge of the distribution of the photoelectrons (WOLFand MEHTA [1964]). The probability that there be n photoelectric emissions in a time interval t , t+T is given by the Poisson transform (see eq. (2.1)) f i ( n ) = /om
0 n" ! e-OrWP ( W )dW,
* This implies that for points r,, r z within such an area, the normalized coherence function ynl T,l/{T',.T'Lz}* is unimodular.
424
THEORY O F PHOTOELECTRON COUNTING
[VIII,
5
7
where
From ( 7 . 1 ) , one may readily connect the statistical constants, such as the moments, the cumulants etc., of Wwith those of n (MANDEL [ 1 9 5 9 ] ) . Let M ( w ) ( x )and M ( " ) ( x ) be the moment generating functions of W and n respectively, (7.3)
and (7.4)
From eqs. (7.1)-(7.4) we find that
M ( " ) ( x )= M ( W ) [ ~ ( e 2 - l ) ] ,
(7.5)
and (7.5b) Identical functional relations hold for the cumulant generating functions K (x)= log M (x)of W and n: (7.6a)
K ( " ) ( x )= K ( W ) [ c r ( e n - l ) ] ,
(7.6b)
On expanding eq. (7.6b) [eq. (7.5b)l in powers of x and on comparing the coefficients, we may express the cumulants (moments) of W in terms of the cumulants (moments) of n. If K~ and K iare the cumulants of W and n respectively, we find that MK,
=K,,
tc2tc2
= K,-K,,
U
= K K3-3K2+2K,, ~
~
M4K4
= K4-
6K3+ 1 1 K2- 6K,,
U 5 K 5 = K,-10K4+35K3-50K2+24Kl,
etc.
(7.7)
Relations similar to ( 7 . 7 ) between the moments of W and n could also be obtained directly on observing that according to ( 7 . 1 ) the moments of W are proportional to the factorial moments of n :
dC(Wk= ) (ark'>= ( n ( n - 1 ) . . . ( n - - K + l ) ) .
(7.8)
VIII,
5
71
I NVERSION PROBLEM
425
'From (7.8) we readily find that
.(W> = (n), u2(W2) = (n2)-(n), u3(W3)= (n3)-3(n2)+2(n),
etc.
(7.9)
To obtain the complete probability density P(W) we set F(x) =
IOw
eirnwP(W)ecaW dW.
(7.10)
Then by the Fourier inversion formula, 1
I-, co
P(W)= 2n eaw
F(x)ePizWdx.
(7.11)
Now from (7.10) and (7.1), we have, formally (7.12)
Thus the required probability density P ( W ) may be obtained from the knowledge of p(n), by first evaluating F ( x ) from (7.12) and then evaluating (7.11). If the counting time can be adjusted so that it is much shorter than the coherence time of the light, then
W =IT.
(7.13)
Eq. (7.11) then yields the probability density of the instantaneous intensity. When the counting interval is small the dead time effects of the counter become appreciable and one must take these corrections into account. We will, however, ignore them in the present discussion. Further, if one assumes that the light beam falling on the detector is plane polarized, stationary and quasi-monochromatic, the probability density of the scalar wavefield V may be assumed to be independent of the phase of k' (KANO [1964]; DIALETISand MEHTA [1968]; MANDEL and MEHTA [1969]). Using the fact that I ( t ) = = V* ( t ) V ( twe ) readily find the following expression for the probability density of the complex wavefield V : 1
P ( V ) = - P(1). ?L
(7.14)
426
THEORY O F PHOTOELECTRON COUNTING
[VIII,
f 7
The probability density of the real part V(r) of V may be obtained by integrating (7.14) with respect to Yci). By proper change of variables, this leads to the expression, (7.15)
To illustrate our method, let us consider a few typical examples: (1) Let us suppose that p (n)is given by the Bose-Einstein distribution (7.16)
Then (7.12) becomes
F ( x ) = ((n)+l-i(n)x/a)-',
(7.17)
and (7.11) gives
P ( W ) = (W>-l exp ( - W / ( W > ) ,
(7.18)
where ( W ) = ( n ) / u . When T << T,, this leads to an exponential distribution for the probability density of the instantaneous intensity. Moreover, if the light is linearly polarized, we obtain from (7.14) a Gaussian distribution for the complex wavefield V . It may readily be verified that, if p ( n ) is distributed according to a Bose-Einstein distribution between N cells of phase space, i.e., if (7.19)
the probability density P ( W ) is a gamma distribution
where ( W ) = (.)/a. (2) As a second example, consider the case when p ( n ) is given by the Poisson distribution (7.21)
In this case eq. ( 7 . 1 2 ) gives
F ( x ) = exp {(n)[(ix/a)-l])
(7.22)
VIII,
s
7j
INVERSION PROBLEM
427
and hence from (7.11) we obtain
P(W)= 6(W-(W))
(7.23)
where ( W ) = (.)/a. Thus we find that the photocount distribution is Poissonian, if and only if there are no fluctuations in the integrated intensity. The method just outlined is only useful when a closed analytic expression for p ( n ) is known. In practice, however, we can determine p ( n ) experimentally, only for a few small values of n. Even, if p ( n ) is small for larger values of n, we cannot neglect p ( n ) ,since F ( n ) in that case becomes a polynomial and the Fourier inversion then gives a singular function for P ( W ) . In such cases one must use some approximation techniques. Let us assume for example, that the experimental photocount distribution can be approximated as a sum of some smooth analytic functions, say exponentials, of n, il4
p(n)=
C aje-bjn. -
(7.24)
j=1
Eq. (7.12) then gives (7.25)
and from (7.11) we then find that M
P(W)=
2 a j exp (bj-
(ebj-l)W}.
(7.26)
f= 1
Another approximate formula for P ( W ) may be obtained by using the orthogonal properties of the Laguerre polynomials L k ( x ) . If we write m
(7.27)
then the coefficients C, are given by the relation
C,
=
a/om e-“”P(W)L,(aW) dW.
(7.28)
Here I,,(%) denotes the Laguerre polynomial (7.29)
428
THEORY O F PHOTOELECTRON COUNTING
[VIII,
5
7
From eqs. (7.1), (7.27)-(7.29) we then find that ( B ~ D A R[1967b]) D
The techniques for the inversion that we just outlined require the direct use of the counting distribution $ ( a ) . However, if one knows only the first few moments of n, eq. (7.9) gives the corresponding moments of W . From these moments, one can determine some general features and approximate expression for P (W) (KENDALLand STUART[1958] p. 148; ELDERTON [1938]; see also BBDARD[1967b]). So far we considered only one detector and we saw that we can obtain the information about intensity distribution a t points on the surface of the detector. One can, in principle, extend the argument using several detectors and obtain information about joint probability distribution of the intensities at several points. Consider for example two detectors. Let p(n,, a,) be joint probability that the first detector registers VL, photons in time interval t,, t,+T, and the second detector registers n2 photons in the interval t,, t,+T,. Then, we have, from (6.3) (~2W2)n2
n,!
x e-alW1--azW2 P(W,, W,) dW,dW2. The joint moments of W,, U’, factorial moments of nl, n,:
(7.31)
are simply proportional to the joint
&1 ~ 2k ~ ( W ~ ~ W= l ; j(zn) ~ 1 l ~ ~ z l ) .
(7.32)
Relations similar to (7.7) connecting joint cummulants of W,, W , and of n, , n2 may also be readily derived. One can obtain the complete joint probability distribution P (W,,W,) from the knowledge of p (n,, n,) by first evaluating
and then taking the double Fourier inverse
(7.34)
VIII,
3 81
T W O PHOTON ABSORPTION
429
In cases when a closed form of $(a,, n2) is not available, one has to use approximation techniques similar to those described for a single detector.
5 8.
Two Photon Absorption
Throughout our discussion on the photoelectric detection, we have considered the interaction of light with the photo-cathode as being linear in the intensity. This is true whenever the photoionization occurs with the absorption of a single photon. The simplest non-linear interaction of radiation with the photo-cathode occurs when the photoionizing transition takes place through the simultaneous absorption of two photons. Each of these two photons may have energy smaller than the first ionization potential of the atoms in the cathode, but their combined energy exceeds this threshold. Obviously the transition probability for two photon absorption is much smaller than that for one photon absorption. However, such processes cannot be ignored if the light intensity is sufficiently large as may be in the case of a laser beam. GOEPERT-MAYER [1931] appears to have been the first to consider the theory of two photon transition by an atomic system. More recently a large amount of experimental as well as theoretical work on this subject has been carried out. (See for example BRAUNSTEIN and OCKMAN [1964]; YATISVet al. [1965]; KIELICH[1966]; LOGOTHETICS and HARTMAN[1967]; MOLLOW [1968]; TEICHand DIAMENT[1969]; JAISWAL and AGARWAL [1969]). In this section we briefly consider the effect of the statistical features of the radiation field on the statistics of photoelectron counting. The rate of two photon absorption may be evaluated much the same way as for a single photon absorption, except, that one now takes into account the second order terms of the perturbation expansion. One finds (JAISWAL and AGARWAL [1969]) that the probability of detecting n photoelectrons in a time interval T (in the case where each electron is emitted via two photon absorption) is given by
where W , is now the time integral of the square of the intensity
w2= J-tt+TP(t) at,
430
TH E 0 R Y
0 F P H 0 T0E LE C TR 0 N C 0 U N TI N G
[VIII,
8
and t12 is some constant. When the light incident on the detector is stationary, $ ( n )does not depend on t. When T is large compared to the coherence time, one may conclude from an argument based on the central limit theorem of probability theory that P(W,) is a Gaussian distribution, which tends t o a delta function in the limit of extremely large values of T . The distribution p ( n )is then Poissonian. This is also the case for light from a n amplitude stabilized laser, with T much smaller than the coherence time. If the light is completely polarized and originates in a thermal source, the intensity distribution is exponential [eq. (3.2)]. Hence, if T is also small compared with the coherence time, P(W,) is given by
P(W,)
=
{2W2(W,)}-3 exp {- (2W2/(W,))3}.
(8.3)
Substituting (8.3) in (8.1), we obtain the following expression for (TEICHand DIAMENT [1969]; JAISWAL and AGAKWAL [1969])
$(%)
and where U ( k ,x) is the parabolic cylinder function (ABRAMOWITZ STEGUN [ 19651)
U(K-+, x) =
W)
tL-l exp (-+t2-tx-&x2}
dt.
(8.5)
A similar result may also be obtained for a partially polarized light (JAISWALand AGARWAL [1969]) for which P(W,) is given by [cf . eq. (3.51)]
For completely unpolarized light, we obtain from (8.6), on taking the limit B 3 0
The corresponding counting distributions may be obtained by substituting (8.6) or (8.7) in (8.1). The result may again be expressed in terms of parabolic cylinder functions.
VIII, APP. A]
43 1
COMPLEX GAUSSIAN DISTRIBUTIONS
Further development in this direction such as correlation between photoelectron counts using two or more detectors may be carried out and will be useful, when more experimental data become available. One may also consider cases when simultaneous absorption of three or more photons take place. However, transition rates for such processes are extremely small. APPENDIXA
Some Properties of Complex Gaussian Distributions z
Let us define the probability density p ( z ) of a complex variable (x,y real) in the following manner: The expression
= xfiy
p ( z ) d2z E p (x,y) dx dy
P.1)
denotes the joint probability that the real and imaginary parts of z take on values in the intervals x,x+dx and y , y+dy respectively. The multivariate probability densities are defined in a similar way. The complex variables zl,z 2 , . . ., z, are said t o be distributed as a multivariate (n-dimensional) Gaussian distribution, with zero mean, if the joint probability density p(zl, z 2 , . . ., z,) is given by
whereA is a Hermitian, positive definite matrix and IA I its determinant. In this appendix we discuss some of the properties of this distribution. Since A is a Hermitian matrix ( A t , = A;), it can readily be shown that the distribution (A.2) is equivalent to a Gaussian distribution in 2n real variables xl,y l ; x2,y 2 ; . . ., x,, y, with the following properties: (xzx,) = (YtY,), (A.3a) <XzY,> =
-<X,Y,>.
(A.3b)
Most of the properties of the distribution (A.2) may therefore be derived from those of a Gaussian distribution in real variables (MEHTA [1965b]; MILLER [1964]). We list below few of the main properties of complex Gaussian distributions which have been used in the text: (1) The moment matrix and the matrix A are related by the formula
(z,*z,)
=
2(A-l),t.
(A.4)
432
[VIII,
THEORY O F PHOTOELECTRON COUNTING
App. A
(2a) All odd order moments vanish (23;
. . . ztnzjlzjz. . . Zj,,)
= 0,
m f m'.
(Ah)
(2b) All even order moments ( 2 : . . . Z : ~ Z , .~ . . z,,) may be expressed in terms of the second order moments by means of the formula
where 1,denotes summation over all m ! permutations p , q, . . ., Y of 1 , 2, . . . ) m. (3) The characteristic function A(tl, t z ,. . ., t n ) defined by the formula z
is given by the relation
(4) Let w,,wz,. . ., wk ( k 5 n) be h linear combinations of z j , I I
where c ( l j are constants. Then w,are distributed according to the kdimensional Gaussian distribution
where
(B- l ) Ll= ?
2 %;z%L,A;l; I , 1'
=
1, 2 , .
. h. .)
(A.lO)
2, J
(5) Let U be the sum of the squared moduli of the z,'s, n
(A.11) Then U is distributed according to the probability density n
where a j ( j
= 1, 2, .
n
. , n ) , are the eigenvalues of the matrix A . Also
VIII, APP. A]
COMPLEX GAUSSIAN DISTRIBUTIONS
433
the cumulants of U may be expressed as
)'LK
Tr ( A - l ) k
=
2"(K-l)!
=
(A-l)! Tr (Adk),
(A.13a)
(A. 13b)
where M is the moment matrix whose elements are given by = (ZfZi).
Properties (1)-(3) may be derived by direct integration (MEHTA [1965b]). The properties (1) and ( 2 ) may also be derived by repeated differentiation of (A.7) (REED[1962]). Property (4)followsimmediately from (3) if we first derive the characteristic function of the distribution w,,w 2 ,. . ., w k . Property ( 5 ) is derived below. From (A.2) and (A.ll), we obtain the following expression for the characteristic function of U : (exp (ihU) )
IA l/{det(Aij-2ihdij)} n
[ AI
(A. 14)
(ai-2ih)-l, j=1
where ai are the eigenvalues of the matrix A . On taking the inverse Fourier transform and evaluating the integral by contour integration we obtain the following expression for p ( U ):
-
$IAj
2 e-+kU r-J (ai-ak)-l. k=l
(A.15)
j#k
It was assumed in this derivation that the eigenvalues a j are all distinct. If there is any degeneracy, the expression has to be modified (or is to be taken in a limiting sense as the eigenvalues approach each other). When all of the eigenvalues aicoincide (i.e. when A is a multiple of the unit matrix) we may evaluate $ ( U ) directly. In this case one finds that
(A.16)
434
jvm, .4pp. B
THEORY OF PHOTOELECTRON COUNTING
The variance of U is given by
* = na2 =
w2
~.
(A.17)
n
As an illustration of eq. (A.15), we consider the case when n From (A.15), we may write
=
2.
(A. 18a) When a,
=
a2 = a we take the limit a,
--f
a2 and find that
p ( U ) = $a2Uedau.
(A.18b)
To obtain the cumulants of U , we note from (A.14) that the cumulant generating function K ( U ) = log ( e x p ( h U ) ) (A.19) may be written as
(A.20)
From (A.20) it follows that the cumulants of U are those as given by eq. (A.13).
APPENDIXB Solution of an Integral Equation In this appendix, we solve the integral equation
* It is worth mentioning t h a t the second term alone in tion formula for blackbody radiation
EINSTEIN'S
[1909a, b] fluctua-
( (AdE,)z> = hv(dE,>+ ( ~ ~ / X n v ~ d v B ) < d E , ) ~
follows from cq. (A.17). Here one assumes t h a t the radiation field is thermal and t h a t the diffcrcnt frequency components of the field i n the interval dv have the same variance. of eq. (A.17) then corresponds to
435
SOLUTION O F AN INTEGRAL E Q U A T I O N
V I I I , APP. B]
which occurs in the discussion of thermal light with Lorentzian spectral profile. Let us differentiate (B.l) twice with respect to t and use the relations d - lz-z’l = &(T--t‘), dz and d - E ( Z - - Z ’ ) = 2d(z-z’), 03.3) dz where ~ ( x=) f1 according as x > or < 0 and S(x) is the Dirac delta function. We then find that (z) satisfies the following differential equation
+
where w2 =
(20(1)/1) -$.
P.5)
Hence +(z) must necessarily be of the form
+ (z)
=
,4 eiw7+BeciwT,
(B.6)
where A and B are constants. Using eqs. (B.5), (B.6) in (B.l) and evaluating the integral, we find that
(
0-iw
+ ?)B
A
+-BeciwT\ cr+ioj
ea(7--T) AeiWT
=
0.
(B.7)
Since eq. (B.7) holds for arbitrary values of z (0 5 z 5 T ) , the two terms on the left-hand side of this equation must vanish separately, i.e., (B.8a) A eiWT(o-iw)-l+ BeciWT(o+iw)-l = 0,
A (o+iw)-l+ B(o-iw)-l
=
0.
CB.8b)
If we ignore the case w = 0, which leads to the trivial solution +(z) = 0, we find, on eliminating A and B from eqs. (B.8), that 1 -
0
tan w T
=
~
20
-
.
w2-02
The roots of (B.9) are real, and because of the form of eq. (B.6) we need consider only the non-negative roots.
436
THEORY O F PHOTOELECTRON
COUNTING
LVIII,
App. B
The roots CO, of the eq. (B.9) may be separated into two groups p i and v, which satisfy tan (+p,T)= o;
,LC,
Y,
cot (&v,T)=
-0.
(B.lO)
It may be shown from eqs. (B.6) and (B.8) that the corresponding normalized eigenfunctions of the integral equation (B.1 ) are given by the following expressions: (B.1l a ) and (B.1 l b ) Finally let us evaluate the generating function G ( s ) [eq. (4.101 given by ~ ( s=) (i+crs~k)-l, (B.12)
nk
where ilk are the eigenvalues [eq. (B.5)] (R.13) and wlCare the non-negative roots of eq. (B.9), i.e. of the equation (B.14) From eqs. (B.12) and (B.13), we may write (B.15) where
z2 = 02T2+2aT(n)s, ( n )
=
a(I)T.
(B.16)
The series on the right-hand side of (B.15) may be summed by the standard techniques of contour integration: Let 1 d
F(6) =
~
-
t2+z2 d t
where 8 is a complex variable. The only finite singularities of F ( 6 ) are simple poles at 6 = &iz and at 6 = f w , T . Consider now the
VIII]
437
REFERENCES
integral
If the closed contour C is properly chosen, it may readily be shown that this integral tends to zero as the number of poles in side C tends to infinity. Hence the sum cf the residue a t all the poles of F ( 6 ) vanishes and we have 1
coshz+
1 oT -
-
2 ( 2
1
+ : T ) ' sinhz -
= 0.
(B.18)
From (B.15), (B.16) and (B.18) we therefore obtain (B.19)
where the constant of integration is evaluated from the requirement G(O) = 1.
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AUTHOR INDEX A ABERL,M., 352, 371 ABRAMOWITZ, M., 414, 430, 437 ADAM, M., 167, 190, 197, 198 G. S., 282, 291, 429, 430, 438 AGARWAL, AHN, B. H., 194, 200 M. D., 437 ALDRIDGE, C. T. J., 136, 139, 140, 149, ALKEMADE, 197, 198 ALLEN,R., 298, 338 ALLEY, C. O., 242, 268, 270, 292 ALPERN,M., 128, 129 ALPERT,S. S., 137, 146, 192, 194, 197 AMESJR., A , , 127, 129 A. E., 365, 371 ANDERSON, ARECCHI,F. T., 140, 145, 156, 191, 197, 241, 242, 251, 254, 259, 260, 268, 269, 273, 283, 285, 286, 291, 292, 410, 411, 437 ARMITAGE, J . D., 302, 338 J . A., 241, 242, 244, 266, 268, ARMSTRONG, 292, 294, 375, 437 ARNULF,A., 87, 98, 100, 104, 105, 127, 129, 353, 355, 370 ARTZ,V., 247, 251, 292 .L\SELTINE, J. s., 175, 176, 197 ASPNES,D., 194, 199
B BACHL, A, , 46, 48 BALACHANDRAN, A . P . , 388, 439 BALL,It., 224, 237 BALLIK,E. A,, 136, 199 BALZARINI, D., 137, 192, 197 BARNES,C. W., 39, 48 BAUMEISTER, P., 224, 236
BEAVERS, W. I., 15, 48 B ~ D A RG., D , 140, 175, 176, 197, 265, 266, 268, 292, 375, 377, 395, 400, 401, 403, 407, 412, 414, 422, 428, 437 BELLISIO, J. A , , 375, 437 BENEDEK, G. B., 136-138, 145, 164. 175, 181, 185, 189-192, 197-200 BENNETT, W. R., 135, 199 BERAN,M., 310, 338 BERGE,P., 138, 167, 189-191, 194, 195, 197, I98 BERGER-L’HEUREUX-KOBARDEY, S., 85, 107, 129, 353-355, 370 BERNE,A,, 140, 197, 241, 291, 437 BERNY,F., 127, 129 BHARUCHA-REID, A. T., 250, 292 BILLARD, R., 138, 191, 198 G., 241, 294 BIRNBAUM, BLACKWELL, H. R., 115, 129, 359, 360, 365, 370 BLACKWELL, 0. M., 115, I29 BLANC-LAPIERRE, A , , 307, 338 BLAQUIERE,A , , 241, 258. 292 BLOCH, F., 245, 294 BOLWIJN, P. T., 140, 198 BOND, W., 241, 292 BOND, W. L., 136, 199 BORN,M., 6, 48, 165, 198, 256, 292, 299301, 303, 307, 311, 332, 338, 368, 370, 383, 392, 437 BOSCHLOO, G. A,, 140, 198 BOTCH,W. D., 195, 198 BOTHE,W., 375, 437 BOUMAN, A., 84, 131 BOUMAN, M. A ,, 355, 358, 362, 363, 366, 367, 371 R. M., 128, 129 BOYNTON,
442
AUTHOR I N D E X
BRACEWELL, R. N., 4, 48 BRANNEN, E., 411, 437 BRAULT, J. W., 298, 338 BRAUNSTEIN, R., 429, 437 BRBMMER, H., 312, 338 BRINDLEY, G. S., 115, 129 BROWN, R. HANBURY, 8, 19-21, 48, 198, 269, 292, 375, 377, 421, 437, 438 BRUCE,C. F., 337, 338 BRUNNER, W.. 242, 292 BRYNGDAHL, O., 100, 129, 321, 339, 355358, 366, 367, 369, 371 BUCK, G. J., 39, 45 BURLMACCHI, P., 241, 291, 437 BYRAM, G. M., 110, 129 C CALMETTES, P., 167, 195, 198 F. W., 77, 88, 98, 100-103, CAMPBELL, 110, 113, 114, 117, 124, 125, 129, 131, 351-356, 358, 371, 372 CANTRELL, C. D., 422, 423, 438 CARLSON, F. U., 159, 198 CATALAN, Id., 326, 327, 339 CHANDRASAKHAR, S., 248, 292 CHANG,J. C., 400-403, 437 CHANG,R . F., 242, 268, 270, 292 CHU, B., 138, 194, 195, 198 COBB,1’. W., 67, 106, 129 It. J., 241, 292 COLLINS, J . W., 365, 371 COLTMAN, CONNES,P., 298, 339 COTTON, A , , 316, 339 Cox, J. T., 222, 224, 226, 227, 236, 237 CRANE,It., 21, 48 CRAWFORD, B. H., 56, 131 CUBISCH, I<. W., 77, 113, 114, 124, 125, 129 H. Z., 136-138, 146, 154, 156, CUMMINS, 157, 159, 160, 163, 185, 189, 195, 198200, 376, 438 CURRIE,D. G., 11, 18, 48, 377, 439 L. J . , 4, 36, 48 CUTRONA,
D DAVENPOORT JR., W. B., 388, 438
DAVIDSON, F., 242, 270, 292, 410, 438 M., 356, 358, 365, 368,369, 371 DAVIDSON, DAVIS,S. P., 140, 200 DEBYE,P., 194, 198 V., 241, 242, 286, 291, 292 DEGIORGIO, DE GROOT,S. G., 359, 371 0 . E., 189, 198 DELANGE, DE LOTTO,I., 377, 412, 438 DE MOTT,D. W., 54, 129, 353, 371 J . J.. 86, 124, 129, 130, 355, DE PALMA, 357, 358, 366, 367, 369, 371 R. W., 242, 268, 270, 292 DETENBECK, DIALETIS,D., 422, 423, 425, 438 P., 429, 430, 440 DIAMENT, DUBIN,S. B., 138, 191, 198 DUFOUR,C., 210, 237 P., 307, 311, 338, 339 DUMONTET, DUPUY,O., 87, 98, 100, 104, 105, 127, 129, 353, 355, 370 DYSON,J . , 299, 328, 329, 339
E EINSTEIN, A., 160, 198, 375, 383, 434, 438 EKMAN, G., 348, 371 ELDERTON, W. P., 428, 438 ELLIOT,J. L., 15, 18, 48, 49 ELLIS, G. W., 305, 339 E M M A N U E L , C. B., 11, 49 ENGEL,G. K., 89, 117, 129 ENOCH, J. M., 56, 129 C., 62, 129 ENROTH-CUGELL, EPSTEIN, I,. I., 224, 237 EVANS,J . V., 33, 48
F FELLER, W., 412. 438 FERGUSON, H. I. S., 411, 437 FERRELL, A,, 187, 198 G. L., 397, 423, 438 FILLMORE, FIORENTINI, A,, 119, 128, 129 FISHER, I. Z., 160, 199 FISHER,M. E., 191, 198 FIXMAN, M., 195, 198 FLAMANT, F., 124, 127, 129, 351, 371 FLECK,J. A,, 242, 254, 292 FORD, N . C., 137, 145, 185, 192, 198
AUTHOR I N D E X
FORRESTER, A. T., 135-137, 143, 148, 164, 175, 198 F R A N ~ OM., N , 297,299, 306,314, 320, 321, 323, 325-330, 334, 335, 339, 340 FREED, C., 140, 198, 241, 292, 375, 437 FRIEDEN, B. R., 39, 42, 48 FRY,G. A., 53, 54, 56, 58, 60,71, 72, 78-83, 89-92, 94-97, 100, 108, 111-113, 116, 117, 120, 122, 123, 126-128, 129, 130, 355, 358, 366, 371 FURTH, R., 375, 383, 438
G GABOR,D., 305, 339, 378, 378, 438 GAMO,H., 21, 48, 422, 438 GAMPEL,L., 136, 198 GARRET, C. G. B., 241, 292 W., 45, 48 GARTNER, GATES,J . W., 337, 339 GATTI,E., 410, 411, 437 GEBHARD, J . W., 359, 371 U., 298, 339 GERHARDT, GHIELMETTI, F., 383, 438 GIGLIO,M., 242, 292 GIVENS,M. P., 75-77, 79, 130 K. J., 141, 150-153, 168, 199, GLAUBER, 242, 282, 284, 286, 292, 375, 377, 380, 381, 396, 400, 438 GOEPERT-MAYER, M., 429, 438 GOLAY,M. J. E., 139, 199 GONTIER,M. G., 322, 325, 339 GOODMAN, J . W., 35, 48 J . P., 242, 273, 287, 292 GORDON, Goss, W. P., 305, 339 GOTZE,W., 194, 199 I. S., 253, 292 GRADSHTEYN, GRAHAM, C. H., 369, 371 K., 243, 244, 251, 292 GRAHAM, GREEN,D. G., 88, 98, 100-103, 110, 115, 129, 130, 354, 371 GREEN,D. M., 347, 364, 371 T. J., 199 GREYTAK, GRIFFIN,D. R., 111, 131 GRIVET,P., 241, 258, 292 L., 407, 440 GROPPER, GROSSKOPF, H., 348, 371 GUBISCH, D. G., 126, 130
443
GUBISCH,R. W., 351-353, 356, 371 R. A , , 135, 164, 175, GUDMUNDSEN, 198 GUILD,F., 322, 325, 339 GUILLARD, M., 337, 339 J. J., 39, 48 GUSTINCIC,
H HAAKE,F., 242, 243, 273, 278, 294 HAGFORS, T., 33, 48 HAKEN,H . , 241-244, 247, 251, 254, 259, 273, 280, 287, 292-294 HALL,G. O., 4, 36, 48 HALPERIN,B. I., 195, 199 D., 194, 199 HAMBLEN, HAMELIN, A,, 138, 167, 190, 191, 197, 198 HANSEN,G., 298, 299, 305, 339 HARRIS,J . L., 39, 48 HARRIS,R. W., 39, 42, 43, 49 HARTLINE, H . K., 124, 131 HARTMAN, P. L., 429, 439 HARTRIDGE, H., 111, 113, 130 HASS,G., 222, 224, 226, 227, 236 HAUG,H., 251, 293 HAUS,H . A , , 140, 174, 198, 199, 241, 292, 375, 437 HECHT,K., 194, 199 HELLER,P., 192, 199 C. W., 394, 404, 438 HELSTROM, HEMPSTEAD, R. D., 242, 254-256, 293, 395, 438 HENRY,D. L., 194, 195, 199 HERBERT,T. J., 159, 198 HERPIN, A,, 210, 237 HERRIOTT, D. R., 135, 199 HILZ,I<., 97, 131, 358, 371 HIWATASHI, K., 356, 359, 365, 369, 371 HOCHULI,U., 242, 268, 270, 292 HODARA, H., 21, 48 HOHENBERG, P. C., 195, 199 HOPF,L., 375, 438 HOPKINS,H . H., 103, 130, 299, 300, 306, 309, 311, 321, 332, 334, 339 HUFNAGLE, R. E., 34, 48 HYDE,W. L., 305, 340
444
AUTHOR I N D E X
I INGELSTAM, E., 337, 339, 366, 371 INOUE, S., 305, 340 IVANOFF, A , , 113, 127, 130 IWATA, G., 312, 340
293, 375, 377, 380, 439 J., 124, 130, 351, 371 KRAUSKOPF, KRUG,W., 297, 321, 322, 340 KUBOTA,H., 224, 231, 237 E. S., 16, 49 KULAGIN,
L J JAISWAL,A. I<., 392, 394, 395, 397, 398, 405-407, 423, 429, 430, 438, 439 JAKEMAN, E., 140, 199,375,394,397, 398, 407, 438 JAMIN,J . , 328, 340 JANOSSY, L., 411. 438 J A V A N , A,, 135, 136, 199 JENNISON, K. C., 13, 48 JOHANSSON, L. P., 337, 339 J O H N S O N , F. A , , 377, 416, 417, 438 J O H N S O N , P. O., 135, 164, 175, 198 J O N E S , I<.,377, 416, 417, 438
K KAC,M., 376, 387, 438 L. P., 193, 194, 199 KADANOFF, KAISER,W., 241, 292 KANE,J., 194, 199 ICANO, Y., 426, 439 I
LACHS,G., 242, 293, 396, 397, 439 LACOMME, P., 46, 49 LAMB,W. E., 241, 242, 247, 254, 273, 286, 293, 294 LAMBJR., W. E., 395, 404 K. L., 75, 130 LAMBERTS, LASTOVKA, J. B., 136, 137, 189, 199 LAU,E., 46, 49 I<.W., 35, 48 LAWRENCE, L a x , M., 241, 242, 250, 254-256, 258, 273, 278, 293, 395, 438 LEBEDEFF, A., 297, 327, 328, 340 LE GRAND, Y., 84, 86, 98, 110, 130 13. I<., 375, 377, 380, 439 LEHMBERG, LEITH,E. N., 4, 36, 48 LENK,H., 298, 339 LEVI,L., 350, 361, 371, LEVY,J. D., 116, 117, 120, 122, 130 LEWIS,E. A. S., 194, I99 LINDBERG, O., 327, 328, 340 LINNIK, W., 297, 340 E., 137, 146, 194, 197 LIPWORTH, LIT, A , , 128, 130 LITTLE,A. G., 411, 440 LOEWENFELD, I. E., 128, 130 E. M., 429, 439 LOGOTHETICS, A,, 45, 48, 49, 302, 335, 338, LOHMANN, 340 LONDON, F., 407, 439 LORENTZ, H. S., 383, 439 LOUISELL,W. H., 258, 273, 287, 293 LOWENSTEIN, O., 128, 130 LOWRY,E. M., 86, 124, 129, 130, 355, 357, 358, 366, 367, 369, 371 LUKOSZ, W., 45, 46, 48, 49 LUNACEK, J. H., 138, 191, 198
M MCCLEAN,T. P., 400, 439 F. J., 429, 440 MCCLUNG,
AUTHOR I N D E X
MCCUMBER,D. E., 242, 293, 395, 439 MCKENNA,J., 377, 439 MCLEAN,T. P., 377, 416, 417, 438 MACPHIE,R. H., 21, 49 MAGILL,P. J., 305, 340, 396-398, 439 MAIMAN,T. H., 241, 293 D., 306, 340 MALACARA-HERNANDEZ, MANDEL,L., 4, 20, 49, 138-143, 165, 199, 200, 242, 243, 256, 260, 265, 266, 270272, 292, 293, 375-378, 382, 384, 387, 392, 393, 400, 401, 403, 404, 407, 409411, 421, 424, 425, 437, 438, 440 MANFREDI,P. F., 377, 412, 438 MARATHAY, A. S., 8, 49, 422, 440 E. W., 73, 130 MARCHAND, MARCHAND, M., 46, 49 M A R ~ C H AA L,,, 335, 340 K. B., 124, 130, 366, 371 MARIMONT, MARKLE,D. A,, 21-25, 49 MARTIENSSEN, W., 139, 200, 410, 418, 439 MEHTA,C. L., 8, 49, 139, 200, 266, 294, 375, 377, 381, 387, 388, 390, 393, 397, 398, 405-407, 409, 422, 423, 425, 431, 433, 438-440 MENZEL,E., 99, 130, 332, 335, 340, 355, 357, 371 MERTZ,L., 298, 340 MEYER-ARENDT,J. R., 11. 49 MICHELSON,A,, 7, 49 D., 376, 385, 391, 439 MIDDLETON, MILLER, K. S., 431, 439 MILLER,N. D., 111, 130 MILLER,R. H., 10, 18, 49 MILLER, U., 352, 371 MILLER,W. H., 124, 131 G., 302, 340 MINICWITZ, MOLLOW,B. R., 377, 429, 440 MORGAN,B. L., 140, 200, 410, 411, 440 MORGAN,R. H., 362, 363, 365, 371 MORGAN,S. P., 3, 49 MORI, T., 356, 359, 365, 369, 371 MOUNTAIN, K. D., 160, 161, 193, 200 MOYAL,J . E., 282, 293 R. B., 212, 237 MUCHMORE, MURRAU,A. E., 231, 237 MURRAY,B. C., 32, 33, 49 MURTY,M. V. R. I<., 306, 340
445
N NACHMIAS, J., 97, 130 NAGATA,S., 356, 359, 365, 369, 371 NARAY,Z., 411, 438 NELSON,D. F., 241, 292 G., 322, 324, 328, 340 NOMARSKI, NOVICK,R., 137, 192, 197 K., 244, 293 NIMMEDAL, NUSSENZVEIG, H. M., 422, 440
0 O’BRIEN,B., 111, 130 OCKMAN, N., 429, 437 OGLE, I<. N., 69, 130 OLIVER,C. J., 140, 199 O’NEILL,E. L., 347, 371 O’NEILL,G. K., 28, 49 ONLEY,J . D., 128, 131 J. S., 194, 200 OSMUNDSON, OSTERBERG,H., 222, 224, 237, 305, 341 MSTERBERG,H., 59, 60, 62, 131
P PALCIAUSKAS, V. V., 194, 199 PARIS, D. P., 45, 49 PARRENT, G. B., 310, 338 I’ATEL, A. S., 97, 99, 131, 355, 357, 358, 367, 371 PAUWELS,H. J., 241, 293 PEASE, F., 7, 49 PEASE, F. G., 7, 49 PECORA, K., 156, 159, 160, 191, 200 PERRIN, F. H., 74, 75, 131 PHILLIPS, D. T., 140, 200 PHILPOT, J . ST.,330, 340 Prcus, G. S., 429, 440 PIKE,E. R., 140, 199, 375, 377, 394, 397, 398, 400, 407, 416, 417, 438, 439 POLLAR, H. 0.. 42, 49 POLYAK, 54, 56, 131 POLZE,S., 306, 340 PORCELLO, I,. J., 36, 48 POUND, K. V., 411, 440 PRAT, K., 323, 325, 339 PRINCIPI, P., 377, 412, 438
446
AUTHOR I N D E X
PRINGSHEIM, 297 PROCTOR, C. A,, 1 2 7 , 129 PROTHEROE, N. M., 11, 49 PURCELL, E. M., 377, 440 PUTNER,T., 224. 237
Q QUBRZOLA, R., 241, 242, 292
R KANTSCH, I<., 305, 340 KATCLIFF,F., 93, 97, 119, 124, 131 RAWCLIFFE,13. D., 36, 49 RAYL,M., 194, 199 RAYLEIGH, 247, 293 REBKA,G. A,, 411, 440 REED, 1. S., 143, 200, 433, 440 RICE, S. C., 376, 385-387, 440 KIENETZ,J., 297, 321, 322, 340 KIGGS,L. A., 128, 131 RISKEN,H., 241, 242, 244, 247, 350, 251, 254-256, 258-260, 273, 278, 280, 287, 291, 292-294, 376, 395, 407, 409, 410, 440 ~IOBSO J.NG., , 62, 117, 129 f
S SAGNAC, 297 SAUERMANN, H., 241, 247, 251, 273, 292294
SAUNDERS, J. E., 348, 371 SAWAKI,T., 224, 237 SAWYER, r<. A,, 84, 131 A. C., 192, 200 SAXMAN, SCHADE,0. H., 74, 89, 97, 131 SR., 0. H., 355, 358, 362, 366, SCHADE 367, 371 SCHARF, P. T., 231, 237 SCHAWLOW, A. I)., 241, 292 SCHAWLOW, A. L., 241, 247, 293 SCHERB,F., 15, 18, 48, 49 SCHMID, C., 241, 247, 251, 278, 281, 292294 SCHOBER, H. A. W., 97, 131, 356, 371 F. J . , 138, 194, 195, 198 SCHOENES, SCHOLNIK, R . , 127, 130 SCHULZ, G., 297, 299, 300, 302, 321, 322, 340 SCULLY, M., 242, 254, 273, 286, 294, 395, 440 SEIGEL, L., 137, 192, 193, 197, 200 SENITZICY, J. K., 273, 294 SENGERS,J . V., 192, 200 SERGENT,B., 314, 339 SHAPIRO, S. hf., 190, 200 SHERWIN, C. W., 36, 49 SHLAER, S., 67, 84, 108, 131 SIEGERT,A. J . F., 376, 387, 438 S ~ E G M AA.XE., , 19, 49 SIRKS,297 SLANSKY, S., 299, 332, 339, 340 SLEPIAN,D., 42, 49, 376, 385, 387, 389, 440 SLEVOGT, IT, 299, 340 A ,, 205, 237 SMAKULA, SMEKAL, A , , 375, 440 SMITH, A. W., 241, 242, 244, 266, 268, 292, 294, 375, 437 SMITH,F. H., 321, 326-329, 339 SMITH,S . D., 210, 237 S N O W , I<., 305, 340 SONA,A,, 140, 197, 242, 251, 254,259, 260, 268, 269, 273, 283, 285, 292 SONI,R. P.,396-398, 439 SOUTHALL, J . P., 352, 357, 371 SPILLER,E., 139, 200, 410, 418, 439 STEEL,W. H., 297-302, 306, 310, 319, 321, 322, 325, 335, 340
AUTHOR I N D E X
STEGUN, I. A , , 414, 430, 437 STEVENS,S. S., 348, 349, 368, 371 STILES, W. S., 56, 115, 131 STRATONOVICH, K. L., 254, 294 STROKE,G. W., 28, 49 A , , 428, 439 STUART, SUDARSHAN, E. C. G., 138, 142, 152, 154, 199, 200, 242, 282, 293, 294, 375-378, 381, 382, 439, 440 SWETS,J . A , , 347, 364, 371 SWIFT, J.. 193, 194, 199, 200 SWIFT,W. D., 15, 48 SWINNEY,H. L., 185, 192-195, 198-200, 376, 438
T TEICH, M. C., 429, 430, 440 THELEN, A,, 206, 207, 210, 212, 214, 222, 224, 226, 227, 236, 237 THETFORD, A,, 210, 222, 237 THORNTON, B. S., 337 340 TOLMAN, F. R., 337, 340 DI FRANCIA, G., 39, 45, 49 TORALDO TOUSEY, R . , 127, 130 TOWNES, c. Er., 137. 200, 241, 247, 294 TSURUTA, T., 325, 340 TWISS,K. Q., 19, 21, 48, 49, 198, 269, 292, 375, 377, 411, 421, 438, 440
U UHLENBECK, G. E., 250, 294, 407, 440 ~ J H L I G ,M., 322. 325, 340 V VAN DE HULST,H. c., 158, 200 VANDER POL, B., 247, 294 K., 305, 340 VAN DEWARDER, VAN HOVE,L., 160, 200 R. F., 305, 341 V-4N LIGTEN, VANNES, F. L., 84, 97, 131, 355, 357, 358, 366, 367, 371 VARGA, P., 411, 438 VIVIAN,W. E., 4, 36, 48 VOLLMER, H. D., 242, 251, 255, 256, 259, 294 B., 138, 167, 194, 195, 198 VOLOCHINE,
447
VON BAHR,G., 115, 131 VONHELMHOLTZ, H., 110, 130 Vos, J . J., 55, 131
W WAETZMAN, E., 328, 341 WAGNER, W . G., 241, 294, 429, 440 WALD,G., 111, 131 WALRAVEN, P. L., 131 WALTHER,A,, 8, 49, 422, 440 WANG,M. C., 250, 294 WANGNESS, R. I<., 245, 294 WATANABE, A,, 356, 359, 365, 369, 371 WATSON,G. N., 347, 372 WEHLAU,W., 411, 437 WEIDLICH,W., 241-243, 247, 251, 254, 273, 278, 280, 287, 291, 292-294 WEIL, A. R., 322, 324, 328, 340 G., 87, 98, 110, 124, 127, WESTHEIMER, 128, 131, 351, 352, 354, 357, 372 WHITE,J . A , , 194, 200 WIGNER,E., 282, 294 WILCOX,L. R . , 193, 200 J . S., 29, 31, 49, 50 WILCZYNSKI, WILD, B. W., 119, 131 WILLIS,C. K., 242, 273, 294 WILSON,A. D., 305, 340 WOLF,E., 4, 6, 8, 20, 48-50, 139-142, 165, 198, 200, 256, 260, 265, 266, 282, 291294, 299-301, 303, 307, 311, 332, 338, 341, 368, 370, 375-378, 382, 384, 387, 388, 392, 393, 405, 407, 409, 421-423, 437, 439, 440 WOLTER, H., 39, 50 WOOD,J . G., 337, 340 TVOODS, G., 159, 198
Y YAMAMOTO, T., 299, 312, 314, 323, 325331, 334, 335, 339, 340 YATISV,S., 429, 440 YEH, Y., 136, 137, 146, 157, 190, 192, 194, 195, 197, 198, 200 YOUNG, L., 212, 224, 237
z ZERNIKE, F., 307, 341
SUBJECT INDEX A aberrations, 38, 126 c t seq., 297, 299, 305, 352 abrasion resistance, 225 abrupt contrast border, 73 absolute phase, 32 absorbencc, 231 absorption-free materials, 204 accomodation, 54 accuracy, 346 active figure controle, 22 et scq. - illumination, 21, 32 - interferometer, 32, 33 acuity, 66 et seq. adaption, 348 brightness, 350 - level, 362, 366 additive mixing, 63 adhesion, 224 - test, 225 admittance matching, 222 afferent nerves, 351 air, 217 aligning, 36 amacrine cells, 61 ambiguity sensors, 24 amplitude contrast function, 335 - fluctuation, 169 - spread function, 314 analytical signal, 306 angular diameter, 8, 15 - resolution, 39 separation, 69 annihilation operator, 275, 381 anterior focal point, 91 antireflection coatings, homogeneous mul~
~
tilayer, 204
_ _ , inhomogeneous, 204 -~, multilayer, 204 et seq., 210 - _ , single layer, 205, 206 ~- , three layer, 214 .-, two layer, 206 et seq., 212 ~t seq. antiresonant terms, 277, 279 aperture, 297 - , completely filled, 29 , one dimensional, 27 - , hexagonal, 30 , partially filled, 26 , super-gain, 45 hrnulf-Dupuy method, 104 artificial pupil, 84, 89, 98, 106 astigmatic aberration, 314 astigmatism, 80 - , retinal 62 astronomical observation in space, 29 atmospheric effects, 12 - phase translation, 14 - seeing, 10 et seq. - turbulence, 20, 33 autocorrelation function, 8, 143 et seq., 156, 185, 397 automatic gain control, 350 axial chromatic aberration, 7 1 ~
~
~
~
B background noise, 42 bandwidth, 138 -, electrical, 20 -, optical, 5, 9 et seq., 19, 20 barred grid device, 15 beam, multilobed, 33 beam-spli tters, 3 12
SUBJECT INDEX
Bessel functions, 75 et seq. binary critical mixtures, 194 - diffusion coefficient, 194 bipartite pattern, 70 birefringent elements, 320 - systems, 326 blackbody radiation, 375, 383 bleaching, 57 et seq. Bloch equations, 245 Bloch’s law, 349 blue sensitive cones, 59 blur, 77 et scq., 93 -, index of, 80 et sey., 120 borders, 63, 92 - contrast, 65, 71, 118 - _ sensitivity, 65 - _ threshold, 65 - perception, 65 Bose-Einstein distribution, 140, 242, 268, 418, 426 - _ statistics, 140 boson, 140, 407 - fluctuation, 400 brain, 86, 351 Brewster’s fringes, 303 brightness, 347 - difference, 348 _ _ threshold, 65 - function, 346 et seq., 348, 365 - _ , instantaneous, 348 et seq. - _ , steady state, 349 et seq. - response, 59 bril, 349 Brillouin components, 136 Brownian motion, 248 bunching effect, 407
C c-number equation, 286 et seq.
- function, 377 Campbell-Green method, 100 cavity, 244 center of curvature, 23 central acuity, 66 - limit theorem, 175, 386, 393, 430 - lobe, 27 cerium fluoride, 222 characteristic functions, 390 et seq., 402
449
chromatic aberration, 71 chromatically restricted objects, 47 classical particles, 382 - wave field, 382 clock telescope, 29 closed-loop servo-control system, 21 clusters, 271 coating, quarter-half-quarter, 220 coherence, 4, 8, 9, 17, 32, 84, 163 et seq., 299, 307, 310, 312, 320 - areas, 164, 174, 187 - diffraction theory, 306 - functions, 338, 375, 409 - -, higher order, 419 et seq. - length, 38 -, longitudinal, 9 - matrix, 404 - spatial, 142 et seq., 149, 154, 163, 305 spread function, 314 - temporal, 305 - tensor, second order, 409, 421 - theory, 142 et seq. - time, 378, 385 et seq., 393, 412, 422 ~
et seq. transmission, 312, 318 - transverse, 9 coherent detection, 19 - fields, 397 - illumination, 32 - light, 76, 84 - local oscillator, 146 - optical data processing, 28 - receiver, 36 - reference wave, 31 - source, 146, 375 coincident counts, 411 color blindness, 114 - index, 231 - mixture, 59, 60 - photography, 231 common-path interferometer, 298 communication system, 345 compensation systems, 299 completely filled aperture synthesis, 29 complex analytical signal, 142 - coherence factor, 6, 7, 14, 27 - degree of coherence, 4, 6, 20, 299, 301 et sey., 305 -
450
SUBJECT INDEX
- visibility function, 6, 14 compound interferometer, 2 1 computor, 185 concentration fluctuations, 180 condensation effect, 271 process, 272 condensor-objective system, 318, 324 conditional probability, 409 cones, 53 e t seq., 351 contrast, 70 et seq., 359, 370 - sensitivity, 114 control of thickness, 224 controlled evaporation, 224 convolution, 39, 71 cooperative retroreflector, 38 cornea, 351 correlation function, 185, %42,256 et seq., ~
384, 389
-, second order, 143 correlator, 20 cortex, 351 counting distribution, 398 et seq. - timc, 425 - _ intervals, 415 creation operator, 275, 381 critical point, 191 - - singularity, 193 cross-coherence, 31 1, 316, 318, 332 - -correlation function, 409 - spectral density, 393 CW laser, 170 - system, 37 D
delay compensation, 305 demodulation, 97 density matrix, 244, 2'76 operator, 245, 377, 381 - -, reduced, 276 depolarization, 305, 31 4 detecting time, 376 detection, 345 -, fringe, 15 - probability, 361, 364 detector, 15, 411 - fluctuations, 16 - noise, 361 -, quantum efficiency of, 21 detuned coatings, 222 detuiiing, 222, 251 difference frequency, 138 diffraction, 299 - limit, 34, 39, 43 - limited eye, 76, 89, 106 et s q . - _ optics, 3, 22, 37 diffusion broadening, 146 - coefficient, 250 digital computor, 35 dilute solution of particles, 154 rt srq.,lYO directed vision, 84 disk-annulus pattern, 70 distribution function, 262, 281, 287 - -, joint, 265 - _ , stationary, 252 -, photoelectron counting, 242, 264 -, transient, 26% Doppler broadening, 157 - shift, 34, 136, 157 -spread imaging, 33 double focus interfcrometer. 298, 304 - -objective tclescopc, 28 et seq. - reflection, 233 - refracting systems, 321 - slit interference pattern, 98 rt seq., 110 drift coefficient, 250 -
-
damped harmomc oscillator, 273 data processing, 31 dark light, 361 dead timc correction, 412 _ _ effects, 411 c t seq , 425 Debyc-Sears effect, 136 decay constant, 257 decimal acuity, 68 defocusing, 310, 322 deformation of frlnges, 323 degree of coherence, 4, 6, 20, 299, 301 rt seq , 305 - - polarization, 392, 404, 407
E earth-based interferometer, 10 echo, pulse, 37 effect sub-linearity, 368 effective interfaces, 210 ~t seq., 222
SUBJECT INDEX
eigenmodes, 255 eigenvalues, 258 et seq. electric field, 246 et seq. electrical bandwidth, 20 electronic correlator, 20 - detection noise, 41 - fringe detection, 11, 12, 15 emmetropic eye, 82 energy fluctuations, 383 entrance pupil, 76 et seq., 332 entropy fluctuations, 161 enucleation, 54 error, position, 38 -, profile, 25 estimation, 345, 348 evanescent wave, 39 excess noise, 139 excitation, 60, 61, 71, 94 exit pupil, 82, 317, 320 expectation values, 271 eyeglass lens, 233
F Fabry-Perot formula, 210 Fechner's law, 349 feedback-controlled optics, 21, 36 field operators, 381 field-widening, 298 film grain, 41 figure analyser, 22 - error, 23 filter admittance, 176 - bandwidth, 176 -, low pass, 42 Fixman's modification, 195 Fizeau fringes, 302 fluctuating intensity, 414 fluctuations, 241, 269, 272, 375, 380 et seq. -, intrinsic, 380 - of light beams, 375 focus, 27 -, common, 27 Fokker-Planck equation, 242, 249 et seq., 272 et seq., 283 Foucault target, 67 Fourier analysis, 31, 185, 299 - spectra, 31
451
transformation, 8, 31, 75, 149, 257, 307, 332 fovea, 53, 59, 60 foveal acuity, 60 Fraunhofer diffraction, 69, 75, 77 - image, 84 frequency, difference, 135 - plane, 31 - _ transparency, 31 frequency pulling, 241 - pushing, 241 - shift, 135 - shifter, 2 $ - stability, 10 Fresnel image, 77, 83, 84 - _ , monochromatic, 81 - point spread function, 77 fringe, 5, 6, 15 et seq., 298 - amplitude, 15 - detection, 15 et seq. - frequency, 18 - localization, 299, 302 phase, detection of, 17 et seq. - sensitivity, 15 et seq. - visibility, 13, 17, 301, 316 fringed field, 304, 319, 323 fringes of equal inclination, 302 - _ - thickness, 302 Fry-Cobb index of blur, 80 et seq., 112 -
-
G gain, 362 factor, 362 ganglion cells, 60 et seq., 93 Gaussian distribution, 252 _ _ , complex, 431 - functions, 47, 366 - noise, 41, 407 - probability distribution, 422 - process, 260, 384 - random process, 143, 139, 375 - spread function, 72, 77, 117 - statistics, 21, 175 glass, 217 glow discharge cleaning, 225 granularity, 346 grating, 67 -
452
SUBJECT INDEX
gravitational stress, 21 green sensitive cones, 59 Green’s eye, 101
H Haidinger rings, 303 Hamilton operator, 245, 274 Hanbury Brown-Twiss effect, 164 harmonic signal, 397, 407, 409 He-Ne laser, 135 Heisenberg picture, 273 heterodyne detection, 19, 137, 146 et seq., 173, 191 - detector, 34 - efficiency, 167 spectroscopy, 188 et scq. high index substrate, 212, 214 numerical aperture, 297 hole burning, 241 holographic arrays, 34 et seq. - interference microscope, 305 holography, 31, 34 homodyne detection, 137, 143 r t seq., 191 - spectroscopy, 185 et seq. - spectrum, 172, 174, 182 et seq. homogeneity, 368 human eye, 51 et seq. - observer, 345 - sensory detection system, 345 - vision, 345 Huygens-Fresnel principle, 307 hyperbolic fringes, 314 -
-
I illumination-to-noise ratio, 362 image blurring, 11 - contrast, 236 - dancing, 11 - formation, 299, 306 - function, 8, 20 -, improcessed, 44 - intensity distribution, 39 et scq. - modulation, 347 -, retinal, 71 et seq. - space, 317 imaging, Doppler spread, 33
incoherent detection, 19 illumination, 39 index of blur, 120 - - performance, 66 - - refraction, 204 inhibition, 60, 61, 71, 94 effect, 368 input modulation, 347 - signal, 345 instabilities, 32 integration time, 20 intensity distribution, 8, 14 - fluctuation, 241, 243, 249, 256, 375, 380, 384 et seq. - interferometry, 19 et seq. - stabilized laser light, 415 interference fringes, 36, 353 - microscope, 297 - spectroscopy, 422 interferometer, 8, 10, 14 -, active, 32 -, optical, 13 -, radio frequency, 19 - spacing, 12 -, three element, I 2 et seq. interferometry, 4 et seq. intermode heats, 171, 174 interocular comparison, 348 intra-lens reflections, 229, 233 _ _ surface reflections, 228 inversion problem in photoelectron couiiting statistics, 423 ionization potential, 429 irrelevant images, 233 isobaric entropy fluctuations, 161 isoplanatic condition, 309 - p a t h , 15 isoplanatism, 368 Ives pattern, 67 -
-
J Jamin interferometer, 328
K Kohler illumination, 307 Koenig bar target, 66
SUBJECT INDEX
L Landau-Placzek equation, 195 Landolt C target, 66 Langevin force, 272 et seq. - methode, 248 - operator, 273 large-aperture optical systems, 21 laser, 9, 10, 32, 34, 101, 135, 305, 375, 383 - action, 241 - beam, 429 - cavity, 264 - equation, 244 et seq., 248 et seq. - fields, 375 - fluctuations, 241, 376 - Fokker-Planck equation, 243 e t seq., 252 light, 24'2, 395 et seq., 406 et seq. _ _ , intensity stabilized, 415 - line, helium neon, 225 - master equation, 273, 286 et seq. - monitoring methods, 12, 15 - oscillation, 139, 241, 260 - radiation, 140 - resonator, 243 -, single mode, 21 - technology, 32 - threshold, 242, 244 lateral geniculate body, 351, 361 layer thickness, 224 Le Grand's condition, 85 lens, 351 - of the eye, 56 light beating, 135 -~ spectroscopy, 135 et seq., 376 _ _ spectrum, 145 - bucket receiver, 32 - gathering power, 11 - scattering, 137 _ _ theory, 154 et seq. line, 62 - shape, 135 - spread function, 60 et seq., 71 et seq 347, 352, 355 - width, 192, 251 linear theory, 241 Linnik system, 298 lobe, 32 ~
453
local oscillator, 34, 146, 167, 173, 189 longitudinal coherence, 9 Lorentzian profile, 144, 149, 159, 162, 174, 257, 389, 391, 400 et seq. low frequency signal, 19 - -level detection, 137 - -spatial-frequency con-,orient, 29 lumiriance-equivalent modulation transfer function, 369 - level, 108 luminosity curve, 57
M Mach bands, 369 -2ehnder interferometer, 304 Macphie, compound interferometer, 21 macro-molecule, 159, 190 et seq. magnesium fluoride, 203, 222 magnitude estimation, 348 Malus-Dupin theorem, 301 Mandel's formula, 399, 41 1 Markov process, 250 maser principle, 241 master equation, 242 Maxwell-Boltzmann statistics, 157 medium index, 212 Michelson interferometer, 304 - stellar interferometer, 7, 10, 18, 32 micro-interferometer, 297 - -Jamin, 297 et seq. - -Mach-Zehnder, 297 et seq. - -Michelson, 297 et seq. micronystagmoid movements, 95, 128 microscope imaging, 44 microwave technique, 37 mirror, 21 et seq. - segments, 22 mixing, 136 - additive, 63 mode, 139 - competition, 241 -, laser, 21 - structure of lasers, 136 modulation, degree of, 32 - depth, 170 - index, 33 -, perceived, 99 -
454
SUBJECT INDEX
sensitivity, 70 e t scq. threshold, 89 et seq., 95, 98, 115 r t spy. - transfer characteristic, 346 - - factor, 75 e t seq., 86 ... - function, 27, 75 c t srq., 80, 89 e t seq., 95 e t sep., 100 e t seq., 347, 351 et seq., 365, 368 _ _ _ , visual, 365 modules of coherence factor, 8, 9, 1 7 _ _ cross, coherence, 320 Moiri. effect, 45 monochromatic Frcsnel image, 81 - light, 113 et srq. monochromator, 84 moving-grating technique, 46 motor adjustments, 127 multi-level system, 244 multimode laser, 167, 170 multimoding, 32 multiple correlations, 418 e t seq. mutual coherence function, 307, 310 intensity, 316, 320, 331 - -. function, 310 - spectral density, 307, 309 et seq.
-
-
N narrow band Gaussian noise, 169 fields, 152 near-infrarcd. sighting, 227 nerve fiber, optic, 61 neural intcrconnections. 351 night-driving conditions, 233 nodal point, 69, 72, 75 noise, 39, 41, 242, 249, 346, 359, 370 -, background, 42 -, bandlimited measurement, 43 -, detector, 361 - level, 361 -, neural, 361 -, quantum, 362 -, radiation, 361 - sensation, 361 et seq. - sources, 188, 361 ~. spcctrum, 136, 363 -, white measurement, 43 noiseless imaging system, 39 et seg. lion spherical scatterer, 158 - - .- random
nonlinear equation, 243 non-linearities of area effects, 366 normalized line spread function, 8 0 - point spread function, 80
0 objcct modulation, 347 restoration, 39 r t seq. space, 317 thickness, 336 objective compensation, 330 r t seq. obliquity effect, 337 one-dimensional aperture, 27 - - ring laser, 246 optic nerve, 351 . - fiber, 81 optical bandwidth, 5, 19, 20 - blur, 57, 75, 97, 99, 109 - d a t a processing, 28, 31 -. difference frequcncy, 136 - interferometry, 13 path compensation, 30.5 - systems, large aperturc, 21 - thickness, 337 - lransfer function, 42, 316, 331 optics, feedback controlled, 21 orbiting instruments, 22 o u t of focus imagery, 76 et s r q . output signal, 344
-
-
-
-
P P-representation, 152 partially coherent light, 315 filled apcrture, 26 et seq., 36 polarized light, 391, 409 path length, 9, 30 perceived modulation, 99 peripheral retina, 59 perturbation expansion, 429 phase, absolute, 32 -~ autocorrelation function, 157 - changes, 211 -- contrast function, 335 distribution, 8 error, 13 - - fluctuation, 168 . - modulation, 33 -
-
-
-
SUBJECT INDEX
-
quadrature, 18 reference, 38 shift, 14 space, 400 - transition, 243 - translation, 10, 13, 14, 33 photocurrent, sinusoidal, 33 - spectrum, I74 photodetector, 33, 34, I63 et seq., 383 - surface, 163 photoelectric counts, 378 - detector, 375 - effect, 378 - emission, 380 - mixing, 135 - surface, 138 photoelectron counting distribution, 138, 242, 264 _ _ formula, 377 -, continuous, 267 - -, discrete, 267 photoelectrons, 265, 277 photoionization, 429 photomultiplier tubes, 18 photon, 20, 244, 381 - arrivals, 41 - counting distribution, 286, 399 detector, 264 - generator, 151 - statistics, 244 photons per unit bandwidth, 21 photopic brightness, level, 367 - luminosity curve, 57, 59 - trolant, 57 photopigment, 56 et seq. photoreceptor, 53 et seq., 93, 351 physiological blur, 97 picket fence device, 15 pigment, 57 et seq. - epithelium, 54 pillbox distribution, 78, 83 plexiform layers, 361 point, 63 - -spread function, 27, 39, 41 et seq., 71 et seq., 91, 347, 351 pointing skill, 60 Poisson distribution, 139, 242, 268, 426 - transformation, 266, 377 -
455
polarization, 45, 245
et seq., 404, 409, 418 interferometer, 310 polarized light, 384 - thermal light, 399 polystyrene diffusion broadening, 146 190 position error, 38 post-detection bandwidth, 19 - _ - object restoration, 39 - _ - processing, 44 power pattern, 32 probability density, 272, 376 et seq., 380, 385, 391, 425 - distribution, 376 protective glass, 232 psychophysical investigations, 344 et scq. - techniques, 84 pulse echo, 37 pump parameter, 257 et seq., 268 et seq.,286 pumping, 250 - power, 244 pupil, 309, 312, 352 - function, 310, 333 - size, 106 - surface, 324 pupillary compensation, 330 et seq. -, degree of, 392
-
Q quantum efficiency, 21, 151, 378, 419 - noise, 362 - theory of optical coherencc, 150 et sey. quarter-half-quarter coating, 220 - -wave layer, 224 quasielastic light scattering, 137 quasi-monochromatic optical wave, 5 - optical signal, 138 - source, 300
R radar, 36 et seq. - astronomy, 33 -, optical synthetic-aperture, 36 et scq. radial object motion, 36 radiation field, 381 radio astronomy, 4, 13 - frequency, 13 - - interferometer, 19 - interferometry, 9
456
SUBJECT INDEX
- tclescope, 13 random effects, 346 - fluctuations, 364 - Gaussian complex process, 138 - phasc modulation, 172 - process, 376 ratio scaling, 348 IZavenau, rule of, 316 Raylcigh criterion, 43, 69, 91 - equation, 247 - -Garis criterion, 158 - limit, 39, 44, 46, 158 - linewidth, 162, 184, 190 receptive field, 62 receptor, 115 ~t seq. red sensitive cones, 57, 59 redundancy, 29, 30 -, undesired low-frequency, 81 refcrcnce fringes, 304 - star, 30 reflcctance, 203. 205, 211 - minimum, 207 -, residual, 203 -, zero, 214 reflected energy, 227 reflections, unwanted, 227 reflectometry, 124 refractive index 205 et seq., 337 refractometry, objective, 54 relaxation rate, 169 reliability, 346 reservoir, light ficld, 274 residual reflcctance, 203 resolution, 27, 34, 37, 135, -, angular, 39 -, azimuthal, 37 - -degrading effects, 33 - element, 42 et seq. -, spatial, 32 - threshold, 69 resolving power, 27, 39, 68 et seq., 85 et seq., 106 et seq. resonator losses, 261 response of the eye, 57 restoration, object, 39 et seq. restoring, 28 retina, 53 et seq., 351 et seq., 361, 366 -, anatomy of the, 55
-brain portion, 354 subsystem, 351 -, physiology of the, 55 retinal illumination, 358, 362 - image, 71 et seq. - mosaic, 109 optics, 56 - reflectometry, 124 rctinoscopy, 54 rigid rod, 158 rods, 53, 351 Roscoe-Bunscn principle, 57 running mode, 244 - wave, 244 -
_ . _
-
S satellite-to-satellite imagery, 9 saturation, 63 - effects, 264 Savart platc, 305, 312 et seq., 321 et seq. scanning itnagc dissector, 24 scattering, 366 - amplitudc, 168 - theory, 154 Schawlow-Towncs formula, 247 scintillation, 10 11, 12 - frequency spcctrum, 11 scotopic luminosity curve, 57, 59 second nodal point, 72 - -order correlation, 143, 184 seeing, 11 scgmented mirror, 22 self-beat detection, 143 et seq. - compensating elements, 305 - -sustained oscillator, 247, 251 semiclassical theory, 243, 244 et seq. semiconductor lascr, 251 sensitivity, 9 sensor, 24 servo-control system, 21 et seq. - -controlled segmented mirror, 22 - mechanism, 10, 15 shear, 319, 331 shearing, 312 et seq. - interference microscope, 321 - interferometer, 298 shift factor, 212 short intervals, 265
SUBJECT INDEX
shot noise, 139, 144 et seq., 164, 172 sideIobes, 27 signal averager, 180 - plus noise model, 242 - -to-noise ratio, 19, 44, 163 et seq., 174, 187, 363 sine wave, 73 single layer antireflection coating, 205
et seq. single mode, 273 - - laser, 21, 139, 145, 168, 305, 415 - _ ring laser, 244 - surface transmittance, 229 Smith's method, 326 Snellen fraction, 68 letters, 66 source fringes, 321 - -size compensation, 297, 303, 317 et -
seq. space telescopes, 22 - -time correlation, 160 spacer layer, 211 spatial coherence, 142 et sep., 149, 154, 163, 305 frequency, 13, 31, 69 et seq., 331, 370 - _ response, 351 - resolution, 32 - rigidity of largc optical systems, 25 - structure, 43 spectral bandwidth, 305 - profile, 257, 375, 389 - reflectance, 231 - response, 346 - transmittance, 231 spectrum analyser, 34, 180 et seq. spherical aberration, 71, 106 et seq. - scatterers, 156 spheriodal wave functions, 42 spin resonance theory, 245 split-field photometry, 355, 365 spontaneous emission, 243, 248 - _ rate, 264 - photons, 264 spread functions, 71 et seq. spurious neural pulses, 359 square-wave gratings, 116 stabilization effect, 264 force, 244 -
-
467
stability, environmental, 225 standing wave type resonator, 244 star tracker, 30 states of polarization, 397 static scatterers, 156 stationarity, 368 statistical probability distribution, 138 stellar diameter, 8 - interferometry, 376 et seq., 421 step function, 73 - _ response, 355 Stiles-Crawford effect, 56, 59 stimulus, 345, 348, 365 stochastic noise force, 248 stray light, 231 et seq. subjective sensation, 345 sub-threshold response, 116 super-gain aperture, 45 superheterodyne, 189 - detection, 137 supra-threshold, 347, 363 levels, 99 response, 116 symmetric interferometer, 304 synthesized layers, 222 synthetic-aperture optics, 25 et seq.,'36 radar, 36
T telescope, 11 -, aplanatic, 30 -, clock, 29 -, double-objective, 28 et seq. -, large aperture, 15 -, space, 22 temporal coherence, 305 synthesis, 28 temporally restricted objects, 46 test fringes, 321 - patterns, 358 thalamus portion, 351 thermal conductivity, 193 - diffusion, 161 - equilibrium, 140 - evaporation, 224 fields, 397 - light, 242, 305, 384, 417 - noise, 396 et seq. -
-
458
SUBJECT INDEX
origin of light, 20 quanta, 249 - sources, 19 - stress, 21 three element interferometry, 12 et seq. - level system, 251, 278 threshold, 343, 248 et seq., 86 r t seq., 251, 263, 270, 279, 347 et seq., 354, 360, 363 - contrast, 360, 370 - of visibility, 99 -- techniques, 370 - measurements, 356, 359 t h u m b prints, 225 tilting, 312 ct seq. time domain, 46 - -invariant specimens, 44 transfer coefficients, 333 - function, 70 et seq., 98, 346 transient distribution, 262 - mean intensity, 263 variance, 263 transition rate, 431 translation diffusion, 157 transmission, 311 - of coherence, 312, 318 transmittance, 212 - improvement, 228 transmitting optics, 32 transversal aberrations, 309 transverse coherence, 9 triple interferometer, 12 et seq. troland, 72, 359 truncation, 261 tungsten lamp, 416 turbulence, 11, 20 two-beam interference, 306 - . _ interferometer. 297, 300 et seq., 331 two-level laser system, 244, 251 two photon absorbtion, 429 Twyman-Green interferometer, 33, 298 -
V V-coating, 206 et seq., 225 Van Cittert-Zernike theorem, 6, 165 Van der Pol equation, 247 - ..~ oscillator, 396, 409 variance, 269, 382 vibrating barred grid, 18 vibration, 38 visibility, 6, 10 et seq., 30, 116, 232, 300, 302 et seq., 331 - function, 14 - of a bar, 120 - of borders, 123 -- of lines, points and borders, 64 - of square-wave gratings, 116 - phase, 12 visual acuity, 66 et scq. - efficiency, 68 - estimation of fringe amplitudes, 12, 15 vitreous humor, 54
~
U ultrasonic waves, 136 uncoated optical surface, reflectance of, 203, 205 uniform field, 304, 325 unwanted reflections, 227
w W-coating, 206 r t seq. wave interference term, 383 wavefront tilt, 10, 11 - warping, 10, 11 Weber’s law, 349 wedge-shaped object, 336 Westheimer’s arrangement, 87 white light, 416 - noise, 158 wide-band coating, 227 Wiener-lihintchine theorem, 142 et seq., 147, 150, 156, 176 window, 312 Wollaston prism, 45, 305, 312 et seq., 324 working distance, 299
Y Young’s interference experiment, 5 - _ iringes, 98, 100 et seq.
z Zeeman splitting, 135 Zernike-Gabor object, 335 zero reflectance points, 217 zirconium oxide, 222 zoom lens, 331